GB9009555D0 - In-service testing of logic systems - Google Patents

In-service testing of logic systems

Info

Publication number
GB9009555D0
GB9009555D0 GB9009555A GB9009555A GB9009555D0 GB 9009555 D0 GB9009555 D0 GB 9009555D0 GB 9009555 A GB9009555 A GB 9009555A GB 9009555 A GB9009555 A GB 9009555A GB 9009555 D0 GB9009555 D0 GB 9009555D0
Authority
GB
United Kingdom
Prior art keywords
logic
logic systems
service testing
test pulse
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB9009555A
Other versions
GB2243453A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PROTECH INSTR AND SYSTEMS Ltd
Original Assignee
PROTECH INSTR AND SYSTEMS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PROTECH INSTR AND SYSTEMS Ltd filed Critical PROTECH INSTR AND SYSTEMS Ltd
Priority to GB9009555A priority Critical patent/GB2243453A/en
Publication of GB9009555D0 publication Critical patent/GB9009555D0/en
Publication of GB2243453A publication Critical patent/GB2243453A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
    • G06F11/0757—Error or fault detection not based on redundancy by exceeding limits by exceeding a time limit, i.e. time-out, e.g. watchdogs

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

In a logic system comprising an input conditioning circuit (05), combinational logic (07), and a power amplifier solid- state output relay (09), signal paths through the logic are verified by injecting (11) a test pulse into an input filter (03, 04) and checking for its arrival at the output with an indicator (15). The test pulse duration is shorter than the response time of a solenoid load (10). The test process may be computer-controlled. <IMAGE>
GB9009555A 1990-04-27 1990-04-27 Testing logic circuits Withdrawn GB2243453A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9009555A GB2243453A (en) 1990-04-27 1990-04-27 Testing logic circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9009555A GB2243453A (en) 1990-04-27 1990-04-27 Testing logic circuits

Publications (2)

Publication Number Publication Date
GB9009555D0 true GB9009555D0 (en) 1990-06-20
GB2243453A GB2243453A (en) 1991-10-30

Family

ID=10675138

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9009555A Withdrawn GB2243453A (en) 1990-04-27 1990-04-27 Testing logic circuits

Country Status (1)

Country Link
GB (1) GB2243453A (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54947A (en) * 1977-06-06 1979-01-06 Hitachi Ltd Failure detection system for digital output circuit
GB2054173B (en) * 1978-07-21 1982-09-08 Honda Motor Co Ltd Trouble diagnosing device of a control system

Also Published As

Publication number Publication date
GB2243453A (en) 1991-10-30

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)