GB1341366A - Self-cleaning aperture tube for coulter study apparatus - Google Patents

Self-cleaning aperture tube for coulter study apparatus

Info

Publication number
GB1341366A
GB1341366A GB1473572A GB1473572A GB1341366A GB 1341366 A GB1341366 A GB 1341366A GB 1473572 A GB1473572 A GB 1473572A GB 1473572 A GB1473572 A GB 1473572A GB 1341366 A GB1341366 A GB 1341366A
Authority
GB
United Kingdom
Prior art keywords
chamber
coulter
orifice
aperture
self
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1473572A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coulter Electronics Ltd
Coulter Electronics Inc
Original Assignee
Coulter Electronics Ltd
Coulter Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coulter Electronics Ltd, Coulter Electronics Inc filed Critical Coulter Electronics Ltd
Publication of GB1341366A publication Critical patent/GB1341366A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/13—Details pertaining to apertures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
GB1473572A 1971-04-07 1972-03-29 Self-cleaning aperture tube for coulter study apparatus Expired GB1341366A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US13192371A 1971-04-07 1971-04-07

Publications (1)

Publication Number Publication Date
GB1341366A true GB1341366A (en) 1973-12-19

Family

ID=22451620

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1473572A Expired GB1341366A (en) 1971-04-07 1972-03-29 Self-cleaning aperture tube for coulter study apparatus

Country Status (9)

Country Link
US (1) US3746976A (enExample)
JP (1) JPS5326518B1 (enExample)
CA (2) CA941450A (enExample)
CH (1) CH552804A (enExample)
DE (1) DE2215486C3 (enExample)
FR (1) FR2132670B1 (enExample)
GB (1) GB1341366A (enExample)
NL (1) NL165844C (enExample)
SE (1) SE380350B (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3902115A (en) * 1973-09-26 1975-08-26 Coulter Electronics Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor
US4001678A (en) * 1974-05-16 1977-01-04 Berg Robert H Displacement metering with independent ancillary flow
US3930736A (en) * 1974-07-01 1976-01-06 Coulter Electronics, Inc. Aperture tube with attached thief
US4014611A (en) * 1975-04-30 1977-03-29 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
SE7801123L (sv) * 1977-02-15 1978-08-16 Coulter Electronics Elektronisk partikelavkenningsoppningsmodul med perforerade elektroder
US4090128A (en) * 1977-02-15 1978-05-16 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4237416A (en) * 1977-03-22 1980-12-02 Becton Dickinson And Company Apparatus for counting and sizing particles suspended in a liquid electrolyte
US4180091A (en) * 1977-11-18 1979-12-25 Becton, Dickinson And Company Purging means for aperture of blood cell counter
US4361803A (en) * 1980-08-26 1982-11-30 Coulter Electronics, Inc. Apparatus for recirculating sweep flow electrolyte without a pump
DE3233055C2 (de) * 1982-09-06 1994-07-28 Coulter Electronics Durchflußvorrichtung zur Untersuchung einzelner, in einer Flüssigkeit suspendierter Teilchen
US4503385A (en) * 1983-07-11 1985-03-05 Becton, Dickinson And Company Apparatus and method for regulating sheath fluid flow in a hydrodynamically focused fluid flow system
US4710021A (en) * 1983-10-14 1987-12-01 Sequoia-Turner Corporation Particulate matter analyzing apparatus and method
JPS61124850A (ja) * 1984-11-21 1986-06-12 Eruma Kogaku Kk 超純水の不純物測定装置
US5094818A (en) * 1989-05-04 1992-03-10 Exact Science, Inc. Self-filling anti-siphon flow system for particle analysis
US5402062A (en) * 1993-12-23 1995-03-28 Abbott Laboratories Mechanical capture of count wafer for particle analysis
US5432992A (en) * 1993-12-23 1995-07-18 Abbott Laboratories Method of making count probe with removable count wafer
WO1995017659A1 (en) * 1993-12-23 1995-06-29 Abbott Laboratories Method of making a stress relieved count probe
GB9405028D0 (en) * 1994-03-15 1994-04-27 Counting Tech Ltd Fluid diluter
US5895869A (en) * 1995-11-17 1999-04-20 Mwi, Inc. Method and apparatus for analyzing particulate matter
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
US6111398A (en) * 1997-07-03 2000-08-29 Coulter International Corp. Method and apparatus for sensing and characterizing particles

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3299354A (en) * 1962-07-05 1967-01-17 Coulter Electronics Aperture tube structure for particle study apparatus
US3583209A (en) * 1969-02-27 1971-06-08 Automation Prod Method of and apparatus for measuring mass of a material

Also Published As

Publication number Publication date
CA941450A (en) 1974-02-05
NL165844B (nl) 1980-12-15
NL7204208A (enExample) 1972-10-10
DE2215486C3 (de) 1980-09-18
FR2132670A1 (enExample) 1972-11-24
CH552804A (fr) 1974-08-15
CA1042511B (en) 1978-11-14
DE2215486A1 (de) 1972-10-12
US3746976A (en) 1973-07-17
JPS5326518B1 (enExample) 1978-08-02
NL165844C (nl) 1981-05-15
SE380350B (sv) 1975-11-03
FR2132670B1 (enExample) 1973-06-29
DE2215486B2 (de) 1980-01-24

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee
PCNP Patent ceased through non-payment of renewal fee