GB1407223A - Deflection circuits for cathode-ray tubes - Google Patents

Deflection circuits for cathode-ray tubes

Info

Publication number
GB1407223A
GB1407223A GB4057872A GB4057872A GB1407223A GB 1407223 A GB1407223 A GB 1407223A GB 4057872 A GB4057872 A GB 4057872A GB 4057872 A GB4057872 A GB 4057872A GB 1407223 A GB1407223 A GB 1407223A
Authority
GB
United Kingdom
Prior art keywords
segments
resistances
potential
electrode
focusing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4057872A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electronics UK Ltd
Original Assignee
Philips Electronic and Associated Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronic and Associated Industries Ltd filed Critical Philips Electronic and Associated Industries Ltd
Publication of GB1407223A publication Critical patent/GB1407223A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/16Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by deflecting electron beam in cathode-ray tube, e.g. scanning corrections
    • H04N3/26Modifications of scanning arrangements to improve focusing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/465Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement for simultaneous focalisation and deflection of ray or beam
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/16Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by deflecting electron beam in cathode-ray tube, e.g. scanning corrections
    • H04N3/24Blanking circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Details Of Television Scanning (AREA)
  • Video Image Reproduction Devices For Color Tv Systems (AREA)
  • Vessels, Lead-In Wires, Accessory Apparatuses For Cathode-Ray Tubes (AREA)

Abstract

1407223 Electron beam electrostatic focusing and deflecting systems PHILIPS ELECTROMC & ASSOCIATED INDUSTRIES Ltd 1 Sept 1972 [4 Sept 1971] 40578/72 Heading H1D [Also in Division H4] A combined focusing and deflecting system comprises an electrode divided into segments (such as S1-S8, Fig. 2) which are connected in a bridge circuit to two deflection signal generators and to a source of focusing potential; the electrode may be arranged between two cylindrical electrodes to form a lens in an image pick-up tube (Fig. 1, not shown). In the arrangement shown in Fig. 2 the horizontal and vertical deflection generators G H and G V supply voltages ŒU H #2 and #Uv#2 to opposite points of the bridge; resistances R1-R8 are equal whilst the ratio of R9 to R10 (and similar pairs) is such that the potential on S1 is U V which has a maximum value of 25 volts. Thus the potentials on the segments are as shown and correspond to the function U V cos #+U H sin # where is the mean angle of the segment with respect to the vertical axis. A focussing potential U F of 100 volts is supplied to the centre of the bridge. In a modification (Fig. 3, not shown), the focusing potential V F is connected to a potentiometer connected between point P5 (the junction of R10 and R11) and point P6 (the junction of R14 and R15), these points being connected through respective resistances to a common resistance leading to earth; this produces an adjustable quadrupole field between the four odd segments which can correct for astigmatism. By connecting the four even segments in a similar way to the focusing potential source the axes of the quadrupole field may be altered; the four resistances then provided to connect the even segments may be made less than resistances R10, R11, R14 and R15 in order to correct for pincushion distortion or greater in order to correct for barrel distortion. To provide for vertical shift a D.C. component may be added to the A.C. supplied across points P1 and P3, and a similar arrangement may be provided for horizontal shift. If the supply to the electrode segments is made via a cable having appreciable capacitance, resistances R2, R3 and R13 and the corresponding resistances near P4 should be shunted by capacitors; this would be unnecessary if the bridge were formed of a printed circuit near or on the tube envelope, either inside or outside. In a modification, Fig. 4 (not shown), the electrode comprises only six segments, segments S3 and S7 being omitted and the potential on S2 being and the electrode might even be reduced to four segments disposed between the deflection axes.
GB4057872A 1971-09-04 1972-09-01 Deflection circuits for cathode-ray tubes Expired GB1407223A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7112210A NL7112210A (en) 1971-09-04 1971-09-04

Publications (1)

Publication Number Publication Date
GB1407223A true GB1407223A (en) 1975-09-24

Family

ID=19813955

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4057872A Expired GB1407223A (en) 1971-09-04 1972-09-01 Deflection circuits for cathode-ray tubes

Country Status (7)

Country Link
US (1) US3794876A (en)
JP (1) JPS5520431B2 (en)
CA (1) CA983160A (en)
DE (1) DE2243217C3 (en)
FR (1) FR2151122B1 (en)
GB (1) GB1407223A (en)
NL (1) NL7112210A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0152502B1 (en) * 1984-02-18 1989-05-17 Leybold Aktiengesellschaft Device for the examination of crystal surfaces according to the leed-technique

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4142132A (en) * 1977-07-05 1979-02-27 Control Data Corporation Method and means for dynamic correction of electrostatic deflector for electron beam tube
US4556823A (en) * 1983-07-28 1985-12-03 International Business Machines Corporation Multi-function charged particle apparatus
JPS6269445A (en) * 1985-09-20 1987-03-30 Hitachi Ltd Cathode-ray tube

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2911563A (en) * 1957-04-24 1959-11-03 Westinghouse Electric Corp Electrostatic lens and deflection system
FR1368473A (en) * 1963-09-03 1964-07-31 Philips Nv Cathode ray tubes
GB1258213A (en) * 1969-03-17 1971-12-22

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0152502B1 (en) * 1984-02-18 1989-05-17 Leybold Aktiengesellschaft Device for the examination of crystal surfaces according to the leed-technique

Also Published As

Publication number Publication date
CA983160A (en) 1976-02-03
FR2151122A1 (en) 1973-04-13
JPS5520431B2 (en) 1980-06-02
FR2151122B1 (en) 1977-12-23
DE2243217A1 (en) 1973-03-08
US3794876A (en) 1974-02-26
NL7112210A (en) 1973-03-06
DE2243217C3 (en) 1979-10-25
DE2243217B2 (en) 1979-03-08
JPS4837017A (en) 1973-05-31

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee