SE303890B - - Google Patents
Info
- Publication number
- SE303890B SE303890B SE1083662A SE1083662A SE303890B SE 303890 B SE303890 B SE 303890B SE 1083662 A SE1083662 A SE 1083662A SE 1083662 A SE1083662 A SE 1083662A SE 303890 B SE303890 B SE 303890B
- Authority
- SE
- Sweden
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| RH49261 | 1961-10-11 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SE303890B true SE303890B (xx) | 1968-09-09 |
Family
ID=52275567
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE1083662A SE303890B (xx) | 1961-10-11 | 1962-10-09 |
Country Status (7)
| Country | Link |
|---|---|
| BE (1) | BE623395A (xx) |
| DE (1) | DE1201089B (xx) |
| DK (1) | DK105006C (xx) |
| FR (1) | FR1336991A (xx) |
| GB (1) | GB974393A (xx) |
| NL (1) | NL284051A (xx) |
| SE (1) | SE303890B (xx) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1103562A (en) * | 1964-04-08 | 1968-02-14 | Hilger & Watts Ltd | Improvements in radiometric analysis |
| JP6999268B2 (ja) | 2016-01-11 | 2022-01-18 | ブルカー テクノロジーズ リミテッド | Ｘ線スキャタロメトリーのための方法および装置 |
| WO2019153040A1 (en) * | 2018-02-07 | 2019-08-15 | Boomer Advanced Manufacturing Holdings Pty Ltd | Apparatus and method for analysing and processing granular material |
| JP2019191169A (ja) | 2018-04-23 | 2019-10-31 | ブルカー ジェイヴィ イスラエル リミテッドＢｒｕｋｅｒ Ｊｖ Ｉｓｒａｅｌ Ｌｔｄ． | 小角ｘ線散乱測定用のｘ線源光学系 |
| CN112654861B (zh) | 2018-07-05 | 2024-06-11 | 布鲁克科技公司 | 小角度x射线散射测量 |
| US11781999B2 (en) | 2021-09-05 | 2023-10-10 | Bruker Technologies Ltd. | Spot-size control in reflection-based and scatterometry-based X-ray metrology systems |
-
0
- NL NL284051D patent/NL284051A/xx unknown
- BE BE623395D patent/BE623395A/xx unknown
-
1962
- 1962-10-09 SE SE1083662A patent/SE303890B/xx unknown
- 1962-10-09 DE DER33652A patent/DE1201089B/de active Pending
- 1962-10-09 FR FR911749A patent/FR1336991A/fr not_active Expired
- 1962-10-10 GB GB3833362A patent/GB974393A/en not_active Expired
- 1962-10-11 DK DK439562A patent/DK105006C/da active
Also Published As
| Publication number | Publication date |
|---|---|
| FR1336991A (fr) | 1963-09-06 |
| GB974393A (en) | 1964-11-04 |
| DK105006C (da) | 1966-08-01 |
| BE623395A (xx) | 1900-01-01 |
| NL284051A (xx) | 1900-01-01 |
| DE1201089B (de) | 1965-09-16 |