GB2494733A - Measuring particle size distribution by light scattering - Google Patents

Measuring particle size distribution by light scattering Download PDF

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Publication number
GB2494733A
GB2494733A GB1208181.6A GB201208181A GB2494733A GB 2494733 A GB2494733 A GB 2494733A GB 201208181 A GB201208181 A GB 201208181A GB 2494733 A GB2494733 A GB 2494733A
Authority
GB
United Kingdom
Prior art keywords
text
detector
size distribution
light
particle size
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB1208181.6A
Other languages
English (en)
Other versions
GB201208181D0 (en
Inventor
David Michael Spriggs
Duncan Stephenson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Malvern Panalytical Ltd
Original Assignee
Malvern Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Malvern Instruments Ltd filed Critical Malvern Instruments Ltd
Publication of GB201208181D0 publication Critical patent/GB201208181D0/en
Priority to EP12775280.6A priority Critical patent/EP2756283B1/en
Priority to JP2014530309A priority patent/JP6154812B2/ja
Priority to PCT/GB2012/052229 priority patent/WO2013038160A1/en
Priority to CN201280042740.0A priority patent/CN104067105B/zh
Priority to US14/345,073 priority patent/US9869625B2/en
Publication of GB2494733A publication Critical patent/GB2494733A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4788—Diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
GB1208181.6A 2011-09-14 2012-05-10 Measuring particle size distribution by light scattering Withdrawn GB2494733A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
EP12775280.6A EP2756283B1 (en) 2011-09-14 2012-09-11 Apparatus and method for measuring particle size distribution by light scattering
JP2014530309A JP6154812B2 (ja) 2011-09-14 2012-09-11 光散乱による粒子径分布測定用装置及び方法
PCT/GB2012/052229 WO2013038160A1 (en) 2011-09-14 2012-09-11 Apparatus and method for measuring particle size distribution by light scattering
CN201280042740.0A CN104067105B (zh) 2011-09-14 2012-09-11 用于通过光散射测量颗粒尺寸分布的设备和方法
US14/345,073 US9869625B2 (en) 2011-09-14 2012-09-11 Apparatus and method for measuring particle size distribution by light scattering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201161534851P 2011-09-14 2011-09-14

Publications (2)

Publication Number Publication Date
GB201208181D0 GB201208181D0 (en) 2012-06-20
GB2494733A true GB2494733A (en) 2013-03-20

Family

ID=46396799

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1208181.6A Withdrawn GB2494733A (en) 2011-09-14 2012-05-10 Measuring particle size distribution by light scattering

Country Status (6)

Country Link
US (1) US9869625B2 (enExample)
EP (1) EP2756283B1 (enExample)
JP (1) JP6154812B2 (enExample)
CN (1) CN104067105B (enExample)
GB (1) GB2494733A (enExample)
WO (1) WO2013038160A1 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105092429A (zh) * 2014-05-13 2015-11-25 河北联合大学 双色激光磨矿粒度在线分析仪
EP2975380A1 (en) * 2013-03-29 2016-01-20 Sysmex Corporation Particle measuring apparatus
US9513206B2 (en) 2013-03-29 2016-12-06 Sysmex Corporation Particle measuring apparatus
US11378510B2 (en) 2016-09-09 2022-07-05 Sony Corporation Fine particle measuring device and fine particle measuring method

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JP2015094737A (ja) * 2013-11-14 2015-05-18 ソニー株式会社 光照射装置、粒子分析装置および光照射方法
US10456767B2 (en) * 2014-10-22 2019-10-29 Hitachi High-Technologies Corporation Cytometric mechanism, cell culture device comprising same, and cytometric method
EP3308136B1 (en) * 2015-06-12 2021-12-15 Koninklijke Philips N.V. Optical particle sensor and sensing method
EP3279635B1 (en) * 2016-08-04 2022-06-01 Malvern Panalytical Limited Method, processor and machine-readable, non-transient storage medium for characterising particles suspended in a fluid dispersant
US10648909B2 (en) 2017-05-25 2020-05-12 Abbott Laboratories Methods and systems for assessing flow cell cleanliness
KR102153640B1 (ko) * 2018-01-09 2020-09-08 채규욱 광학식 미세먼지 센서
EP3870616B1 (en) 2018-10-25 2023-10-11 DuPont Industrial Biosciences USA, LLC Alpha-1,3-glucan graft copolymers
WO2020106036A1 (en) 2018-11-19 2020-05-28 Samsung Electronics Co., Ltd. Multimodal dust sensor
KR102158927B1 (ko) * 2019-01-09 2020-09-22 인천대학교 산학협력단 입자 측정 장치
CN116359085A (zh) * 2023-04-28 2023-06-30 河北工业大学 一种共轴双光源和双探测器阵列同步采集的激光粒度仪

Citations (9)

* Cited by examiner, † Cited by third party
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US4361403A (en) * 1978-06-26 1982-11-30 Loos Hendricus G Multiple wavelength instrument for measurement of particle size distributions
US4957363A (en) * 1987-07-03 1990-09-18 Hitachi, Ltd. Apparatus for measuring characteristics of particles in fluid by detecting light scattered at the particles
EP0485817A1 (en) * 1990-11-03 1992-05-20 Horiba, Ltd. Apparatus for measuring a particle size distribution
US5416580A (en) * 1993-07-07 1995-05-16 General Signal Corporation Methods and apparatus for determining small particle size distribution utilizing multiple light beams
GB2340936A (en) * 1998-08-22 2000-03-01 Malvern Instr Ltd Particle size distribution measurement using dual sources of different wavelengths
GB2346444A (en) * 1999-01-23 2000-08-09 Harley Scient Limited Particle size measurement using dual laser assemblies
WO2000077489A1 (de) * 1999-06-10 2000-12-21 Dirk David Goldbeck Verfahren und vorrichtung zur abbildung von mikroskopisch kleinen teilchen
US20060052944A1 (en) * 2004-08-30 2006-03-09 Makoto Nagura Particle size distribution analyzer
EP1884762A2 (en) * 2006-08-04 2008-02-06 Shimadzu Corporation Light Scattering Detector

