GB1409573A - Test probe assemblies - Google Patents

Test probe assemblies

Info

Publication number
GB1409573A
GB1409573A GB5618672A GB5618672A GB1409573A GB 1409573 A GB1409573 A GB 1409573A GB 5618672 A GB5618672 A GB 5618672A GB 5618672 A GB5618672 A GB 5618672A GB 1409573 A GB1409573 A GB 1409573A
Authority
GB
United Kingdom
Prior art keywords
probes
pads
dec
probe
body section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5618672A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB1409573A publication Critical patent/GB1409573A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB5618672A 1971-12-17 1972-12-06 Test probe assemblies Expired GB1409573A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US20923671A 1971-12-17 1971-12-17

Publications (1)

Publication Number Publication Date
GB1409573A true GB1409573A (en) 1975-10-08

Family

ID=22777924

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5618672A Expired GB1409573A (en) 1971-12-17 1972-12-06 Test probe assemblies

Country Status (7)

Country Link
US (1) US3781681A (enExample)
JP (1) JPS5138224B2 (enExample)
BR (1) BR7208873D0 (enExample)
CA (1) CA978259A (enExample)
DE (1) DE2257650C3 (enExample)
FR (1) FR2163456B1 (enExample)
GB (1) GB1409573A (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3939414A (en) * 1974-01-28 1976-02-17 Electroglas, Inc. Micro-circuit test apparatus
JPS5153478A (ja) * 1974-11-06 1976-05-11 Hitachi Ltd Koteipuroobukaado
US3963985A (en) * 1974-12-12 1976-06-15 International Business Machines Corporation Probe device having probe heads and method of adjusting distances between probe heads
DD132718A3 (de) * 1977-03-21 1978-10-25 Werner Seewald Nadeltraeger zum pruefen von halbleiterchips
JPS5883151U (ja) * 1981-11-30 1983-06-06 日本電気ホームエレクトロニクス株式会社 ウエハ−ブロ−バ−
DE3620947A1 (de) * 1986-06-23 1988-01-07 Feinmetall Gmbh Kontaktelement fuer pruefkarten
US6037789A (en) * 1989-09-27 2000-03-14 Motorola, Inc. Wiping contacts
US5066907A (en) * 1990-02-06 1991-11-19 Cerprobe Corporation Probe system for device and circuit testing
US5378971A (en) * 1990-11-30 1995-01-03 Tokyo Electron Limited Probe and a method of manufacturing the same
JP2873414B2 (ja) * 1990-11-30 1999-03-24 東京エレクトロン株式会社 半導体ウエハ検査装置
US5357192A (en) * 1993-02-01 1994-10-18 Motorola, Inc. Method of contacting a semiconductor die with probes
US5751157A (en) * 1996-07-22 1998-05-12 Probe Technology Method and apparatus for aligning probes
US6441315B1 (en) * 1998-11-10 2002-08-27 Formfactor, Inc. Contact structures with blades having a wiping motion
US6392424B1 (en) * 1999-08-12 2002-05-21 Advanced Semiconductor Engineering Inc. Press plate of wire bond checking system
CA2537850C (en) 2003-09-05 2008-02-26 Brunswick Bowling & Billiards Corporation Apparatus and method for conditioning a bowling lane using precision delivery injectors
DE102006056543A1 (de) * 2006-11-29 2008-06-19 Suss Microtec Test Systems Gmbh Sondenhalter für eine Sonde zur Prüfung von Halbleiterbauelementen
US9244099B2 (en) 2011-05-09 2016-01-26 Cascade Microtech, Inc. Probe head assemblies, components thereof, test systems including the same, and methods of operating the same
CN103543298B (zh) * 2012-07-13 2016-03-23 旺矽科技股份有限公司 探针固持结构及其光学检测装置
US12306243B2 (en) 2023-06-12 2025-05-20 Formfactor, Inc. Space transformers configured to be utilized in a probe system, probe systems that include the space transformers, and related methods
CN120522493B (zh) * 2025-07-23 2025-09-23 快克智能装备股份有限公司 用于波峰焊的波峰失位检测装置及波峰失位检测方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3611128A (en) * 1968-07-26 1971-10-05 Hitachi Ltd Probe header for testing integrated circuits
US3584300A (en) * 1968-07-31 1971-06-08 Bendix Corp Platen-patch board assembly with spring biased electrical contact means to effect electrical test on an electrical circuit card
US3599093A (en) * 1969-04-28 1971-08-10 Rca Corp Apparatus including a wire tipped probe for testing semiconductor wafers
US3648169A (en) * 1969-05-26 1972-03-07 Teledyne Inc Probe and head assembly

Also Published As

Publication number Publication date
JPS5138224B2 (enExample) 1976-10-20
US3781681A (en) 1973-12-25
DE2257650A1 (de) 1973-06-20
DE2257650B2 (de) 1981-04-09
FR2163456A1 (enExample) 1973-07-27
BR7208873D0 (pt) 1974-01-03
FR2163456B1 (enExample) 1976-04-23
DE2257650C3 (de) 1981-12-17
CA978259A (en) 1975-11-18
JPS4873081A (enExample) 1973-10-02

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee