AU2001293574A1 - System and method for testing integrated circuit devices - Google Patents
System and method for testing integrated circuit devicesInfo
- Publication number
- AU2001293574A1 AU2001293574A1 AU2001293574A AU9357401A AU2001293574A1 AU 2001293574 A1 AU2001293574 A1 AU 2001293574A1 AU 2001293574 A AU2001293574 A AU 2001293574A AU 9357401 A AU9357401 A AU 9357401A AU 2001293574 A1 AU2001293574 A1 AU 2001293574A1
- Authority
- AU
- Australia
- Prior art keywords
- integrated circuit
- circuit devices
- testing integrated
- testing
- devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US67839700A | 2000-10-03 | 2000-10-03 | |
US09/678,397 | 2000-10-03 | ||
PCT/CA2001/001365 WO2002029824A2 (en) | 2000-10-03 | 2001-09-26 | System and method for testing integrated circuit devices |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001293574A1 true AU2001293574A1 (en) | 2002-04-15 |
Family
ID=24722608
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001293574A Abandoned AU2001293574A1 (en) | 2000-10-03 | 2001-09-26 | System and method for testing integrated circuit devices |
Country Status (6)
Country | Link |
---|---|
JP (1) | JP2004510171A (en) |
AU (1) | AU2001293574A1 (en) |
CA (1) | CA2419939A1 (en) |
GB (1) | GB2382663A (en) |
TW (1) | TW580578B (en) |
WO (1) | WO2002029824A2 (en) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW548414B (en) | 2002-01-29 | 2003-08-21 | Via Tech Inc | Automatic integrated circuit overall machine testing system, apparatus and its method |
US7536181B2 (en) | 2002-02-15 | 2009-05-19 | Telefonaktiebolaget L M Ericsson (Publ) | Platform system for mobile terminals |
US8079015B2 (en) | 2002-02-15 | 2011-12-13 | Telefonaktiebolaget L M Ericsson (Publ) | Layered architecture for mobile terminals |
US7415270B2 (en) | 2002-02-15 | 2008-08-19 | Telefonaktiebolaget L M Ericsson (Publ) | Middleware services layer for platform system for mobile terminals |
US7363033B2 (en) | 2002-02-15 | 2008-04-22 | Telefonaktiebolaget Lm Ericsson (Publ) | Method of and system for testing equipment during manufacturing |
TW567329B (en) * | 2002-07-30 | 2003-12-21 | Via Tech Inc | Auto system-level test apparatus and method |
US7149510B2 (en) | 2002-09-23 | 2006-12-12 | Telefonaktiebolaget Lm Ericsson (Publ) | Security access manager in middleware |
US7478395B2 (en) | 2002-09-23 | 2009-01-13 | Telefonaktiebolaget L M Ericsson (Publ) | Middleware application message/event model |
US7350211B2 (en) | 2002-09-23 | 2008-03-25 | Telefonaktiebolaget Lm Ericsson (Publ) | Middleware application environment |
EP1447672B1 (en) * | 2003-02-13 | 2006-10-18 | Matsushita Electric Industrial Co., Ltd. | Assembly for LSI test |
DE102004021267B4 (en) | 2004-04-30 | 2008-04-17 | Infineon Technologies Ag | Method for testing a memory module and test arrangement |
US20070058456A1 (en) * | 2005-09-09 | 2007-03-15 | Rico Srowik | Integrated circuit arrangement |
US7539912B2 (en) | 2005-12-15 | 2009-05-26 | King Tiger Technology, Inc. | Method and apparatus for testing a fully buffered memory module |
TWI395960B (en) * | 2006-11-27 | 2013-05-11 | Hon Hai Prec Ind Co Ltd | Device and method for testing data transfer rate |
US7848899B2 (en) | 2008-06-09 | 2010-12-07 | Kingtiger Technology (Canada) Inc. | Systems and methods for testing integrated circuit devices |
JP5487770B2 (en) * | 2009-07-21 | 2014-05-07 | ソニー株式会社 | Solid-state imaging device |
US8356215B2 (en) | 2010-01-19 | 2013-01-15 | Kingtiger Technology (Canada) Inc. | Testing apparatus and method for analyzing a memory module operating within an application system |
US8918686B2 (en) | 2010-08-18 | 2014-12-23 | Kingtiger Technology (Canada) Inc. | Determining data valid windows in a system and method for testing an integrated circuit device |