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US4881231A (en) * 1988-11-28 1989-11-14 Kantilal Jain Frequency-stabilized line-narrowed excimer laser source system for high resolution lithography
US4953978A (en) * 1989-03-03 1990-09-04 Coulter Electronics Of New England, Inc. Particle size analysis utilizing polarization intensity differential scattering
US6246892B1 (en) * 1991-01-24 2001-06-12 Non-Invasive Technology Phase modulation spectroscopy
NZ244186A (en) * 1991-09-06 1995-04-27 Commw Scient Ind Res Org Determination of parameters of object optically and validation of object
JP3145487B2 (ja) * 1992-06-12 2001-03-12 シスメックス株式会社 粒子分析装置
US5475235A (en) * 1993-08-09 1995-12-12 Wyatt Technoloy Corporation Control of laser light power output for use in light scattering instruments by inducing mode hopping and averaging result
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JP2000146814A (ja) 1998-11-13 2000-05-26 Horiba Ltd 粒径分布測定装置
AU8026100A (en) * 1999-10-15 2001-04-30 The Administrators Of The Tulane Eductional Fund Device for and method of simultaneously measuring light scatter from multiple liquid samples
US6858104B2 (en) * 2002-01-28 2005-02-22 Scimed Life Systems, Inc. Apparatus and method for closed-loop control of laser welder for welding polymeric catheter components
US7433053B2 (en) * 2002-08-08 2008-10-07 Applied Materials, Israel, Ltd. Laser inspection using diffractive elements for enhancement and suppression of surface features
EP1546691A1 (en) * 2002-09-30 2005-06-29 Applied Materials Israel Ltd. Inspection system with oblique viewing angle
JP2005088512A (ja) * 2003-09-19 2005-04-07 Minolta Co Ltd 照明装置
JP2005316289A (ja) * 2004-04-30 2005-11-10 Olympus Corp 顕微鏡の照明装置
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DE102008064665B4 (de) * 2008-09-15 2016-06-09 Fritsch Gmbh Partikelgrößenmessgerät
JP5640420B2 (ja) * 2009-05-29 2014-12-17 株式会社リコー 投影型画像表示装置
WO2011162787A1 (en) * 2010-06-22 2011-12-29 President And Fellows Of Harvard College Systems and methods providing efficient detection of back-scattered illumination in modulation transfer microscopy or micro-spectroscopy
CN102175587A (zh) 2010-12-31 2011-09-07 深圳市美思康电子有限公司 用于血液细胞分析、流式细胞分析、体液分析的激光系统
CN201935855U (zh) * 2011-01-07 2011-08-17 深圳市美思康电子有限公司 双能激光系统
FR2979873B1 (fr) 2011-09-12 2013-10-04 Valeo Securite Habitacle Procede d'ouverture d'un ouvrant de vehicule automobile

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4361403A (en) * 1978-06-26 1982-11-30 Loos Hendricus G Multiple wavelength instrument for measurement of particle size distributions
US4957363A (en) * 1987-07-03 1990-09-18 Hitachi, Ltd. Apparatus for measuring characteristics of particles in fluid by detecting light scattered at the particles
EP0485817A1 (en) * 1990-11-03 1992-05-20 Horiba, Ltd. Apparatus for measuring a particle size distribution
US5416580A (en) * 1993-07-07 1995-05-16 General Signal Corporation Methods and apparatus for determining small particle size distribution utilizing multiple light beams
GB2340936A (en) * 1998-08-22 2000-03-01 Malvern Instr Ltd Particle size distribution measurement using dual sources of different wavelengths
GB2346444A (en) * 1999-01-23 2000-08-09 Harley Scient Limited Particle size measurement using dual laser assemblies
WO2000077489A1 (de) * 1999-06-10 2000-12-21 Dirk David Goldbeck Verfahren und vorrichtung zur abbildung von mikroskopisch kleinen teilchen
US20060052944A1 (en) * 2004-08-30 2006-03-09 Makoto Nagura Particle size distribution analyzer
EP1884762A2 (en) * 2006-08-04 2008-02-06 Shimadzu Corporation Light Scattering Detector

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2975380A1 (en) * 2013-03-29 2016-01-20 Sysmex Corporation Particle measuring apparatus
US9513206B2 (en) 2013-03-29 2016-12-06 Sysmex Corporation Particle measuring apparatus
US10094760B2 (en) 2013-03-29 2018-10-09 Sysmex Corporation Particle measuring apparatus
CN105092429A (zh) * 2014-05-13 2015-11-25 河北联合大学 双色激光磨矿粒度在线分析仪
US11378510B2 (en) 2016-09-09 2022-07-05 Sony Corporation Fine particle measuring device and fine particle measuring method

Also Published As

Publication number Publication date
JP6154812B2 (ja) 2017-06-28
GB201208181D0 (en) 2012-06-20
US20150138550A1 (en) 2015-05-21
EP2756283A1 (en) 2014-07-23
CN104067105A (zh) 2014-09-24
CN104067105B (zh) 2018-04-10
US9869625B2 (en) 2018-01-16
EP2756283B1 (en) 2016-03-16
JP2014530349A (ja) 2014-11-17
WO2013038160A1 (en) 2013-03-21

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WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)