GB1248825A - Temperature-controlled orifice or slit for optical, ion-optical and electron-optical instruments - Google Patents
Temperature-controlled orifice or slit for optical, ion-optical and electron-optical instrumentsInfo
- Publication number
- GB1248825A GB1248825A GB40162/69A GB4016269A GB1248825A GB 1248825 A GB1248825 A GB 1248825A GB 40162/69 A GB40162/69 A GB 40162/69A GB 4016269 A GB4016269 A GB 4016269A GB 1248825 A GB1248825 A GB 1248825A
- Authority
- GB
- United Kingdom
- Prior art keywords
- plates
- slit
- optical
- support
- pair
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/02—Electrodes; Screens; Mounting, supporting, spacing or insulating thereof
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Devices For Use In Laboratory Experiments (AREA)
- Micromachines (AREA)
- Electrodes For Cathode-Ray Tubes (AREA)
- Electron Beam Exposure (AREA)
Abstract
1,248,825. Electron/ion beam tubes. H. WOLLNIK. 12 Aug., 1969 [14 Aug., 1968], No. 40162/69. Heading H1D. [Also in Division G2] A temperature-controlled orifice or slit for optical, ion-optical or electron-optical instruments comprises a plurality of plates having edges defining the orifice or slit mounted on a support having a temperature coefficient of expansion different from that of the plates. In a simple example the plates may be merely screwed to a supporting block having a hole for passage of a beam immediately beneath the centre of the slit. The block may be made of molybdenum and the plates of nickel, copper or aluminium. Both elements are heated from a common source and the combination of materials is chosen to give a required adjustment characteristic. The edges of the plates may overlap and be shaped so as to define a square or rectangular orifice. A number of plates may extend radially inwardly from a circular support and together define a square orifice at the centre after the manner of an adjustable iris. Fig. 6 shows plates 62, 63 defining a slit 65 above hole 69 in support 68. The plates are attached to the support by bimetallic flexural members 66, 67 which determine the width d of the slit. The movement of members 66, 67 may be limited by a pair of stops (118, 119, Fig. 11, not shown) which extend outwardly from the support 68. The slit plates themselves may be formed from a pair of flexural bimetallic laminae (Figs. 9, 10, not shown). In the arrangement of Fig. 3, a pair of plates 32, 33 defining a slit d are attached at A to a further pair 38, 39 of plates which are in turn attached at B to a third pair 36, 37 of plates, these being attached to an apertured support member 31 at C. The pairs of plates and the support are made of two materials which alternate throughout the structure, and which have relatively high and low expansion coefficients. The effect is to multiply the movement of the slit.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19681797091 DE1797091C (en) | 1968-08-14 | Panel with a control element that can be regulated by heat for optical, special ion-optical devices |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1248825A true GB1248825A (en) | 1971-10-06 |
Family
ID=5708510
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB40162/69A Expired GB1248825A (en) | 1968-08-14 | 1969-08-12 | Temperature-controlled orifice or slit for optical, ion-optical and electron-optical instruments |
Country Status (3)
Country | Link |
---|---|
US (1) | US3610734A (en) |
FR (1) | FR2022123A1 (en) |
GB (1) | GB1248825A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4212077A1 (en) * | 1992-04-10 | 1993-10-14 | Fraunhofer Ges Forschung | Piezoelectric valve and process for its manufacture |
DE10244850A1 (en) * | 2002-09-24 | 2004-04-01 | Carl Zeiss Jena Gmbh | Adjustable pinhole |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL8700496A (en) * | 1987-02-27 | 1988-09-16 | Stichting Tech Wetenschapp | CONTINUOUSLY VARIABLE MICRO Diaphragm. |
US4845371A (en) * | 1988-03-29 | 1989-07-04 | Siemens Medical Laboratories, Inc. | Apparatus for generating and transporting a charged particle beam |
DE10211492B4 (en) * | 2002-03-15 | 2008-05-15 | Siemens Ag | Lamella, lamellar collimator, device for beam limitation and irradiation device |
EP2498271B1 (en) * | 2003-10-20 | 2021-03-31 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Charged particle beam device with aperture |
EP1916694A1 (en) * | 2006-10-25 | 2008-04-30 | ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik Mbh | Adjustable aperture element for particle beam device, method of operating and manufacturing thereof |
DE102009028013B9 (en) * | 2009-07-24 | 2014-04-17 | Carl Zeiss Microscopy Gmbh | Particle beam device with a diaphragm unit and method for adjusting a jet stream in a particle beam device |
CN104409131B (en) * | 2014-11-24 | 2017-05-03 | 西北核技术研究所 | Adjustable-area freeform beam generation method and adjustable-area freeform gamma collimator |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1951018A (en) * | 1930-11-01 | 1934-03-13 | Wired Radio Inc | Magnetostrictive light valve |
US2059504A (en) * | 1932-12-06 | 1936-11-03 | Stewart C Whitman | Apparatus and method for recording sound on film |
US2852684A (en) * | 1955-12-22 | 1958-09-16 | Gen Electric | Adjustable slit mechanism |
US3242796A (en) * | 1962-04-09 | 1966-03-29 | Beckman Instruments Inc | Slit control apparatus |
US3447875A (en) * | 1965-06-21 | 1969-06-03 | American Optical Corp | Temperature compensating refractometers |
-
1969
- 1969-08-08 FR FR6927484A patent/FR2022123A1/fr not_active Withdrawn
- 1969-08-12 US US849310A patent/US3610734A/en not_active Expired - Lifetime
- 1969-08-12 GB GB40162/69A patent/GB1248825A/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4212077A1 (en) * | 1992-04-10 | 1993-10-14 | Fraunhofer Ges Forschung | Piezoelectric valve and process for its manufacture |
DE10244850A1 (en) * | 2002-09-24 | 2004-04-01 | Carl Zeiss Jena Gmbh | Adjustable pinhole |
US7324253B2 (en) | 2002-09-24 | 2008-01-29 | Carl Zeiss Jena Gmbh | Installable pinhole |
US7400433B2 (en) | 2002-09-24 | 2008-07-15 | Carl Zeiss Microimaging Gmbh | Installable pinhole |
Also Published As
Publication number | Publication date |
---|---|
US3610734A (en) | 1971-10-05 |
DE1797091B2 (en) | 1972-09-28 |
DE1797091A1 (en) | 1970-12-10 |
FR2022123A1 (en) | 1970-07-31 |
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