GB918297A - Improvements in electron microscopes - Google Patents
Improvements in electron microscopesInfo
- Publication number
- GB918297A GB918297A GB12361/60A GB1236160A GB918297A GB 918297 A GB918297 A GB 918297A GB 12361/60 A GB12361/60 A GB 12361/60A GB 1236160 A GB1236160 A GB 1236160A GB 918297 A GB918297 A GB 918297A
- Authority
- GB
- United Kingdom
- Prior art keywords
- specimen
- electrons
- electron
- analysis
- emission
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000004458 analytical method Methods 0.000 abstract 3
- 238000003384 imaging method Methods 0.000 abstract 2
- 150000002500 ions Chemical class 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 2
- 230000005540 biological transmission Effects 0.000 abstract 1
- 238000010894 electron beam technology Methods 0.000 abstract 1
- 238000002003 electron diffraction Methods 0.000 abstract 1
- 238000000386 microscopy Methods 0.000 abstract 1
- 238000004846 x-ray emission Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
- H01J37/222—Image processing arrangements associated with the tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
- H01J37/224—Luminescent screens or photographic plates for imaging; Apparatus specially adapted therefor, e. g. cameras, TV-cameras, photographic equipment or exposure control; Optical subsystems specially adapted therefor, e. g. microscopes for observing image on luminescent screen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB12361/60A GB918297A (en) | 1960-04-07 | 1960-04-07 | Improvements in electron microscopes |
| NL263015D NL263015A (forum.php) | 1960-04-07 | 1961-01-30 | |
| US112139A US3155827A (en) | 1960-04-07 | 1961-03-24 | Electron microscope with a secondary electron source utilized for electron probe analysis |
| FR17807A FR1285063A (fr) | 1960-04-07 | 1961-03-29 | Perfectionnements aux microscopes électroniques |
| DEN19846A DE1204350B (de) | 1960-04-07 | 1961-04-05 | Elektronenmikroskop |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB12361/60A GB918297A (en) | 1960-04-07 | 1960-04-07 | Improvements in electron microscopes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB918297A true GB918297A (en) | 1963-02-13 |
Family
ID=10003117
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB12361/60A Expired GB918297A (en) | 1960-04-07 | 1960-04-07 | Improvements in electron microscopes |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3155827A (forum.php) |
| DE (1) | DE1204350B (forum.php) |
| FR (1) | FR1285063A (forum.php) |
| GB (1) | GB918297A (forum.php) |
| NL (1) | NL263015A (forum.php) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0114765A3 (en) * | 1983-01-14 | 1984-08-29 | Cameca | Process and device for the ion analysis of non-conducting specimen |
| US4564758A (en) * | 1984-02-01 | 1986-01-14 | Cameca | Process and device for the ionic analysis of an insulating sample |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH451331A (de) * | 1965-12-13 | 1968-05-15 | Heinz Steigerwald Karl | Elektronenstrahl-Erzeugungssystem |
| CA935568A (en) * | 1970-03-20 | 1973-10-16 | Houtman Eliberthus | Device for examining material by x-ray fluorescence |
| US5362964A (en) * | 1993-07-30 | 1994-11-08 | Electroscan Corporation | Environmental scanning electron microscope |
| US5412211A (en) * | 1993-07-30 | 1995-05-02 | Electroscan Corporation | Environmental scanning electron microscope |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE692336C (de) * | 1934-12-07 | 1940-06-18 | Bodo V Borries Dr Ing | Verfahren zur Abbildung von Flaechen mittels Korpuskularstrahlen |
| US2356633A (en) * | 1939-10-19 | 1944-08-22 | Ardenne Manfred Von | Electronic microscope |
| DE748680C (de) * | 1939-10-19 | 1944-11-08 | Elektronenmikroskop | |
| DE761663C (de) * | 1942-01-21 | 1953-10-12 | Aeg | Elektronenmikroskop, insbesondere UEbermikroskop, mit einer als Elektronenspiegel wirkenden Projektionslinse |
