GB1303343A - - Google Patents

Info

Publication number
GB1303343A
GB1303343A GB2812670A GB2812670A GB1303343A GB 1303343 A GB1303343 A GB 1303343A GB 2812670 A GB2812670 A GB 2812670A GB 2812670 A GB2812670 A GB 2812670A GB 1303343 A GB1303343 A GB 1303343A
Authority
GB
United Kingdom
Prior art keywords
rays
june
mirror
detector
oscilloscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2812670A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1303343A publication Critical patent/GB1303343A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/072—Investigating materials by wave or particle radiation secondary emission combination of measurements, 2 kinds of secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/084—Investigating materials by wave or particle radiation secondary emission photo-electric effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/204—Sources of radiation source created from radiated target

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
GB2812670A 1969-06-12 1970-06-10 Expired GB1303343A (cg-RX-API-DMAC10.html)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US83256269A 1969-06-12 1969-06-12

Publications (1)

Publication Number Publication Date
GB1303343A true GB1303343A (cg-RX-API-DMAC10.html) 1973-01-17

Family

ID=25262023

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2812670A Expired GB1303343A (cg-RX-API-DMAC10.html) 1969-06-12 1970-06-10

Country Status (4)

Country Link
US (1) US3567928A (cg-RX-API-DMAC10.html)
CA (1) CA918217A (cg-RX-API-DMAC10.html)
DE (1) DE2029141A1 (cg-RX-API-DMAC10.html)
GB (1) GB1303343A (cg-RX-API-DMAC10.html)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3752989A (en) * 1972-01-27 1973-08-14 Us Commerce Method of producing an intense, high-purity k x-ray beam
GB1443048A (en) * 1972-12-05 1976-07-21 Strahlen Umweltforsch Gmbh X-ray source
US3963922A (en) * 1975-06-09 1976-06-15 Nuclear Semiconductor X-ray fluorescence device
US4172225A (en) * 1978-01-09 1979-10-23 Kevex Corporation Alpha particle x-ray energy analysis system
US4493097A (en) * 1982-08-30 1985-01-08 The Perkin-Elmer Corporation Electron gun assembly
US4868842A (en) * 1987-03-19 1989-09-19 Siemens Medical Systems, Inc. Cathode cup improvement
DE3716618A1 (de) * 1987-05-18 1988-12-08 Philips Patentverwaltung Strahlenquelle zur erzeugung einer im wesentlichen monochromatischen roentgenstrahlung
JPH0225737A (ja) * 1988-07-15 1990-01-29 Hitachi Ltd 表面分析方法および装置
DE4017002A1 (de) * 1990-05-26 1991-11-28 Philips Patentverwaltung Strahlenquelle fuer quasimonochromatische roentgenstrahlung
GB9222135D0 (en) * 1992-10-21 1992-12-02 Fisons Ltd Electron spectrometer
JP3525643B2 (ja) * 1996-09-30 2004-05-10 株式会社島津製作所 定性分析装置
JPH11288678A (ja) * 1998-02-10 1999-10-19 Siemens Ag 蛍光ｘ線源
DE102013209104A1 (de) 2013-05-16 2014-11-20 Carl Zeiss Microscopy Gmbh Vorrichtung und Verfahren zur spektroskopischen Analyse
CN112700740B (zh) * 2020-12-28 2022-12-30 青岛路桥建设集团有限公司 一种安全通道道路指引标识

Also Published As

Publication number Publication date
CA918217A (en) 1973-01-02
DE2029141A1 (de) 1970-12-23
US3567928A (en) 1971-03-02

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee