GB1428813A - Polarization interferometer with beam polarizing and retarding mea ns - Google Patents
Polarization interferometer with beam polarizing and retarding mea nsInfo
- Publication number
- GB1428813A GB1428813A GB2296273A GB2296273A GB1428813A GB 1428813 A GB1428813 A GB 1428813A GB 2296273 A GB2296273 A GB 2296273A GB 2296273 A GB2296273 A GB 2296273A GB 1428813 A GB1428813 A GB 1428813A
- Authority
- GB
- United Kingdom
- Prior art keywords
- linear
- dichroism
- interferometer
- detector
- ellipticity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
- G01B9/02071—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by measuring path difference independently from interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02011—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal polarization variation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/19—Dichroism
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/15—Cat eye, i.e. reflection always parallel to incoming beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
1428813 Dichroism measurement VARIAN ASSOCIATES 15 May 1973 [15 May 1972] 22962/73 Heading G1A Circular or linear dichroism is measured using interferometric techniques. The apparatus comprises a broadband source 10 of visible light and/or ultraviolet radiation, or alternatively infrared radiation linear polarizer 26, stop 110 and collimator 11, feeding an interferometer. This is arranged to provide a beam whose ellipticity alternates between left and right circular polarization, becoming linear in one direction as the ellipticity alternates from left to right circular polarization, and linear in another - direction as the ellipticity alternates from right to left circular polarization, the characteristic frequency #a of such alternation varying as a function of wavelength: The output of the interferometer is passed via lens 16a through the sample under test, located at 12, and the transmitted radiation focused by lens 16 on to a detector 15. The detector output varies in intensity with the variation in ellipticity at frequency Na, and represents an interferogram function F(Na) which is processed by computer circuitry 18 to produce dichroism spectra. Interferometer details. In the arrangement of Fig. 1, the interferometer includes a beamsplitter 30, e.g. a thin metal film on a glass support, and reflection polarizers 35, 38. Reflector 38 is mounted on a movable carriage 36 driven by actuator 37. Alternatively, reflector 35 is mounted on movable carriage 36a. In the arrangement of Fig. 6 (not shown), the reflection polarizers comprise mirrors (140, 141) with transmission polarizers (142, 143), mounted at +45 degrees and -45 degrees to the incident beam linear polarization direction. In the arrangement of Fig. 7 (not shown), the reflection polarizers comprise retroreflectors, each comprising a pair of 90 degrees angled mirrors (146, 147) with linear transmission polarizers (150, 151). In the arrangement of Fig. 8 (not shown), the reflectors comprise mirrors (160, 161) and a beam retarding means, e.g. a quarter wave plate, is located in the path of at least one of the beams. In Fig. 9 (not shown) retroreflectors as in Fig. 7 are used, together with retarders, e.g. half wave plates, mounted between the mirrors of each retroreflector. Processing circuit. The detector may be a pyroelectric device. The output is amplified at 19, digitized at 20, recorded at 24 and fed to computer 23 for deriving the Fourier transmittance dichroism spectrum. This is divided, in computer component 23a, by the modulation function to derive the absorption spectrum at 90 for circular or linear dichroism, for display at 91. The modulation function is derived by sensing the position of carriage 36 using an interferometer comprising broadband source 81, beam-splitter 30 and detector 83, feeding computer component 23b, to define the zero position, and an interferometer comprising laser source 86, beam-splitter 30, and detector 88, to provide a fringe counting system for accurate position determination and for providing by means of 23b the demodulation cosine or sine function, used for determining linear or sine function, used for determining linear dichroism and circular dichroism, respectively.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US25330372A | 1972-05-15 | 1972-05-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1428813A true GB1428813A (en) | 1976-03-17 |
