HK1001421A1 - Undercoating composition for photolithographic resist - Google Patents
Undercoating composition for photolithographic resistInfo
- Publication number
- HK1001421A1 HK1001421A1 HK98100307A HK98100307A HK1001421A1 HK 1001421 A1 HK1001421 A1 HK 1001421A1 HK 98100307 A HK98100307 A HK 98100307A HK 98100307 A HK98100307 A HK 98100307A HK 1001421 A1 HK1001421 A1 HK 1001421A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- undercoating composition
- photolithographic resist
- photolithographic
- resist
- undercoating
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Materials For Photolithography (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10592196A JP3436843B2 (ja) | 1996-04-25 | 1996-04-25 | リソグラフィー用下地材及びそれを用いたリソグラフィー用レジスト材料 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1001421A1 true HK1001421A1 (en) | 1998-06-19 |
Family
ID=14420339
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK98100307A HK1001421A1 (en) | 1996-04-25 | 1998-01-15 | Undercoating composition for photolithographic resist |
Country Status (7)
Country | Link |
---|---|
US (2) | US5939510A (xx) |
EP (1) | EP0803777B1 (xx) |
JP (1) | JP3436843B2 (xx) |
KR (1) | KR100266731B1 (xx) |
DE (1) | DE69702422T2 (xx) |
HK (1) | HK1001421A1 (xx) |
TW (1) | TW575793B (xx) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5948847A (en) * | 1996-12-13 | 1999-09-07 | Tokyo Ohka Kogyo Co., Ltd. | Undercoating composition for photolithographic patterning |
EE05627B1 (et) * | 1998-12-23 | 2013-02-15 | Pfizer Inc. | CTLA-4 vastased inimese monoklonaalsed antikehad |
TW476865B (en) * | 1999-01-28 | 2002-02-21 | Tokyo Ohka Kogyo Co Ltd | Undercoating composition for photolithographic resist |
US6544717B2 (en) | 1999-01-28 | 2003-04-08 | Tokyo Ohka Kogyo Co., Ltd. | Undercoating composition for photolithographic resist |
US6824879B2 (en) | 1999-06-10 | 2004-11-30 | Honeywell International Inc. | Spin-on-glass anti-reflective coatings for photolithography |
EP1190277B1 (en) | 1999-06-10 | 2009-10-07 | AlliedSignal Inc. | Semiconductor having spin-on-glass anti-reflective coatings for photolithography |
US6323310B1 (en) | 2000-04-19 | 2001-11-27 | Brewer Science, Inc. | Anti-reflective coating compositions comprising polymerized aminoplasts |
US6653411B2 (en) | 2000-04-19 | 2003-11-25 | Brewer Science, Inc. | Anti-reflective coating compositions comprising polymerized aminoplasts |
NL1015524C2 (nl) * | 2000-06-26 | 2001-12-28 | Otb Group Bv | Werkwijze ter vervaardiging van een substraat om te worden toegepast in een stampervervaardigingsproces, alsmede substraat verkregen volgens een dergelijke werkwijze. |
AU8500701A (en) * | 2000-08-17 | 2002-02-25 | Shipley Co Llc | Etch resistant antireflective coating compositions |
JP2004519803A (ja) * | 2001-02-27 | 2004-07-02 | Tdk株式会社 | 光情報媒体用フォトレジスト原盤の製造方法および光情報媒体用スタンパの製造方法 |
US6593055B2 (en) * | 2001-09-05 | 2003-07-15 | Kodak Polychrome Graphics Llc | Multi-layer thermally imageable element |
JP2003085829A (ja) * | 2001-09-06 | 2003-03-20 | Tdk Corp | 光情報媒体用スタンパの製造方法およびこれに用いるフォトレジスト原盤、ならびに、光情報媒体用スタンパおよび光情報媒体 |
TW591341B (en) | 2001-09-26 | 2004-06-11 | Shipley Co Llc | Coating compositions for use with an overcoated photoresist |
JP2003140347A (ja) * | 2001-11-02 | 2003-05-14 | Tokyo Ohka Kogyo Co Ltd | 厚膜ホトレジスト層積層体、厚膜レジストパターンの製造方法、および接続端子の製造方法 |
TWI228718B (en) * | 2001-11-05 | 2005-03-01 | Tdk Corp | Manufacturing method and device of mold plate for information medium |
KR20040075866A (ko) | 2001-11-15 | 2004-08-30 | 허니웰 인터내셔날 인코포레이티드 | 포토리소그래피용 스핀-온 무반사 코팅 |
WO2003058613A1 (fr) * | 2001-12-28 | 2003-07-17 | Tdk Corporation | Procede de fabrication d'une matrice de pressage pour support d'informations, matrice de pressage et disque original photosensible |
TWI264717B (en) | 2002-01-08 | 2006-10-21 | Tdk Corp | Manufacturing method of stamper for manufacturing data medium, the stamper, and the photoresist template |
TWI258142B (en) * | 2002-01-08 | 2006-07-11 | Tdk Corp | Manufacturing method of stamper for manufacturing data medium, the stamper, and the stamper spacer with template |
WO2003058614A1 (fr) * | 2002-01-08 | 2003-07-17 | Tdk Corporation | Procede de fabrication de matrice pour faconnage de support d'information, matrice et disque maitre de photoresine |
WO2003077239A1 (fr) * | 2002-03-11 | 2003-09-18 | Tdk Corporation | Procede de traitement conçu pour une matrice en resine photosensible, procede de production d'une matrice utilisant un support d'enregistrement, procede de production d'un support d'enregistrement, matrice en resine photosensible, matrice utilisant un support d'enregistrment et support d'enregistrement |
