AU2001289124A1 - A testing device for semiconductor components and a method of using the device - Google Patents
A testing device for semiconductor components and a method of using the deviceInfo
- Publication number
- AU2001289124A1 AU2001289124A1 AU2001289124A AU8912401A AU2001289124A1 AU 2001289124 A1 AU2001289124 A1 AU 2001289124A1 AU 2001289124 A AU2001289124 A AU 2001289124A AU 8912401 A AU8912401 A AU 8912401A AU 2001289124 A1 AU2001289124 A1 AU 2001289124A1
- Authority
- AU
- Australia
- Prior art keywords
- semiconductor components
- testing device
- testing
- semiconductor
- components
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09675994 | 2000-09-29 | ||
US09/675,994 US6541989B1 (en) | 2000-09-29 | 2000-09-29 | Testing device for semiconductor components and a method of using the device |
PCT/US2001/029078 WO2002029856A2 (en) | 2000-09-29 | 2001-09-18 | A testing device for semiconductor components and a method of using the same |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001289124A1 true AU2001289124A1 (en) | 2002-04-15 |
Family
ID=24712774
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001289124A Abandoned AU2001289124A1 (en) | 2000-09-29 | 2001-09-18 | A testing device for semiconductor components and a method of using the device |
Country Status (4)
Country | Link |
---|---|
US (1) | US6541989B1 (en) |
AU (1) | AU2001289124A1 (en) |
TW (1) | TW516145B (en) |
WO (1) | WO2002029856A2 (en) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003030232A1 (en) * | 2001-09-28 | 2003-04-10 | Shin-Etsu Handotai Co.,Ltd. | Grinding work holding disk, work grinding device and grinding method |
JP4201564B2 (en) * | 2001-12-03 | 2008-12-24 | 日東電工株式会社 | Semiconductor wafer transfer method and semiconductor wafer transfer apparatus using the same |
US20030213716A1 (en) * | 2002-05-17 | 2003-11-20 | Brian Cleaver | Wafer shipping and storage container |
EP1652228A2 (en) * | 2003-08-08 | 2006-05-03 | Infineon Technologies AG | Device for stabilising thin discs |
DE102004018249B3 (en) * | 2004-04-15 | 2006-03-16 | Infineon Technologies Ag | Method for processing a workpiece on a workpiece carrier |
DE102006031434B4 (en) * | 2006-07-07 | 2019-11-14 | Erich Thallner | Handling device and handling method for wafers |
CN103003932A (en) * | 2010-07-23 | 2013-03-27 | Ev集团有限责任公司 | Handling device for handling a wafer |
US9474156B2 (en) * | 2011-02-10 | 2016-10-18 | Apple Inc. | Interposer connectors with alignment features |
US20120206892A1 (en) * | 2011-02-10 | 2012-08-16 | Apple Inc. | Circular interposers |
US9033740B2 (en) | 2011-04-25 | 2015-05-19 | Apple Inc. | Interposer connectors |
KR101801264B1 (en) * | 2011-06-13 | 2017-11-27 | 삼성전자주식회사 | Apparatus of manufacturing semiconductor and Method for packaging semiconductor using the same |
TWI493203B (en) * | 2012-05-23 | 2015-07-21 | Advantest Corp | A test vehicle, a good judgment device, and a good judgment method |
JP6374642B2 (en) * | 2012-11-28 | 2018-08-15 | 株式会社日本マイクロニクス | Probe card and inspection device |
TWI583968B (en) * | 2013-05-30 | 2017-05-21 | 旺矽科技股份有限公司 | Electrical test equipment |
AT514514A1 (en) * | 2013-06-28 | 2015-01-15 | Stefan Dipl Ing Pargfrieder | Apparatus and method for electrical testing of product substrates |
KR101794744B1 (en) | 2013-08-14 | 2017-12-01 | 에프이아이 컴파니 | Circuit probe for charged particle beam system |
JP6266386B2 (en) * | 2014-03-10 | 2018-01-24 | 新日本無線株式会社 | Semiconductor test system |
US10147630B2 (en) * | 2014-06-11 | 2018-12-04 | John Cleaon Moore | Sectional porous carrier forming a temporary impervious support |
JP6663442B2 (en) | 2015-03-11 | 2020-03-11 | エンベー ベカルト ソシエテ アノニムNV Bekaert SA | Temporarily bonded wafer carrier |
WO2016142240A1 (en) * | 2015-03-11 | 2016-09-15 | Nv Bekaert Sa | Carrier for temporary bonded wafers |