Family
ID=22959706
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB2296273A Expired GB1428813A (en) | 1972-05-15 | 1973-05-15 | Polarization interferometer with beam polarizing and retarding mea ns |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS4956645A (en) |
CA (1) | CA979638A (en) |
DE (1) | DE2324502A1 (en) |
FR (1) | FR2184829B1 (en) |
GB (1) | GB1428813A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2167554A (en) * | 1984-11-21 | 1986-05-29 | Sharp Kk | Optically sensing device |
CN113574362A (en) * | 2019-03-15 | 2021-10-29 | 日本分光株式会社 | Circular dichroism measuring device and circular dichroism measuring method |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1986006481A1 (en) * | 1985-04-24 | 1986-11-06 | Nauchno-Tekhnicheskoe Obiedinenie Akademii Nauk Ss | Interference polarization refractometer |
FR2685763B1 (en) * | 1991-12-27 | 1994-03-25 | Aime Vareille | OPTICAL METHOD AND DEVICE FOR DISTANCE MEASUREMENT AND THEIR APPLICATION TO THE RELATIVE POSITIONING OF WORKPIECES. |
WO2004079313A1 (en) * | 1993-11-17 | 2004-09-16 | Isao Tokumoto | Michelson interferometer |
-
1973
- 1973-05-14 CA CA171,282A patent/CA979638A/en not_active Expired
- 1973-05-15 DE DE19732324502 patent/DE2324502A1/en active Pending
- 1973-05-15 FR FR7317451A patent/FR2184829B1/fr not_active Expired
- 1973-05-15 JP JP5403873A patent/JPS4956645A/ja active Pending
- 1973-05-15 GB GB2296273A patent/GB1428813A/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2167554A (en) * | 1984-11-21 | 1986-05-29 | Sharp Kk | Optically sensing device |
CN113574362A (en) * | 2019-03-15 | 2021-10-29 | 日本分光株式会社 | Circular dichroism measuring device and circular dichroism measuring method |
EP3940368A4 (en) * | 2019-03-15 | 2022-12-14 | JASCO Corporation | Circular dichroism measurement device and circular dichroism measurement method |
US11879833B2 (en) | 2019-03-15 | 2024-01-23 | Jasco Corporation | Circular dichroism measurement device and circular dichroism measurement method |
Also Published As
Publication number | Publication date |
---|---|
CA979638A (en) | 1975-12-16 |
JPS4956645A (en) | 1974-06-01 |
FR2184829A1 (en) | 1973-12-28 |
DE2324502A1 (en) | 1973-11-29 |
FR2184829B1 (en) | 1974-05-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US2815452A (en) | Interferometer | |
US4746216A (en) | Angle measuring interferometer | |
US3824018A (en) | Coherent light source detector | |
US3847485A (en) | Optical noncontacting surface sensor for measuring distance and angle of a test surface | |
GB1409339A (en) | Interferometer system | |
US5157458A (en) | Polarization interferometer spectrometer | |
US4717250A (en) | Angle measuring interferometer | |
US3584959A (en) | Shaft position encoders | |
US4329055A (en) | Interferometer apparatus for measuring the wavelengths of optical radiation | |
GB1212946A (en) | Polarimeter | |
US4334778A (en) | Dual surface interferometer | |
US3708229A (en) | System for measuring optical path length across layers of small thickness | |
GB1428813A (en) | Polarization interferometer with beam polarizing and retarding mea ns | |
US4906095A (en) | Apparatus and method for performing two-frequency interferometry | |
US3471239A (en) | Interferometric apparatus | |
GB1392395A (en) | Stabilization of optical path length differences | |
JP3131242B2 (en) | Method of measuring incident angle of light beam, measuring device and method of using the device for distance measurement | |
US3984153A (en) | Apparatus to transform a single laser beam into two parallel beams of adjustable spacing and intensity | |
GB1367886A (en) | Measuring apparatus | |
US3419331A (en) | Single and double beam interferometer means | |
EP0050144B1 (en) | Process for measuring motion- and surface characterizing physical parameters of a moving body | |
US3194109A (en) | Interferometric device for determining deviations from planar motion | |
GB1138225A (en) | Improvements in or relating to optical interferometers | |
GB1010277A (en) | Improvements in and relating to optical interforometers | |
JP2592254B2 (en) | Measuring device for displacement and displacement speed |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PLE | Entries relating assignments, transmissions, licences in the register of patents | ||
PCNP | Patent ceased through non-payment of renewal fee |