HK1023218A1 - Method for structured energy transmission using electron beams. - Google Patents

Method for structured energy transmission using electron beams.

Info

Publication number
HK1023218A1
HK1023218A1 HK00102213A HK00102213A HK1023218A1 HK 1023218 A1 HK1023218 A1 HK 1023218A1 HK 00102213 A HK00102213 A HK 00102213A HK 00102213 A HK00102213 A HK 00102213A HK 1023218 A1 HK1023218 A1 HK 1023218A1
Authority
HK
Hong Kong
Prior art keywords
electron beams
mask
energy transmission
electron beam
movement
Prior art date
Application number
HK00102213A
Other languages
English (en)
Inventor
Siegfried Panzer
Jurgen Danhardt
Original Assignee
F O B Gmbh Ges Zur Fertigung F
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by F O B Gmbh Ges Zur Fertigung F filed Critical F O B Gmbh Ges Zur Fertigung F
Publication of HK1023218A1 publication Critical patent/HK1023218A1/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/1472—Deflecting along given lines
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/31—Processing objects on a macro-scale
    • H01J2237/316—Changing physical properties

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Lasers (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Drying Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
  • Recrystallisation Techniques (AREA)
HK00102213A 1996-10-12 2000-04-12 Method for structured energy transmission using electron beams. HK1023218A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19642116A DE19642116C2 (de) 1996-10-12 1996-10-12 Verfahren zur strukturierten Energieübertragung mit Elektronenstrahlen
PCT/DE1997/002303 WO1998016947A1 (de) 1996-10-12 1997-10-08 Verfahren zur strukturierten energieübertragung mit elektronenstrahlen

Publications (1)

Publication Number Publication Date
HK1023218A1 true HK1023218A1 (en) 2000-09-01

Family

ID=7808558

Family Applications (1)

Application Number Title Priority Date Filing Date
HK00102213A HK1023218A1 (en) 1996-10-12 2000-04-12 Method for structured energy transmission using electron beams.

Country Status (10)

Country Link
US (1) US6423968B1 (xx)
EP (1) EP0931328B1 (xx)
JP (1) JP2001502112A (xx)
KR (1) KR100402937B1 (xx)
CN (1) CN1171275C (xx)
AT (1) ATE277421T1 (xx)
DE (1) DE19642116C2 (xx)
EA (1) EA199900368A1 (xx)
HK (1) HK1023218A1 (xx)
WO (1) WO1998016947A1 (xx)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19807121B4 (de) * 1997-07-12 2004-01-29 F.O.B. Gmbh Optischer Schalter
JP2002504713A (ja) * 1998-02-20 2002-02-12 エフ．オー．ベー． ゲーエムベーハー ゲゼルシャフト ツァ フェアティグンク ファルビゲァ オプトエレクトロニシャー バウエレメンテ 光学スイッチ
DE10114815B4 (de) * 2001-03-26 2005-12-08 Wolf-Gernot Dr. Drost Farbige dichroitische Polarisatoren und Verfahren zu ihrer Herstellung
JP2003248923A (ja) * 2002-02-26 2003-09-05 Fuji Photo Film Co Ltd 磁気転写用マスター担体の作製方法
DE10218712A1 (de) * 2002-04-22 2003-11-06 Wolf-Gernot Drost IR-Polarisatoren auf Natriumsilikatbasis und Verfahren zu ihrer Herstellung
US7256937B2 (en) * 2002-06-06 2007-08-14 Codixx Ag Structured polarizer and method for making the same
JP4109085B2 (ja) * 2002-11-06 2008-06-25 富士フイルム株式会社 電子ビーム描画方法
CN101924005B (zh) * 2010-07-16 2012-09-05 中国航天科技集团公司第五研究院第五一○研究所 一种用于电子束表面处理的均匀束斑方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1232747A (xx) * 1969-04-18 1971-05-19
FR2294489A1 (fr) * 1974-12-13 1976-07-09 Thomson Csf Dispositif pour le trace programme de dessins par bombardement de particules
DE2739502C3 (de) * 1977-09-02 1980-07-03 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren zur Belichtung durch Korpuskularstrahlen-Schattenwurf und Vorrichtung zur Durchführung des Verfahrens
US4282437A (en) * 1979-12-17 1981-08-04 Bell Telephone Laboratories, Incorporated Charged particle beam lithography
US4845362A (en) * 1988-02-02 1989-07-04 North American Philips Corporation In situ differential imaging and method utilizing a scanning electron microscope
JP2686492B2 (ja) * 1988-12-12 1997-12-08 株式会社日立製作所 透過形電子顕微鏡の照射位置決め方法
EP0508151B1 (en) * 1991-03-13 1998-08-12 Fujitsu Limited Charged particle beam exposure system and charged particle beam exposure method
US5557105A (en) * 1991-06-10 1996-09-17 Fujitsu Limited Pattern inspection apparatus and electron beam apparatus
JP3206143B2 (ja) * 1992-10-20 2001-09-04 富士通株式会社 荷電粒子ビーム露光方法
US5770123A (en) * 1994-09-22 1998-06-23 Ebara Corporation Method and apparatus for energy beam machining

Also Published As

Publication number Publication date
EP0931328B1 (de) 2004-09-22
ATE277421T1 (de) 2004-10-15
JP2001502112A (ja) 2001-02-13
WO1998016947A1 (de) 1998-04-23
KR20000049092A (ko) 2000-07-25
KR100402937B1 (ko) 2003-10-24
CN1240051A (zh) 1999-12-29
EA199900368A1 (ru) 1999-10-28
US6423968B1 (en) 2002-07-23
CN1171275C (zh) 2004-10-13
DE19642116C2 (de) 2000-12-07
DE19642116A1 (de) 1998-04-16
EP0931328A1 (de) 1999-07-28

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20081008