GB1474049A - Arrangement for the modulation of light - Google Patents
Arrangement for the modulation of lightInfo
- Publication number
- GB1474049A GB1474049A GB5487974A GB5487974A GB1474049A GB 1474049 A GB1474049 A GB 1474049A GB 5487974 A GB5487974 A GB 5487974A GB 5487974 A GB5487974 A GB 5487974A GB 1474049 A GB1474049 A GB 1474049A
- Authority
- GB
- United Kingdom
- Prior art keywords
- grating
- light
- gratings
- rays
- diffracted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4233—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0808—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more diffracting elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4272—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path
- G02B27/4277—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path being separated by an air space
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/29—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the position or the direction of light beams, i.e. deflection
- G02F1/33—Acousto-optical deflection devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Nonlinear Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Optical Transform (AREA)
Abstract
1474049 Measuring displacement photoelectrically WETZLAR GmbH 19 Dec 1974 [12 Jan 1974 1 July 1974] 54879/74 Heading G1A Apparatus responsive to motion or displacement of an object for modulating light comprises: a plurality of diffracting means so disposed to act on light from a source that the light is subjected to at least three successive diffraction processes; the first process causing light to diverge from a point on the first diffracting means; the penultimate process causing the diffracted rays to converge towards the region of the last diffracting means; the last diffracting means directing the light components in the same direction and in the same phase. Divergent rays 10'(-2) and 10'(+2), Fig. 1 diffracted from a point on a first grating 11 strike a second grating 12, from which parts of the respective rays, diffracted as rays 10"(+4) and 10"(-4), recombine at a point on a third grating 13, whence components of the converging rays are further diffracted in at least one common (zero-order) direction. The ratio between the spacings n, m between adjacent gratings is a function of the relative grating constants of the first two gratings 11, 12. The blaze-angles of the gratings are chosen to favour the respective orders of the diffractions which they are intended to perform. By the use of an extended source 14 Fig la the light emerging from the grating 13 can be made to form an interference pattern in detectors a-d placed at the focal plane 17 of a lens 16, the detectors supplying phase-related signals indicative of the magnitude and sense of any displacement of the grating 12 in the plane of the diffracted rays and transverse to the optical axis. Four stages of diffraction may be provided by four gratings Fig. 2 (not shown), or by two gratings, one of which is arranged on the hypotenuse face of a reflex prism Fig. 3 (not shown). Three diffractions Fig. 4 (not shown) may be provided by a wheel having concentric inner transmissive and outer reflective gratings, in co-operation with reflex mirrors. Gratings of different spacings and correspondingly different grating constants may be effectively provided by a transmissive grating 11 Fig. 8 and a reflective grating 12 tilted relative to the grating 11 so that the return light path is of a different length from the outward path. A spaced-phase modulation pattern may be provided by causing convergent rays, Fig. 7 to strike the last grating 13 at two points, the recombined light due to different diffraction orders forming a pattern at an image plane 14. A displaceable diffracting element may comprise a grating, a standing or travelling acoustic wave, a light-scattering surface, or a beam-splitting polarizing device.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2401476A DE2401476A1 (en) | 1974-01-12 | 1974-01-12 | Light modulation system - has three successive diffracting elements at specified spacings |
DE2431551A DE2431551C2 (en) | 1974-07-01 | 1974-07-01 | Arrangement for measuring movements and speeds |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1474049A true GB1474049A (en) | 1977-05-18 |
Family
ID=25766457
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB5487974A Expired GB1474049A (en) | 1974-01-12 | 1974-12-19 | Arrangement for the modulation of light |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS5845687B2 (en) |
CH (1) | CH601799A5 (en) |
FR (1) | FR2257915B1 (en) |
GB (1) | GB1474049A (en) |
NL (1) | NL7500316A (en) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3210614A1 (en) * | 1981-03-24 | 1982-10-14 | Mitutoyo Mfg. Co., Ltd., Tokyo | PHOTOELECTRIC SHIFT MEASURING DEVICE |
JPS60260813A (en) * | 1984-05-31 | 1985-12-24 | ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング | Method and device for measuring displacement |
US4636076A (en) * | 1983-07-30 | 1987-01-13 | Dr. Johannes Heidenhain Gmbh | Displacement measuring apparatus and method |
GB2187282A (en) * | 1986-02-28 | 1987-09-03 | Canon Kk | Rotary encoder |
US4975571A (en) * | 1987-12-15 | 1990-12-04 | Renishaw Plc | Opto-electronic scale-reading apparatus |
GB2239088A (en) * | 1989-11-24 | 1991-06-19 | Ricoh Kk | Optical movement measurement |
US5214280A (en) * | 1991-04-18 | 1993-05-25 | Rsf-Elektronik Gesellschaft M.B.H. | Photoelectric position detector with offset phase grating scales |
US5264915A (en) * | 1990-10-20 | 1993-11-23 | Johannes Heidenhain Gmbh | Interferential measurement device for at least one direction of measurement |
US5486923A (en) * | 1992-05-05 | 1996-01-23 | Microe | Apparatus for detecting relative movement wherein a detecting means is positioned in the region of natural interference |
US5534693A (en) * | 1993-07-12 | 1996-07-09 | Canon Kabushiki Kaisha | Optical displacement detection apparatus employing diffraction gratings and a reference position sensor located on the scale |
US5559600A (en) * | 1992-05-05 | 1996-09-24 | Microe, Inc. | Apparatus for detecting relative movement |
US5621527A (en) * | 1993-09-29 | 1997-04-15 | Canon Kabushiki Kaisha | Apparatus for measuring relative displacement between the apparatus and a scale which a grating is formed |
US5861953A (en) * | 1994-12-10 | 1999-01-19 | Renishaw Plc | Opto-electronic scale reading apparatus with differing optical path lengths |
US6775008B2 (en) | 2000-02-23 | 2004-08-10 | Renishaw Plc | Opto-electronic scale reading apparatus |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4584484A (en) * | 1983-10-03 | 1986-04-22 | Hutchin Richard A | Microscope for producing high resolution images without precision optics |
DE3633574A1 (en) * | 1986-10-02 | 1988-04-14 | Heidenhain Gmbh Dr Johannes | LIGHT ELECTRIC ANGLE MEASURING DEVICE |
US5029154A (en) * | 1988-11-21 | 1991-07-02 | Ricoh Company, Ltd. | Optical reproducing apparatus |
CN110530283A (en) * | 2018-05-23 | 2019-12-03 | 宁波舜宇光电信息有限公司 | Project structured light device and its manufacturing method |
-
1974
- 1974-12-19 CH CH1694574A patent/CH601799A5/xx not_active IP Right Cessation
- 1974-12-19 GB GB5487974A patent/GB1474049A/en not_active Expired
-
1975
- 1975-01-08 JP JP451175A patent/JPS5845687B2/en not_active Expired
- 1975-01-10 FR FR7500778A patent/FR2257915B1/fr not_active Expired
- 1975-01-10 NL NL7500316A patent/NL7500316A/en unknown
Cited By (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3210614A1 (en) * | 1981-03-24 | 1982-10-14 | Mitutoyo Mfg. Co., Ltd., Tokyo | PHOTOELECTRIC SHIFT MEASURING DEVICE |
US4636076A (en) * | 1983-07-30 | 1987-01-13 | Dr. Johannes Heidenhain Gmbh | Displacement measuring apparatus and method |
JPS60260813A (en) * | 1984-05-31 | 1985-12-24 | ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング | Method and device for measuring displacement |
US4776701A (en) * | 1984-05-31 | 1988-10-11 | Dr. Johannes Heidenhain Gmbh | Displacement measuring apparatus and method |
JPH0697171B2 (en) | 1984-05-31 | 1994-11-30 | ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング | Displacement measuring device |
GB2187282A (en) * | 1986-02-28 | 1987-09-03 | Canon Kk | Rotary encoder |
GB2187282B (en) * | 1986-02-28 | 1991-01-02 | Canon Kk | Rotary encoder |
US5101102A (en) * | 1986-02-28 | 1992-03-31 | Canon Kabushiki Kaisha | Rotary encoder having a plurality of beams emitted by a diffraction grating |
US4975571A (en) * | 1987-12-15 | 1990-12-04 | Renishaw Plc | Opto-electronic scale-reading apparatus |
US5355220A (en) * | 1989-11-13 | 1994-10-11 | Ricoh Company, Ltd. | Optical movement measuring method and apparatus using interference fringes generated by overlapping spots of diffracted lights of different orders of diffraction from a line source |
GB2239088A (en) * | 1989-11-24 | 1991-06-19 | Ricoh Kk | Optical movement measurement |
GB2239088B (en) * | 1989-11-24 | 1994-05-25 | Ricoh Kk | Optical movement measuring method and apparatus |
US5264915A (en) * | 1990-10-20 | 1993-11-23 | Johannes Heidenhain Gmbh | Interferential measurement device for at least one direction of measurement |
US5214280A (en) * | 1991-04-18 | 1993-05-25 | Rsf-Elektronik Gesellschaft M.B.H. | Photoelectric position detector with offset phase grating scales |
US5486923A (en) * | 1992-05-05 | 1996-01-23 | Microe | Apparatus for detecting relative movement wherein a detecting means is positioned in the region of natural interference |
US5559600A (en) * | 1992-05-05 | 1996-09-24 | Microe, Inc. | Apparatus for detecting relative movement |
US5646730A (en) * | 1992-05-05 | 1997-07-08 | Microe, Inc. | Relative movement detecting apparatus using a detector positioned in a region of natural interference |
US5534693A (en) * | 1993-07-12 | 1996-07-09 | Canon Kabushiki Kaisha | Optical displacement detection apparatus employing diffraction gratings and a reference position sensor located on the scale |
US5621527A (en) * | 1993-09-29 | 1997-04-15 | Canon Kabushiki Kaisha | Apparatus for measuring relative displacement between the apparatus and a scale which a grating is formed |
US5861953A (en) * | 1994-12-10 | 1999-01-19 | Renishaw Plc | Opto-electronic scale reading apparatus with differing optical path lengths |
US6775008B2 (en) | 2000-02-23 | 2004-08-10 | Renishaw Plc | Opto-electronic scale reading apparatus |
Also Published As
Publication number | Publication date |
---|---|
FR2257915A1 (en) | 1975-08-08 |
CH601799A5 (en) | 1978-07-14 |
JPS5845687B2 (en) | 1983-10-12 |
FR2257915B1 (en) | 1979-07-20 |
NL7500316A (en) | 1975-07-15 |
JPS50104037A (en) | 1975-08-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PE20 | Patent expired after termination of 20 years |
Effective date: 19941218 |