GB1540918A - Method of and apparatus for examining the roughness of surfaces - Google Patents
Method of and apparatus for examining the roughness of surfacesInfo
- Publication number
- GB1540918A GB1540918A GB33227/76A GB3322776A GB1540918A GB 1540918 A GB1540918 A GB 1540918A GB 33227/76 A GB33227/76 A GB 33227/76A GB 3322776 A GB3322776 A GB 3322776A GB 1540918 A GB1540918 A GB 1540918A
- Authority
- GB
- United Kingdom
- Prior art keywords
- examining
- roughness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19752535912 DE2535912A1 (de) | 1975-08-12 | 1975-08-12 | Verfahren und vorrichtung zur rauhigkeitspruefung von oberflaechen |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1540918A true GB1540918A (en) | 1979-02-21 |
Family
ID=5953810
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB33227/76A Expired GB1540918A (en) | 1975-08-12 | 1976-08-10 | Method of and apparatus for examining the roughness of surfaces |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4106333A (enExample) |
| DE (1) | DE2535912A1 (enExample) |
| GB (1) | GB1540918A (enExample) |
| IT (1) | IT1068041B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3990128C2 (de) * | 1989-02-16 | 1994-10-13 | Bando Chemical Ind | Vorrichtung zum Prüfen einer Firstlinie elastischer Körper |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2640894C2 (de) * | 1976-09-10 | 1985-08-01 | Feinprüf Feinmeß- und Prüfgeräte GmbH, 3400 Göttingen | Vorschubgerät für die Oberflächenmessung nach dem Tastschnitt-Verfahren |
| US4200986A (en) * | 1978-09-21 | 1980-05-06 | Ait Corporation | Digital indicator |
| IT1106714B (it) * | 1978-12-21 | 1985-11-18 | Finike Italiana Marposs | Apparecchio per il rilevamento di caratteristiche geometriche di pezzi meccanici |
| US4290303A (en) * | 1979-07-03 | 1981-09-22 | Westinghouse Electric Corp. | Apparatus for measuring surface scratches on a tube |
| DE3003370A1 (de) * | 1980-01-31 | 1982-01-07 | Elan-Schaltelemente Kurt Maecker Gmbh, 4040 Neuss | Feinmesstaster, insbesondere als wegaufnehmer fuer laengenmessgeraete |
| DE3039130C2 (de) * | 1980-07-31 | 1982-12-09 | Maag-Zahnräder & -Maschinen AG, 8023 Zürich | Einrichtung zum selbsttätigen Nachstellen und Abrichten einer Schleifscheibe |
| US4476489A (en) * | 1982-05-20 | 1984-10-09 | Inspection Technology, Inc. | Microfinish measurement apparatus and technique |
| US4574625A (en) * | 1983-04-12 | 1986-03-11 | Federal Products Corporation | Surface finish, displacement and contour scanner |
| CH661980A5 (de) * | 1983-12-21 | 1987-08-31 | Maag Zahnraeder & Maschinen Ag | Taster fuer ein zahnflankenprofilmessgeraet zur ermittlung der zahnflankenoberflaechenrauheit. |
| DE3590145C2 (enExample) * | 1984-04-10 | 1990-02-22 | Mitutoyo Mfg. Co., Ltd., Tokio/Tokyo, Jp | |
| DE3565131D1 (en) * | 1984-12-10 | 1988-10-27 | Rieter Ag Maschf | Apparatus for cleaning measuring rolls |
| US4619708A (en) * | 1984-12-19 | 1986-10-28 | Eastman Kodak Company | Flexible sheet cleaning apparatus and method |
| FR2592956B1 (fr) * | 1986-01-13 | 1989-06-02 | Antoine Antoine | Dispositif de controle de l'etat de surface de materiaux. |
| US4776212A (en) * | 1987-06-19 | 1988-10-11 | Federal Products Corporation | Pocket surface roughness gage |
| DE8709466U1 (de) * | 1987-06-30 | 1987-11-19 | Ruth Domma Maschinenvertrieb, 7070 Schwäbisch Gmünd | Vorrichtung zum sicheren Erkennen von Graten an Teilen im Durchlaufverfahren |
| US4811594A (en) * | 1988-04-25 | 1989-03-14 | Battelle Memorial Institute | Topography sensor |
| US5266801A (en) * | 1989-06-05 | 1993-11-30 | Digital Instruments, Inc. | Jumping probe microscope |
| US5253516A (en) * | 1990-05-23 | 1993-10-19 | Digital Instruments, Inc. | Atomic force microscope for small samples having dual-mode operating capability |
| US5092163A (en) * | 1990-06-27 | 1992-03-03 | Young Russell D | Precision small scale force sensor |
| DE4031107A1 (de) * | 1990-10-02 | 1992-04-09 | Agfa Gevaert Ag | Verfahren zur herstellung von seitenrichtigen kopien von transparenten bildvorlagen |
