FR1336991A - Improvements in methods and apparatus for the analysis, by spectrography of the secondary emission of chi rays, of elements contained in a pulp or suspension - Google Patents
Improvements in methods and apparatus for the analysis, by spectrography of the secondary emission of chi rays, of elements contained in a pulp or suspensionInfo
- Publication number
- FR1336991A FR1336991A FR911749A FR911749A FR1336991A FR 1336991 A FR1336991 A FR 1336991A FR 911749 A FR911749 A FR 911749A FR 911749 A FR911749 A FR 911749A FR 1336991 A FR1336991 A FR 1336991A
- Authority
- FR
- France
- Prior art keywords
- spectrography
- chi
- pulp
- rays
- suspension
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| RH49261 | 1961-10-11 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| FR1336991A true FR1336991A (en) | 1963-09-06 |
Family
ID=52275567
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR911749A Expired FR1336991A (en) | 1961-10-11 | 1962-10-09 | Improvements in methods and apparatus for the analysis, by spectrography of the secondary emission of chi rays, of elements contained in a pulp or suspension |
Country Status (7)
| Country | Link |
|---|---|
| BE (1) | BE623395A (en) |
| DE (1) | DE1201089B (en) |
| DK (1) | DK105006C (en) |
| FR (1) | FR1336991A (en) |
| GB (1) | GB974393A (en) |
| NL (1) | NL284051A (en) |
| SE (1) | SE303890B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1598528B1 (en) * | 1964-04-08 | 1970-12-23 | Hilger & Watts Ltd | Device for radiometric analysis of suspensions |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10684238B2 (en) | 2016-01-11 | 2020-06-16 | Bruker Technologies Ltd. | Method and apparatus for X-ray scatterometry |
| WO2019153040A1 (en) * | 2018-02-07 | 2019-08-15 | Boomer Advanced Manufacturing Holdings Pty Ltd | Apparatus and method for analysing and processing granular material |
| JP2019191167A (en) | 2018-04-23 | 2019-10-31 | ブルカー ジェイヴィ イスラエル リミテッドＢｒｕｋｅｒ Ｊｖ Ｉｓｒａｅｌ Ｌｔｄ． | X ray source optical system for small-angle x-ray scatterometry |
| JP7308233B2 (en) * | 2018-07-05 | 2023-07-13 | ブルカー テクノロジーズ リミテッド | Small-angle X-ray scattering meter |
| US11781999B2 (en) | 2021-09-05 | 2023-10-10 | Bruker Technologies Ltd. | Spot-size control in reflection-based and scatterometry-based X-ray metrology systems |
-
0
- BE BE623395D patent/BE623395A/xx unknown
- NL NL284051D patent/NL284051A/xx unknown
-
1962
- 1962-10-09 DE DER33652A patent/DE1201089B/en active Pending
- 1962-10-09 SE SE1083662A patent/SE303890B/xx unknown
- 1962-10-09 FR FR911749A patent/FR1336991A/en not_active Expired
- 1962-10-10 GB GB3833362A patent/GB974393A/en not_active Expired
- 1962-10-11 DK DK439562A patent/DK105006C/en active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1598528B1 (en) * | 1964-04-08 | 1970-12-23 | Hilger & Watts Ltd | Device for radiometric analysis of suspensions |
Also Published As
| Publication number | Publication date |
|---|---|
| SE303890B (en) | 1968-09-09 |
| DK105006C (en) | 1966-08-01 |
| BE623395A (en) | 1900-01-01 |
| GB974393A (en) | 1964-11-04 |
| NL284051A (en) | 1900-01-01 |
| DE1201089B (en) | 1965-09-16 |
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