GB1427752A - Method and apparatus for measuring material thickness - Google Patents

Method and apparatus for measuring material thickness

Info

Publication number
GB1427752A
GB1427752A GB4319675A GB4319675A GB1427752A GB 1427752 A GB1427752 A GB 1427752A GB 4319675 A GB4319675 A GB 4319675A GB 4319675 A GB4319675 A GB 4319675A GB 1427752 A GB1427752 A GB 1427752A
Authority
GB
United Kingdom
Prior art keywords
material thickness
measuring material
feb
heading
deal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4319675A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Weston Instruments Inc
Original Assignee
Weston Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Weston Instruments Inc filed Critical Weston Instruments Inc
Publication of GB1427752A publication Critical patent/GB1427752A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
GB4319675A 1972-02-15 1973-02-15 Method and apparatus for measuring material thickness Expired GB1427752A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22645772A 1972-02-15 1972-02-15

Publications (1)

Publication Number Publication Date
GB1427752A true GB1427752A (en) 1976-03-10

Family

ID=22848979

Family Applications (2)

Application Number Title Priority Date Filing Date
GB4319675A Expired GB1427752A (en) 1972-02-15 1973-02-15 Method and apparatus for measuring material thickness
GB740373A Expired GB1427751A (en) 1972-02-15 1973-02-15 Non-contacting gauging methods and apparatus

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB740373A Expired GB1427751A (en) 1972-02-15 1973-02-15 Non-contacting gauging methods and apparatus

Country Status (5)

Country Link
JP (4) JPS6055763B2 (enrdf_load_stackoverflow)
CA (1) CA990417A (enrdf_load_stackoverflow)
DE (1) DE2307391A1 (enrdf_load_stackoverflow)
FR (1) FR2172254B1 (enrdf_load_stackoverflow)
GB (2) GB1427752A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3206832A1 (de) * 1982-02-23 1983-09-01 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Beruehrungsfrei messendes dickenmessgeraet

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4119846A (en) * 1977-02-03 1978-10-10 Sangamo Weston, Inc. Non-contacting gage apparatus and method
US4328697A (en) * 1979-05-23 1982-05-11 Lucas Industries Limited Transducer calibration device
GB2088045B (en) * 1980-10-28 1984-09-26 Coal Industry Patents Ltd Signal processing systems
JPS58150809A (ja) * 1982-02-25 1983-09-07 Toshiba Corp 非接触放射線厚み計及びその校正方法
RU2235974C1 (ru) * 2003-06-18 2004-09-10 Открытое акционерное общество "Новосибирский завод химконцентратов" Устройство для измерения толщины тепловыделяющих элементов
CN111016830B (zh) * 2019-10-24 2023-06-27 惠州市德赛西威汽车电子股份有限公司 一种电压脉冲防错处理系统及方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3180985A (en) * 1962-05-14 1965-04-27 Electronic Automation Systems Standardization of radiation-absorption type density gages
US3524063A (en) * 1967-10-12 1970-08-11 Bethlehem Steel Corp Multirange radiation thickness gauge

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3206832A1 (de) * 1982-02-23 1983-09-01 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Beruehrungsfrei messendes dickenmessgeraet

Also Published As

Publication number Publication date
FR2172254A1 (enrdf_load_stackoverflow) 1973-09-28
JPS53134469A (en) 1978-11-24
JPS48104569A (enrdf_load_stackoverflow) 1973-12-27
JPS5284766A (en) 1977-07-14
JPS6055764B2 (ja) 1985-12-06
GB1427751A (en) 1976-03-10
JPS61274211A (ja) 1986-12-04
DE2307391A1 (de) 1973-08-23
FR2172254B1 (enrdf_load_stackoverflow) 1976-04-09
JPS6055763B2 (ja) 1985-12-06
CA990417A (en) 1976-06-01

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLE Entries relating assignments, transmissions, licences in the register of patents
PCNP Patent ceased through non-payment of renewal fee