| DE893104C (de) * | 1943-01-04 | 1953-10-12 | Siemens Ag | Vorrichtung zur Querverstellung des Objektes im Strahlengang von Korpuskularstrahlapparaten |
| NL98715C (forum.php) * | 1953-09-04 | |||
| US2890342A (en) * | 1954-09-29 | 1959-06-09 | Gen Electric | System for charge neutralization |
| DE1133841B (de) * | 1957-09-11 | 1962-07-26 | Leitz Ernst Gmbh | Elektronenmikroskop zur direkten Abbildung von Oberflaechen durch Sekundaerelektronen, Verfahren zur Untersuchung von Nichtleitern oder Halbleitern und Anordnung zur Durchfuehrung des Verfahrens |
| US3049618A (en) * | 1959-05-13 | 1962-08-14 | Commissariat Energie Atomique | Methods and devices for performing spectrum analysis, in particular in the far ultraviolet region |
| DE1099102B (de) * | 1959-05-26 | 1961-02-09 | Siemens Ag | Blendenanordnung fuer Elektronenmikroskope mit Zusatzeinrichtung zur Roentgenspektroskopie durchstrahlbarer Praeparate |
-
1960
- 1960-04-07 GB GB12361/60A patent/GB918297A/en not_active Expired
-
1961
- 1961-01-30 NL NL263015D patent/NL263015A/xx unknown
- 1961-03-24 US US112139A patent/US3155827A/en not_active Expired - Lifetime
- 1961-03-29 FR FR17807A patent/FR1285063A/fr not_active Expired
- 1961-04-05 DE DEN19846A patent/DE1204350B/de active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0114765A3 (en) * | 1983-01-14 | 1984-08-29 | Cameca | Process and device for the ion analysis of non-conducting specimen |
| FR2542089A1 (fr) * | 1983-01-14 | 1984-09-07 | Centre Nat Rech Scient | Procede et dispositif pour l'analyse ionique d'un echantillon isolant |
| US4564758A (en) * | 1984-02-01 | 1986-01-14 | Cameca | Process and device for the ionic analysis of an insulating sample |
Also Published As
| Publication number | Publication date |
|---|---|
| FR1285063A (fr) | 1962-02-16 |
| DE1204350B (de) | 1965-11-04 |
| NL263015A (forum.php) | 1964-05-25 |
| US3155827A (en) | 1964-11-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4211924A (en) | Transmission-type scanning charged-particle beam microscope | |
| US2257774A (en) | Electronic-optical device | |
| US5008537A (en) | Composite apparatus with secondary ion mass spectrometry instrument and scanning electron microscope | |
| US2372422A (en) | Electron microanalyzer | |
| US2418029A (en) | Electron probe analysis employing X-ray spectrography | |
| US3732426A (en) | X-ray source for generating an x-ray beam having selectable sectional shapes | |
| GB918297A (en) | Improvements in electron microscopes | |
| US2281325A (en) | Electron microscope | |
| DE2004256C3 (de) | Vorrichtung zur Festkörperoberflächenanalyse mit einer Elektronenstrahl- Mikrosonde | |
| US2330930A (en) | Scanning type of electron microscope | |
| EP0401658A1 (de) | Rastertunnelmikroskop mit Einrichtungen zur Erfassung von von der Probe herkommender Elektronen | |
| US2418228A (en) | Electronic microanalyzer | |
| Oatley et al. | The development of the scanning electron microscope | |
| US3696246A (en) | Specimen analysis in an electron microscope | |
| US2405306A (en) | Electronic microanalyzer monitoring | |
| US2348031A (en) | Method of focusing electron microscopes | |
| US3446960A (en) | Device for measuring electron-beam intensities and for subjecting materials to electron irradiation in an electron microscope | |
| GB899291A (en) | An arrangement capable of being used as an electron microscope and for x-ray spectrometric examination | |
| DE2640260B2 (de) | Durchstrahlungs-Raster-Korpuskularstrahlmikroskop | |
| JP3064335B2 (ja) | 透過型電子顕微鏡 | |
| JPH06318443A (ja) | イオンビーム装置 | |
| DE2245397C3 (de) | Abtast-Elektronenmikroskop | |
| GB1025683A (en) | Improvements in or relating to microanalyzers | |
| JPH082603Y2 (ja) | X線分析装置 | |
| US3078368A (en) | Electron-diffracting device |