CA979638A - Polarization interferometer with beam polarizing and retarding means - Google Patents

Polarization interferometer with beam polarizing and retarding means

Info

Publication number
CA979638A
CA979638A CA171,282A CA171282A CA979638A CA 979638 A CA979638 A CA 979638A CA 171282 A CA171282 A CA 171282A CA 979638 A CA979638 A CA 979638A
Authority
CA
Canada
Prior art keywords
retarding means
polarization interferometer
beam polarizing
polarizing
interferometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA171,282A
Other versions
CA171282S (en
Inventor
Jack J. Duffield
Roland C. Hawes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Medical Systems Inc
Original Assignee
Varian Associates Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Associates Inc filed Critical Varian Associates Inc
Priority to CA227,395A priority Critical patent/CA981444A/en
Application granted granted Critical
Publication of CA979638A publication Critical patent/CA979638A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02071—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by measuring path difference independently from interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02011—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal polarization variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/19—Dichroism
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/15—Cat eye, i.e. reflection always parallel to incoming beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
CA171,282A 1972-05-15 1973-05-14 Polarization interferometer with beam polarizing and retarding means Expired CA979638A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA227,395A CA981444A (en) 1972-05-15 1975-05-21 Polarization interferometer with beam polarizing and retarding means

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US25330372A 1972-05-15 1972-05-15

Publications (1)

Publication Number Publication Date
CA979638A true CA979638A (en) 1975-12-16

Family

ID=22959706

Family Applications (1)

Application Number Title Priority Date Filing Date
CA171,282A Expired CA979638A (en) 1972-05-15 1973-05-14 Polarization interferometer with beam polarizing and retarding means

Country Status (5)

Country Link
JP (1) JPS4956645A (en)
CA (1) CA979638A (en)
DE (1) DE2324502A1 (en)
FR (1) FR2184829B1 (en)
GB (1) GB1428813A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61124834A (en) * 1984-11-21 1986-06-12 Sharp Corp Light applied sensor
ATE55646T1 (en) * 1985-04-24 1990-09-15 Nt Ob Akademii Nauk Sssr INTERFERENCE POLARIZATION REFRACTOMETER.
FR2685763B1 (en) * 1991-12-27 1994-03-25 Aime Vareille OPTICAL METHOD AND DEVICE FOR DISTANCE MEASUREMENT AND THEIR APPLICATION TO THE RELATIVE POSITIONING OF WORKPIECES.
US5867271A (en) * 1993-11-17 1999-02-02 Advantest Corporation Michelson interferometer including a non-polarizing beam splitter
JP6533632B1 (en) * 2019-03-15 2019-06-19 日本分光株式会社 Circular dichroism measuring apparatus and circular dichroism measuring method
CN118655091A (en) * 2024-08-21 2024-09-17 西北工业大学 High-sensitivity circular dichroism precise measurement device and method

Also Published As

Publication number Publication date
DE2324502A1 (en) 1973-11-29
GB1428813A (en) 1976-03-17
FR2184829A1 (en) 1973-12-28
JPS4956645A (en) 1974-06-01
FR2184829B1 (en) 1974-05-17

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