FI865223A0 - INTERFERENSPOLARISATIONS-REFRAKTOMETER. - Google Patents

INTERFERENSPOLARISATIONS-REFRAKTOMETER.

Info

Publication number
FI865223A0
FI865223A0 FI865223A FI865223A FI865223A0 FI 865223 A0 FI865223 A0 FI 865223A0 FI 865223 A FI865223 A FI 865223A FI 865223 A FI865223 A FI 865223A FI 865223 A0 FI865223 A0 FI 865223A0
Authority
FI
Finland
Prior art keywords
reflector
reflecting surface
light beams
polarized light
reflectors
Prior art date
Application number
FI865223A
Other languages
Finnish (fi)
Other versions
FI865223A (en
Inventor
Maxim Leonidovich Alexandrov
Arkady Petrovich Vlasov
Nikolai Nikolaevich Komarov
Vsevolod Viktorovich Shevkunov
Vladimir Abovich Gotlib
Boris Izrailevich Molochnikov
Valery Vladimirovich Sudiin
Original Assignee
Nt Ob Akademii Nauk Sssr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nt Ob Akademii Nauk Sssr filed Critical Nt Ob Akademii Nauk Sssr
Publication of FI865223A0 publication Critical patent/FI865223A0/en
Publication of FI865223A publication Critical patent/FI865223A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Paper (AREA)
  • Supply Devices, Intensifiers, Converters, And Telemotors (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)

Abstract

An interference polarization refractometer comprises a polarized emission source (1) and, located consecutively one after another along the emission path, a means for the light beam splitting into two orthogonally polarized light beams, a measuring cell (3), a reflector (4) with a plane reflecting surface, a half-wave plate (5), the second reflector (6) the reflecting surface of which is perpendicular to the reflecting surface of the first reflector, a means for space fusion of the light beams and a unit for measuring the path difference components of the elliptically polarized light. The reflectors (4 and 6) are rigidly interconnected whereas the means for splitting and the means for fusion of the orthogonally polarized light beams are constituted by a single plane-parallel crystal plate (2) the main cross-section of which is perpendicular to the reflecting surfaces of the both reflectors (4, 6).
FI865223A 1985-04-24 1986-12-19 INTERFERENSPOLARISATIONS-REFRAKTOMETER. FI865223A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/SU1985/000028 WO1986006481A1 (en) 1985-04-24 1985-04-24 Interference polarization refractometer

Publications (2)

Publication Number Publication Date
FI865223A0 true FI865223A0 (en) 1986-12-19
FI865223A FI865223A (en) 1986-12-19

Family

ID=21616903

Family Applications (1)

Application Number Title Priority Date Filing Date
FI865223A FI865223A (en) 1985-04-24 1986-12-19 INTERFERENSPOLARISATIONS-REFRAKTOMETER.

Country Status (6)

Country Link
EP (1) EP0223855B1 (en)
JP (1) JPS62502563A (en)
AT (1) ATE55646T1 (en)
DE (1) DE3579238D1 (en)
FI (1) FI865223A (en)
WO (1) WO1986006481A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2169347C1 (en) * 1999-11-29 2001-06-20 Геликонов Валентин Михайлович Optical interferometer
CN112747667B (en) * 2019-10-31 2022-03-18 上海微电子装备（集团）股份有限公司 Differential interferometer apparatus

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE935094C (en) * 1953-11-18 1955-11-10 Simon Gas indicators, in particular for use in mine shafts
CA979638A (en) * 1972-05-15 1975-12-16 Varian Associates Polarization interferometer with beam polarizing and retarding means
SU701243A1 (en) * 1977-06-13 1983-07-30 Ордена Трудового Красного Знамени Специальное Конструкторское Бюро Аналитического Приборостроения Ан Ссср Interferenge and polarization refractometer
SU1121606A1 (en) * 1980-12-15 1984-10-30 Научно-Техническое Объединение Ан Ссср Interference method of determination of difference of reactive indices and interference refractometer for application thereof (its versions)
SU1068782A1 (en) * 1982-04-26 1984-01-23 Московский Ордена Ленина И Ордена Октябрьской Революции Энергетический Институт Automatic interferention device for measuring atmosphere befraction index structural characteristic

Also Published As

Publication number Publication date
JPH0582902B2 (en) 1993-11-22
DE3579238D1 (en) 1990-09-20
EP0223855A4 (en) 1988-02-12
WO1986006481A1 (en) 1986-11-06
ATE55646T1 (en) 1990-09-15
JPS62502563A (en) 1987-10-01
EP0223855B1 (en) 1990-08-16
EP0223855A1 (en) 1987-06-03
FI865223A (en) 1986-12-19

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Legal Events

Date Code Title Description
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Owner name: NAUCHNO-TEKHNICHESKOE OBIEDINENIE