JP2004013973A (ja) * | 2002-06-05 | 2004-01-15 | Tdk Corp | フォトレジスト原盤の製造方法、光記録媒体製造用スタンパの製造方法、スタンパ、フォトレジスト原盤、スタンパ中間体及び光記録媒体 |
US7038328B2 (en) * | 2002-10-15 | 2006-05-02 | Brewer Science Inc. | Anti-reflective compositions comprising triazine compounds |
JP4523258B2 (ja) * | 2003-10-07 | 2010-08-11 | ハッコールケミカル株式会社 | 凸版印刷用感光性積層印刷原版に用いる紫外線吸収剤及びその製造方法 |
US8053159B2 (en) | 2003-11-18 | 2011-11-08 | Honeywell International Inc. | Antireflective coatings for via fill and photolithography applications and methods of preparation thereof |
US20050151283A1 (en) * | 2004-01-08 | 2005-07-14 | Bajorek Christopher H. | Method and apparatus for making a stamper for patterning CDs and DVDs |
US7427466B2 (en) * | 2004-11-29 | 2008-09-23 | Imation Corp. | Anti-reflection optical data storage disk master |
JP2006154570A (ja) * | 2004-11-30 | 2006-06-15 | Tokyo Ohka Kogyo Co Ltd | レジストパターンおよび導体パターンの製造方法 |
US8642246B2 (en) | 2007-02-26 | 2014-02-04 | Honeywell International Inc. | Compositions, coatings and films for tri-layer patterning applications and methods of preparation thereof |
US8557877B2 (en) | 2009-06-10 | 2013-10-15 | Honeywell International Inc. | Anti-reflective coatings for optically transparent substrates |
US8864898B2 (en) | 2011-05-31 | 2014-10-21 | Honeywell International Inc. | Coating formulations for optical elements |
EP3194502A4 (en) | 2015-04-13 | 2018-05-16 | Honeywell International Inc. | Polysiloxane formulations and coatings for optoelectronic applications |
US11262656B2 (en) * | 2016-03-31 | 2022-03-01 | Rohm And Haas Electronic Materials Korea Ltd. | Coating compositions for use with an overcoated photoresist |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4197392A (en) * | 1978-08-21 | 1980-04-08 | General Electric Company | Melamine coatings |
SU1052529A1 (ru) * | 1982-02-03 | 1983-11-07 | Киевский Филиал По Специальным Видам Печати Всесоюзного Научно-Исследовательского Института Комплексных Проблем Полиграфии | Лак |
US4910122A (en) * | 1982-09-30 | 1990-03-20 | Brewer Science, Inc. | Anti-reflective coating |
JPS60223121A (ja) * | 1984-04-19 | 1985-11-07 | Matsushita Electric Ind Co Ltd | パタ−ン形成方法 |
DE3736758A1 (de) * | 1987-10-30 | 1989-05-11 | Hoechst Ag | Positiv arbeitendes lichtempfindliches gemisch, enthaltend einen farbstoff, und daraus hergestelltes positiv arbeitendes lichtempfindliches aufzeichnungsmaterial |
US6165697A (en) * | 1991-11-15 | 2000-12-26 | Shipley Company, L.L.C. | Antihalation compositions |
US5234990A (en) * | 1992-02-12 | 1993-08-10 | Brewer Science, Inc. | Polymers with intrinsic light-absorbing properties for anti-reflective coating applications in deep ultraviolet microlithography |
US5294680A (en) * | 1992-07-24 | 1994-03-15 | International Business Machines Corporation | Polymeric dyes for antireflective coatings |
JP3024694B2 (ja) * | 1993-11-29 | 2000-03-21 | 東京応化工業株式会社 | ポジ型ホトレジスト組成物 |
JP2953562B2 (ja) * | 1994-07-18 | 1999-09-27 | 東京応化工業株式会社 | リソグラフィー用下地材及びそれを用いた多層レジスト材料 |
US5498514A (en) * | 1994-08-09 | 1996-03-12 | Tokyo Ohka Kogyo Co., Ltd. | Lithographic double-coated patterning plate with undercoat levelling layer |
US5652317A (en) * | 1996-08-16 | 1997-07-29 | Hoechst Celanese Corporation | Antireflective coatings for photoresist compositions |
-
1996
- 1996-04-25 JP JP10592196A patent/JP3436843B2/ja not_active Expired - Fee Related
-
1997
- 1997-04-18 EP EP97302658A patent/EP0803777B1/en not_active Expired - Lifetime
- 1997-04-18 DE DE69702422T patent/DE69702422T2/de not_active Expired - Fee Related
- 1997-04-19 TW TW86105114A patent/TW575793B/zh not_active IP Right Cessation
- 1997-04-24 US US08/845,358 patent/US5939510A/en not_active Expired - Lifetime
- 1997-04-24 KR KR1019970015396A patent/KR100266731B1/ko not_active IP Right Cessation
-
1998
- 1998-01-15 HK HK98100307A patent/HK1001421A1/xx not_active IP Right Cessation
-
1999
- 1999-03-18 US US09/271,899 patent/US6087068A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
TW575793B (en) | 2004-02-11 |
DE69702422D1 (de) | 2000-08-10 |
KR970072029A (ko) | 1997-11-07 |
KR100266731B1 (ko) | 2000-09-15 |
JPH09292715A (ja) | 1997-11-11 |
EP0803777A1 (en) | 1997-10-29 |
US5939510A (en) | 1999-08-17 |
JP3436843B2 (ja) | 2003-08-18 |
EP0803777B1 (en) | 2000-07-05 |
DE69702422T2 (de) | 2000-12-14 |
US6087068A (en) | 2000-07-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PF | Patent in force | ||
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20080418 |