US9003256B2 (en) | 2011-09-06 | 2015-04-07 | Kingtiger Technology (Canada) Inc. | System and method for testing integrated circuits by determining the solid timing window |
US8724408B2 (en) | 2011-11-29 | 2014-05-13 | Kingtiger Technology (Canada) Inc. | Systems and methods for testing and assembling memory modules |
US9117552B2 (en) | 2012-08-28 | 2015-08-25 | Kingtiger Technology(Canada), Inc. | Systems and methods for testing memory |
CN112363875B (en) * | 2020-10-21 | 2023-04-07 | 海光信息技术股份有限公司 | System defect detection method, device, electronic device and storage medium |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4001818A (en) * | 1975-10-22 | 1977-01-04 | Storage Technology Corporation | Digital circuit failure detector |
CA1163721A (en) * | 1980-08-18 | 1984-03-13 | Milan Slamka | Apparatus for the dynamic in-circuit testing of electronic digital circuit elements |
US6055653A (en) * | 1998-04-27 | 2000-04-25 | Compaq Computer Corporation | Method and apparatus for testing gang memory modules |
-
2000
- 2000-10-13 TW TW89121386A patent/TW580578B/en not_active IP Right Cessation
-
2001
- 2001-09-26 GB GB0304664A patent/GB2382663A/en not_active Withdrawn
- 2001-09-26 WO PCT/CA2001/001365 patent/WO2002029824A2/en active Application Filing
- 2001-09-26 CA CA002419939A patent/CA2419939A1/en not_active Abandoned
- 2001-09-26 AU AU2001293574A patent/AU2001293574A1/en not_active Abandoned
- 2001-09-26 JP JP2002533313A patent/JP2004510171A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
GB2382663A (en) | 2003-06-04 |
TW580578B (en) | 2004-03-21 |
JP2004510171A (en) | 2004-04-02 |
WO2002029824A3 (en) | 2003-05-01 |
GB0304664D0 (en) | 2003-04-02 |
WO2002029824A2 (en) | 2002-04-11 |
CA2419939A1 (en) | 2002-04-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
AU2001293574A1 (en) | System and method for testing integrated circuit devices | |
AU2001268872A1 (en) | Method and apparatus for testing high performance circuits | |
EP1330151B8 (en) | Device and method for mounting parts | |
HK1043678A1 (en) | Method and system for communicating data between an integrated circuit and other devices | |
HK1041557B (en) | An integrated circuit and method for preparation thereof | |
AU2001250908A1 (en) | Integrated circuit and method for signal decryption | |
AUPR157300A0 (en) | An apparatus and method (bin03) | |
AU2002307129A1 (en) | Electronic circuit device, system and method | |
AU5139900A (en) | Liposome-enhanced test device and method | |
AU2002327169A1 (en) | Insertion device for an insertion set and method of using the same | |
IL158007A0 (en) | Development and testing system and method | |
AU2001247753A1 (en) | Method and apparatus for integrated-battery devices | |
AUPR157600A0 (en) | An apparatus and method (bin04) | |
AU2001266295A1 (en) | System and method for object access through an access device | |
AUPR157400A0 (en) | An apparatus and method (bin01) | |
AU2002224949A1 (en) | Method and device for measuring levels | |
AU2001282704A1 (en) | Method and apparatus for well testing | |
AU2002238409A1 (en) | Method and device for determining the properties of an integrated circuit | |
AU2001252988A1 (en) | Performance monitor system and method suitable for use in an integrated circuit | |
AU2001289124A1 (en) | A testing device for semiconductor components and a method of using the device | |
AU2001260830A1 (en) | Method and apparatus for providing an integrated loyalty system | |
AU2002330002A1 (en) | Methods and apparatus for testing electronic circuits | |
AU2002357180A1 (en) | Timing system and device and method for making the same | |
AU2001274521A1 (en) | Receiving device and receiving method | |
AU2246901A (en) | Method and apparatus for building an integrated circuit |