US9917000B2 (en) | 2015-10-01 | 2018-03-13 | Infineon Technologies Ag | Wafer carrier, method for manufacturing the same and method for carrying a wafer |
US10699934B2 (en) | 2015-10-01 | 2020-06-30 | Infineon Technologies Ag | Substrate carrier, a processing arrangement and a method |
TWI661207B (en) * | 2016-09-26 | 2019-06-01 | 旺矽科技股份有限公司 | Chip probing equipment |
CN109891253A (en) | 2016-10-27 | 2019-06-14 | 三井化学东赛璐株式会社 | The manufacturing method of electronic device, electronic device manufacture adherence film and apparatus for electronic device test |
CN109906385A (en) * | 2016-10-27 | 2019-06-18 | 三井化学东赛璐株式会社 | The manufacturing method of electronic device, electronic device manufacture adherence film and apparatus for electronic device test |
US11808808B2 (en) | 2021-12-08 | 2023-11-07 | International Business Machines Corporation | Testing a single chip in a wafer probing system |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4778326A (en) | 1983-05-24 | 1988-10-18 | Vichem Corporation | Method and means for handling semiconductor and similar electronic devices |
JPH06105753B2 (en) | 1984-03-27 | 1994-12-21 | 日東電工株式会社 | Semiconductor wafer processing method |
US4711014A (en) | 1985-08-29 | 1987-12-08 | Vichem Corporation | Method for handling semiconductor die and the like |
US4667944A (en) | 1985-08-29 | 1987-05-26 | Vichem Corporation | Means for handling semiconductor die and the like |
US5186238A (en) * | 1991-04-25 | 1993-02-16 | International Business Machines Corporation | Liquid film interface cooling chuck for semiconductor wafer processing |
US5336649A (en) | 1991-06-04 | 1994-08-09 | Micron Technology, Inc. | Removable adhesives for attachment of semiconductor dies |
US5440241A (en) * | 1992-03-06 | 1995-08-08 | Micron Technology, Inc. | Method for testing, burning-in, and manufacturing wafer scale integrated circuits and a packaged wafer assembly produced thereby |
DE4232404A1 (en) | 1992-09-26 | 1994-03-31 | Diehl Gmbh & Co | Testing integrated circuit chip on substrate - involves temporarily sticking substrate carrying chip onto adaptor during testing |
JPH0778864A (en) | 1993-09-06 | 1995-03-20 | Toshiba Corp | Semiconductor manufacturing equipment and method of manufacturing semiconductor device |
US6577148B1 (en) * | 1994-08-31 | 2003-06-10 | Motorola, Inc. | Apparatus, method, and wafer used for testing integrated circuits formed on a product wafer |
JP3457477B2 (en) * | 1995-09-06 | 2003-10-20 | 日本碍子株式会社 | Electrostatic chuck |
US5703493A (en) | 1995-10-25 | 1997-12-30 | Motorola, Inc. | Wafer holder for semiconductor applications |
US5682731A (en) | 1996-03-15 | 1997-11-04 | Vichem Corporation | Tape carrier for electronic and electrical parts |
US5885353A (en) * | 1996-06-21 | 1999-03-23 | Micron Technology, Inc. | Thermal conditioning apparatus |
US5769237A (en) | 1996-07-15 | 1998-06-23 | Vichem Corporation | Tape carrier for electronic and electrical parts |
US5999268A (en) * | 1996-10-18 | 1999-12-07 | Tokyo Electron Limited | Apparatus for aligning a semiconductor wafer with an inspection contactor |
EP0915499B1 (en) * | 1997-11-05 | 2011-03-23 | Tokyo Electron Limited | Semiconductor wafer holding apparatus |
-
2000
- 2000-09-29 US US09/675,994 patent/US6541989B1/en not_active Expired - Fee Related
-
2001
- 2001-09-18 AU AU2001289124A patent/AU2001289124A1/en not_active Abandoned
- 2001-09-18 WO PCT/US2001/029078 patent/WO2002029856A2/en active Application Filing
- 2001-09-28 TW TW090124012A patent/TW516145B/en active
Also Published As
Publication number | Publication date |
---|---|
WO2002029856A3 (en) | 2002-06-27 |
WO2002029856A2 (en) | 2002-04-11 |
TW516145B (en) | 2003-01-01 |
US6541989B1 (en) | 2003-04-01 |
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