GB1305593A - - Google Patents

Info

Publication number
GB1305593A
GB1305593A GB2877870A GB2877870A GB1305593A GB 1305593 A GB1305593 A GB 1305593A GB 2877870 A GB2877870 A GB 2877870A GB 2877870 A GB2877870 A GB 2877870A GB 1305593 A GB1305593 A GB 1305593A
Authority
GB
United Kingdom
Prior art keywords
chips
wafer
semi
base
conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2877870A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1305593A publication Critical patent/GB1305593A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0611—Sorting devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/936—Plural items tested as group

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB2877870A 1969-06-30 1970-06-15 Expired GB1305593A (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US83759569A 1969-06-30 1969-06-30

Publications (1)

Publication Number Publication Date
GB1305593A true GB1305593A (https=) 1973-02-07

Family

ID=25274909

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2877870A Expired GB1305593A (https=) 1969-06-30 1970-06-15

Country Status (5)

Country Link
US (1) US3584741A (https=)
JP (1) JPS4827501B1 (https=)
DE (1) DE2028910C3 (https=)
FR (1) FR2052380A5 (https=)
GB (1) GB1305593A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109454023A (zh) * 2018-12-21 2019-03-12 义乌臻格科技有限公司 一种用于拾取微型芯片的吸嘴装置及分选装置

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS539508B2 (https=) * 1971-06-25 1978-04-06
US3811182A (en) * 1972-03-31 1974-05-21 Ibm Object handling fixture, system, and process
US3915784A (en) * 1972-04-26 1975-10-28 Ibm Method of semiconductor chip separation
US3762426A (en) * 1972-04-26 1973-10-02 Ibm Semiconductor chip separation apparatus
US3847284A (en) * 1973-05-11 1974-11-12 Teledyne Inc Magnetic tape die sorting system
US3915850A (en) * 1973-11-14 1975-10-28 Gti Corp Component handler and method and apparatus utilizing same
US3894633A (en) * 1974-10-24 1975-07-15 Western Electric Co Method and apparatus for sorting articles
CA1044379A (en) * 1974-12-28 1978-12-12 Sony Corporation Wafer transfer device
US4406373A (en) * 1981-08-03 1983-09-27 Palomar Systems & Machines, Inc. Means and method for testing and sorting miniature electronic units
JPS59110758U (ja) * 1983-01-18 1984-07-26 大谷　均 ダブルタイヤの石取器
EP0468153B1 (de) * 1990-07-25 1995-10-11 atg test systems GmbH Kontaktierungsvorrichtung für Prüfzwecke
US6078188A (en) * 1995-09-04 2000-06-20 Advantest Corporation Semiconductor device transporting and handling apparatus
US6024526A (en) * 1995-10-20 2000-02-15 Aesop, Inc. Integrated prober, handler and tester for semiconductor components
US6246251B1 (en) * 1998-04-24 2001-06-12 International Rectifier Corp. Test process and apparatus for testing singulated semiconductor die
US6505665B1 (en) * 1998-09-17 2003-01-14 Intermedics, Inc. Method and apparatus for use in assembling electronic devices
US6222145B1 (en) 1998-10-29 2001-04-24 International Business Machines Corporation Mechanical strength die sorting
US6521853B1 (en) * 2000-05-08 2003-02-18 Micro Component Technology, Inc. Method and apparatus for sorting semiconductor devices
US6570374B1 (en) * 2000-06-23 2003-05-27 Honeywell International Inc. Vacuum chuck with integrated electrical testing points
US7851721B2 (en) * 2009-02-17 2010-12-14 Asm Assembly Automation Ltd Electronic device sorter comprising dual buffers
CN103708713A (zh) * 2013-12-26 2014-04-09 深圳市华星光电技术有限公司 夹持机构、液晶面板切割机以及液晶面板切割工艺
US10173246B1 (en) * 2018-05-30 2019-01-08 Nanotronics Imaging, Inc. Systems, apparatus, and methods for sorting components using illumination
CN113426682B (zh) * 2021-06-04 2023-06-30 江苏暖阳半导体科技有限公司 一种MiniLED的检测分选工艺

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1153008A (en) * 1965-09-18 1969-05-21 Telefunken Patent Method of and apparatus for Measuring and Sorting the Individual Elements in a Semiconductor Wafer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109454023A (zh) * 2018-12-21 2019-03-12 义乌臻格科技有限公司 一种用于拾取微型芯片的吸嘴装置及分选装置

Also Published As

Publication number Publication date
JPS4827501B1 (https=) 1973-08-23
DE2028910A1 (de) 1971-01-07
DE2028910B2 (de) 1979-01-11
FR2052380A5 (https=) 1971-04-09
DE2028910C3 (de) 1979-09-06
US3584741A (en) 1971-06-15

Similar Documents

Publication Publication Date Title
GB1305593A (https=)
GB1289837A (https=)
ATE238585T1 (de) Aufwandslose ausnahmebehandlung
GB1420863A (en) Apparatus for handling arrays of semi-conductor chips
NL141403B (nl) Transportinrichting voor testmonsterdragers.
BE576880A (fr) Dispositif de sustentation de surfaces portantes.
FR1225032A (fr) Dispositif semi-conducteur
GB1125229A (https=)
FR1238050A (fr) Dispositif semiconducteur
DK325076A (da) Holdeindretning til proveflasker i et analyseapparat
FR1224541A (fr) Perfectionnement au dispositif semi-conducteur
DE3788789D1 (de) Transportvorrichtung für elektrische gegenstände.
DK127143B (da) Fremgangsmåde til anbringelse af en elektrode på et halvlederelement.
CH485332A (de) Halbleitervorrichtung und Verfahren zu ihrem Betrieb
FR1240196A (fr) Procédé et dispositif de triage de minerais radio-actifs
GB1274267A (en) Methods of and apparatus for handling miniature articles
AT240623B (de) Einrichtung zum Entnehmen von Milchproben, insbesondere an Milchtank- oder Milchsammelwagen
JPS62238638A (ja) ダイ選別機の突き上げ装置
FR1168614A (fr) Dispositif d'entraînement de pièces à usiner sur machine automatique
ES278940A3 (es) Un aparato para determinar mediante ensayos la entereza de articulos huecos
WHITEHEAD The phase ionosonde(Development of phase ionosonde for sporadic E heights)
FR1222723A (fr) Procédé et dispositif de triage de cartes
GB1147923A (en) Improvements in apparatus for mounting articles on substrates
FR1211249A (fr) Dispositif pour porter ou placer des objets multiples de différentes formes et grandeurs, en laissant ou non des espaces libres entre certains objets
CH375307A (de) Einrichtung zum Einspannen von Werkstücken auf Bearbeitungsmaschinen

Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee