GB974393A - Improvements in or relating to the x-ray fluorescence emission analysis of elements in a pulp or slurry - Google Patents
Improvements in or relating to the x-ray fluorescence emission analysis of elements in a pulp or slurryInfo
- Publication number
- GB974393A GB974393A GB3833362A GB3833362A GB974393A GB 974393 A GB974393 A GB 974393A GB 3833362 A GB3833362 A GB 3833362A GB 3833362 A GB3833362 A GB 3833362A GB 974393 A GB974393 A GB 974393A
- Authority
- GB
- United Kingdom
- Prior art keywords
- sample
- elements
- pulp
- slurry
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Abstract
974, 393. Analysis of elements in pulp or slurry using X-rays. RHOANGLO MINE SERVICES Ltd. Oct. 10, 1962 [Oct. 11, 1961], No. 38333/62. Drawings to Specification. Heading G1A. The subject matter of the Specification is the same as that of Specification 974,392 but the claims are directed to a method of and apparatus for analysing by X-ray spectrographic techniques elements contained in a fluent sample, wherein the sample is irradiated with X-rays and the secondary emission therefrom is detected to provide a measurement of the fluorescence intensity of the secondary emission, and wherein the degree of attenuation by the sample of X-rays having passed through the sample is used to adjust the fluorescence intensity measurement for variations in the density of the sample from a prescribed norm, and in which the adjusted measurement is displayed in terms of the elemental concentration of the sample.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RH49261 | 1961-10-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB974393A true GB974393A (en) | 1964-11-04 |
Family
ID=52275567
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB3833362A Expired GB974393A (en) | 1961-10-11 | 1962-10-10 | Improvements in or relating to the x-ray fluorescence emission analysis of elements in a pulp or slurry |
Country Status (7)
Country | Link |
---|---|
BE (1) | BE623395A (en) |
DE (1) | DE1201089B (en) |
DK (1) | DK105006C (en) |
FR (1) | FR1336991A (en) |
GB (1) | GB974393A (en) |
NL (1) | NL284051A (en) |
SE (1) | SE303890B (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019153040A1 (en) * | 2018-02-07 | 2019-08-15 | Boomer Advanced Manufacturing Holdings Pty Ltd | Apparatus and method for analysing and processing granular material |
WO2020008420A3 (en) * | 2018-07-05 | 2020-07-30 | Bruker Jv Israel Ltd. | Small-angle x-ray scatterometry |
US10976269B2 (en) | 2018-04-23 | 2021-04-13 | Bruker Technologies Ltd. | Wafer alignment for small-angle x-ray scatterometry |
US11169099B2 (en) | 2016-01-11 | 2021-11-09 | Bruker Technologies Ltd. | Method and apparatus for X-ray scatterometry |
US11781999B2 (en) | 2021-09-05 | 2023-10-10 | Bruker Technologies Ltd. | Spot-size control in reflection-based and scatterometry-based X-ray metrology systems |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1103562A (en) * | 1964-04-08 | 1968-02-14 | Hilger & Watts Ltd | Improvements in radiometric analysis |
-
0
- BE BE623395D patent/BE623395A/xx unknown
- NL NL284051D patent/NL284051A/xx unknown
-
1962
- 1962-10-09 SE SE1083662A patent/SE303890B/xx unknown
- 1962-10-09 DE DER33652A patent/DE1201089B/en active Pending
- 1962-10-09 FR FR911749A patent/FR1336991A/en not_active Expired
- 1962-10-10 GB GB3833362A patent/GB974393A/en not_active Expired
- 1962-10-11 DK DK439562A patent/DK105006C/en active
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11169099B2 (en) | 2016-01-11 | 2021-11-09 | Bruker Technologies Ltd. | Method and apparatus for X-ray scatterometry |
WO2019153040A1 (en) * | 2018-02-07 | 2019-08-15 | Boomer Advanced Manufacturing Holdings Pty Ltd | Apparatus and method for analysing and processing granular material |
AU2019217663B2 (en) * | 2018-02-07 | 2021-03-11 | Sorterra Global Pty Ltd | Apparatus and method for analysing and processing granular material |
US11519868B2 (en) | 2018-02-07 | 2022-12-06 | Sorterra Global Pty Ltd | Apparatus and method for analysing and processing granular material |
US10976269B2 (en) | 2018-04-23 | 2021-04-13 | Bruker Technologies Ltd. | Wafer alignment for small-angle x-ray scatterometry |
US10976268B2 (en) | 2018-04-23 | 2021-04-13 | Bruker Technologies Ltd. | X-ray source optics for small-angle X-ray scatterometry |
US10976270B2 (en) | 2018-04-23 | 2021-04-13 | Bruker Technologies Ltd. | X-ray detection optics for small-angle X-ray scatterometry |
WO2020008420A3 (en) * | 2018-07-05 | 2020-07-30 | Bruker Jv Israel Ltd. | Small-angle x-ray scatterometry |
US11181490B2 (en) | 2018-07-05 | 2021-11-23 | Bruker Technologies Ltd. | Small-angle x-ray scatterometry |
US11781999B2 (en) | 2021-09-05 | 2023-10-10 | Bruker Technologies Ltd. | Spot-size control in reflection-based and scatterometry-based X-ray metrology systems |
Also Published As
Publication number | Publication date |
---|---|
BE623395A (en) | 1900-01-01 |
SE303890B (en) | 1968-09-09 |
DE1201089B (en) | 1965-09-16 |
NL284051A (en) | 1900-01-01 |
FR1336991A (en) | 1963-09-06 |
DK105006C (en) | 1966-08-01 |
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