| DE4035084A1 (de) * | 1990-11-05 | 1992-05-07 | Jenoptik Jena Gmbh | Anordnung zum messen linearer abmessungen auf einer strukturierten oberflaeche eines messobjektes |
| JPH05196458A (ja) * | 1991-01-04 | 1993-08-06 | Univ Leland Stanford Jr | 原子力顕微鏡用ピエゾ抵抗性片持ばり構造体 |
| US5204826A (en) * | 1991-02-01 | 1993-04-20 | General Electric Company | Quality assurance of surface treatments by analysis of substrate surface line traces |
| DE69208979T2 (de) * | 1991-07-15 | 1996-07-25 | Matsushita Electric Industrial Co., Ltd., Kadoma, Osaka | Freitragender Ausleger für Atomkraftmikroskop und Verfahren zu dessen Herstellung |
| USRE36488E (en) * | 1992-08-07 | 2000-01-11 | Veeco Instruments Inc. | Tapping atomic force microscope with phase or frequency detection |
| US5412980A (en) * | 1992-08-07 | 1995-05-09 | Digital Instruments, Inc. | Tapping atomic force microscope |
| CA2112792A1 (en) * | 1993-01-29 | 1994-07-30 | Donald F. Rogowski | Paper surface roughness analyzer |
| US5383354A (en) * | 1993-12-27 | 1995-01-24 | Motorola, Inc. | Process for measuring surface topography using atomic force microscopy |
| DE4437033C2 (de) * | 1994-10-17 | 1996-08-22 | Mahr Gmbh Goettingen | Vorschubgerät für die Oberflächenmessung nach dem Tastschnitt-Verfahren |
| EP1086273B1 (en) | 1998-01-20 | 2004-08-18 | Metso Paper, Inc. | Method and device for conditioning of a roll, in particular of a roll in a paper machine or in a paper finishing device |
| FR2810111B1 (fr) * | 2000-06-09 | 2004-04-02 | Univ Haute Alsace | Dispositif pour evaluer l'etat de surface d'un materiau et procede de mise en oeuvre dudit dispositif |
| DE10315218B4 (de) * | 2003-04-01 | 2010-12-30 | Nagel Maschinen- Und Werkzeugfabrik Gmbh | Verfahren und Vorrichtung zur Feinbearbeitung einer Oberfläche eines Werkstücks |
| DE102005035786B3 (de) * | 2005-07-27 | 2007-01-04 | Carl Mahr Holding Gmbh | Rauheitstaster |
| DE102006002616A1 (de) * | 2006-01-18 | 2007-07-26 | Sirona Dental Systems Gmbh | Verfahren und Vorrichtung zur Erkennung von dentalen Oberflächenstrukturen |
| CN101929835B (zh) * | 2009-06-22 | 2013-03-20 | 鸿富锦精密工业(深圳)有限公司 | 工件内孔表面粗糙度测量装置 |
| JP2012026736A (ja) * | 2010-07-20 | 2012-02-09 | Mitsutoyo Corp | 表面粗さ試験機のスキッド洗浄方法 |
| EP3228974B1 (de) | 2016-04-06 | 2022-06-01 | Klingelnberg AG | Rauheitsmesstaster, vorrichtung mit rauheitsmesstaster und entsprechende verwendung |
| GB202012104D0 (en) * | 2020-08-04 | 2020-09-16 | Renishaw Plc | Measurement method |
| CN112197681B (zh) * | 2020-09-29 | 2022-07-05 | 石家庄市东华特种型材厂 | 一种汽车零件用检测装置及系统 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2240278A (en) * | 1936-09-09 | 1941-04-29 | Physicists Res Company | Instrument for recording or measuring surface irregularities |
| US2405133A (en) * | 1942-10-07 | 1946-08-06 | Brush Dev Co | Method and means for measuring surface roughness |
| US2460726A (en) * | 1943-01-11 | 1949-02-01 | Brush Dev Co | Surface roughness measuring device |
| GB568800A (en) * | 1943-05-13 | 1945-04-20 | Kapella Ltd | Improvements in or relating to apparatus for measuring or indicating the roughnessesor undulations of a surface |
| US2991331A (en) * | 1956-02-28 | 1961-07-04 | Astatic Corp | Static electricity eliminator and conditioner for phonograph record discs |
-
1975
- 1975-08-12 DE DE19752535912 patent/DE2535912A1/de active Granted
-
1976
- 1976-08-05 IT IT26080/76A patent/IT1068041B/it active
- 1976-08-09 US US05/712,829 patent/US4106333A/en not_active Expired - Lifetime
- 1976-08-10 GB GB33227/76A patent/GB1540918A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3990128C2 (de) * | 1989-02-16 | 1994-10-13 | Bando Chemical Ind | Vorrichtung zum Prüfen einer Firstlinie elastischer Körper |
Also Published As
| Publication number | Publication date |
|---|---|
| IT1068041B (it) | 1985-03-21 |
| DE2535912A1 (de) | 1977-02-17 |
| DE2535912B2 (enExample) | 1979-04-19 |
| US4106333A (en) | 1978-08-15 |
| DE2535912C3 (enExample) | 1979-12-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed [section 19, patents act 1949] | ||
| PCNP | Patent ceased through non-payment of renewal fee |