WO2022245193A3 - 미세 입자의 탁도 측정 장치 및 그 방법 - Google Patents

미세 입자의 탁도 측정 장치 및 그 방법 Download PDF

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Publication number
WO2022245193A3
WO2022245193A3 PCT/KR2022/010572 KR2022010572W WO2022245193A3 WO 2022245193 A3 WO2022245193 A3 WO 2022245193A3 KR 2022010572 W KR2022010572 W KR 2022010572W WO 2022245193 A3 WO2022245193 A3 WO 2022245193A3
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laser
fine particles
laser beam
light
path
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PCT/KR2022/010572
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English (en)
French (fr)
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WO2022245193A2 (ko
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최영복
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(주)파이버피아
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Publication of WO2022245193A2 publication Critical patent/WO2022245193A2/ko
Publication of WO2022245193A3 publication Critical patent/WO2022245193A3/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N21/8507—Probe photometers, i.e. with optical measuring part dipped into fluid sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/075—Investigating concentration of particle suspensions by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0042—Investigating dispersion of solids
    • G01N2015/0053—Investigating dispersion of solids in liquids, e.g. trouble
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N2015/0687—Investigating concentration of particle suspensions in solutions, e.g. non volatile residue
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G01N2021/4745—Fused bundle, i.e. for backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N21/8507—Probe photometers, i.e. with optical measuring part dipped into fluid sample
    • G01N2021/8528—Immerged light conductor
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/30—Hydrogen technology
    • Y02E60/50—Fuel cells

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

본 발명은 미세 입자의 탁도 측정 장치 및 그 방법에 관한 것으로서, 기 설정된 파장 대역의 레이저빔을 조사하는 레이저 모듈; 상기 레이저 모듈에서 조사된 레이저빔을 제1 레이저 경로와 제2 레이저 경로로 분기하여 출력하는 커플러; 상기 용액을 포함한 용기 쪽으로 상기 제1 레이저 경로로 출력되는 레이저빔을 출력하는 프로브; 상기 프로브에서 출력되는 레이저빔이 상기 용기 내부로 입사되어, 상기 용액 내 미세 입자에 의해 반사 또는 산란되는 광을 검출하는 수광소자; 및 상기 커플러에 의해 상기 제2 레이저 경로로 전달되는 상기 수광 소자에서 검출된 광의 세기를 이용하여 탁도 값을 산출하는 제어부를 포함하는 장치일 수 있고, 이때 미세 입자는 세륨 또는 세륨을 포함한 화합물인 것이다.
PCT/KR2022/010572 2021-05-20 2022-07-20 미세 입자의 탁도 측정 장치 및 그 방법 WO2022245193A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2021-0064751 2021-05-20
KR1020210064751A KR102459436B1 (ko) 2021-05-20 2021-05-20 미세 입자의 탁도 측정 장치 및 그 방법

Publications (2)

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WO2022245193A2 WO2022245193A2 (ko) 2022-11-24
WO2022245193A3 true WO2022245193A3 (ko) 2023-01-05

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PCT/KR2022/010572 WO2022245193A2 (ko) 2021-05-20 2022-07-20 미세 입자의 탁도 측정 장치 및 그 방법

Country Status (3)

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US (1) US12031893B2 (ko)
KR (1) KR102459436B1 (ko)
WO (1) WO2022245193A2 (ko)

Citations (5)

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Publication number Priority date Publication date Assignee Title
KR200377868Y1 (ko) * 2004-12-17 2005-03-14 주식회사 에치에프알 외장형 ＴＥＣ（Ｔｈｅｒｍａｌ ＥｌｅｃｔｒｉｃＣｏｏｌｅｒ）를 적용한 온도 안정화 장치 및 이를적용한 광통신 모듈
KR100572370B1 (ko) * 2003-03-12 2006-04-18 김병기 저탁도용 탁도측정장치 및 그 측정방법
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KR20140137065A (ko) * 2013-05-21 2014-12-02 한양대학교 산학협력단 방사선 센서 프로브 및 그를 구비한 광섬유 기반 방사선 센서 시스템

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Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100572370B1 (ko) * 2003-03-12 2006-04-18 김병기 저탁도용 탁도측정장치 및 그 측정방법
KR200377868Y1 (ko) * 2004-12-17 2005-03-14 주식회사 에치에프알 외장형 ＴＥＣ（Ｔｈｅｒｍａｌ ＥｌｅｃｔｒｉｃＣｏｏｌｅｒ）를 적용한 온도 안정화 장치 및 이를적용한 광통신 모듈
KR100903628B1 (ko) * 2007-08-16 2009-06-18 강원대학교산학협력단 탁도계
KR101004450B1 (ko) * 2009-02-03 2010-12-27 (주)동양화학 소수성 졸-겔로 개질된 고분자막을 갖는 탁도 측정용 프로브
KR20140137065A (ko) * 2013-05-21 2014-12-02 한양대학교 산학협력단 방사선 센서 프로브 및 그를 구비한 광섬유 기반 방사선 센서 시스템

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Publication number Publication date
US12031893B2 (en) 2024-07-09
US20220373448A1 (en) 2022-11-24
WO2022245193A2 (ko) 2022-11-24
KR102459436B1 (ko) 2022-10-27

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