GB1459932A - Corpuscular beam apparatus - Google Patents

Corpuscular beam apparatus

Info

Publication number
GB1459932A
GB1459932A GB642174A GB642174A GB1459932A GB 1459932 A GB1459932 A GB 1459932A GB 642174 A GB642174 A GB 642174A GB 642174 A GB642174 A GB 642174A GB 1459932 A GB1459932 A GB 1459932A
Authority
GB
United Kingdom
Prior art keywords
beam apparatus
bores
feb
balls
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB642174A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of GB1459932A publication Critical patent/GB1459932A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Beam Exposure (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Particle Accelerators (AREA)

Abstract

1459932 Electron or ion beam apparatus SIEMENS AG 12 Feb 1974 [27 Feb 1973] 06421/74 Heading H1D An adjustable mounting for an object or a diaphragm in an electron or ion beam apparatus, such as a microscope, comprises an object table 3 adjustable in a plane transverse to the beam direction by sliding over body 2 and external adjusting means 12 acting on an intermediate member 10 which rolls in a direction transverse to the beam direction on at least two balls 8 in bores 9 in the object table 3, the balls being slightly smaller by several microns than the bores so that there is a lost motion between member 10 and the table 3. Member 10 and table 3 are pushed downwards by springs 11, 7.
GB642174A 1973-02-27 1974-02-12 Corpuscular beam apparatus Expired GB1459932A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2310355A DE2310355C3 (en) 1973-02-27 1973-02-27 Adjustment device for particle beam devices, in particular electron microscopes

Publications (1)

Publication Number Publication Date
GB1459932A true GB1459932A (en) 1976-12-31

Family

ID=5873563

Family Applications (1)

Application Number Title Priority Date Filing Date
GB642174A Expired GB1459932A (en) 1973-02-27 1974-02-12 Corpuscular beam apparatus

Country Status (5)

Country Link
US (1) US3909611A (en)
JP (1) JPS502458A (en)
DE (1) DE2310355C3 (en)
GB (1) GB1459932A (en)
NL (1) NL7315331A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4774903A (en) * 1986-02-12 1988-10-04 The Marconi Company Limited Mooring tether

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55165628A (en) * 1979-06-12 1980-12-24 Fujitsu Ltd Apparatus for electron-beam irradiation
DE3128814A1 (en) * 1981-07-21 1983-02-10 Siemens AG, 1000 Berlin und 8000 München ELECTRICALLY CONDUCTIVE SAMPLE HOLDER FOR THE ANALYSIS TECHNOLOGY OF SECONDARY ION MASS SPECTROMETRY
US4996433A (en) * 1989-11-06 1991-02-26 Gatan, Inc. Specimen heating holder for electron microscopes
DE69128104T2 (en) * 1990-05-18 1998-04-09 Hitachi Ltd Electron microscope, sample actuator for an electron microscope and method for observing microscopic images
US5786601A (en) * 1994-06-28 1998-07-28 Leica Lithography Systems Ltd. Electron beam lithography machine
JP4429783B2 (en) * 2004-04-13 2010-03-10 日本電子株式会社 Aperture plate support mechanism and charged particle beam apparatus including the same

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1052542A (en) * 1964-01-21
US3628013A (en) * 1969-08-29 1971-12-14 Max Planck Gesellschaft Adjusting device for corpuscular-beam apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4774903A (en) * 1986-02-12 1988-10-04 The Marconi Company Limited Mooring tether

Also Published As

Publication number Publication date
DE2310355A1 (en) 1974-09-05
DE2310355B2 (en) 1975-04-03
JPS502458A (en) 1975-01-11
DE2310355C3 (en) 1975-11-13
US3909611A (en) 1975-09-30
NL7315331A (en) 1974-08-29

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee