GB1247466A - Method for determining excess carrier lifetime in semiconductor devices - Google Patents

Method for determining excess carrier lifetime in semiconductor devices

Info

Publication number
GB1247466A
GB1247466A GB23704/70A GB2370470A GB1247466A GB 1247466 A GB1247466 A GB 1247466A GB 23704/70 A GB23704/70 A GB 23704/70A GB 2370470 A GB2370470 A GB 2370470A GB 1247466 A GB1247466 A GB 1247466A
Authority
GB
United Kingdom
Prior art keywords
carrier lifetime
excess carrier
semiconductor devices
contacts
determining excess
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB23704/70A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Westinghouse Electric Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of GB1247466A publication Critical patent/GB1247466A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
GB23704/70A 1969-05-28 1970-05-15 Method for determining excess carrier lifetime in semiconductor devices Expired GB1247466A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US82862169A 1969-05-28 1969-05-28

Publications (1)

Publication Number Publication Date
GB1247466A true GB1247466A (en) 1971-09-22

Family

ID=25252291

Family Applications (1)

Application Number Title Priority Date Filing Date
GB23704/70A Expired GB1247466A (en) 1969-05-28 1970-05-15 Method for determining excess carrier lifetime in semiconductor devices

Country Status (4)

Country Link
US (1) US3697873A (https=)
BE (1) BE750961A (https=)
FR (1) FR2048965A5 (https=)
GB (1) GB1247466A (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110702790A (zh) * 2019-11-11 2020-01-17 成都主导科技有限责任公司 一种用于远声程检测的超声波探头
CN110851947A (zh) * 2018-08-21 2020-02-28 通用电气航空系统有限责任公司 用于预测半导体疲劳的方法和系统

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4444351A (en) * 1981-11-16 1984-04-24 Electric Power Research Institute, Inc. Method of soldering metal oxide varistors
US4646009A (en) * 1982-05-18 1987-02-24 Ade Corporation Contacts for conductivity-type sensors
US4564807A (en) * 1984-03-27 1986-01-14 Ga Technologies Inc. Method of judging carrier lifetime in semiconductor devices
JP3696352B2 (ja) * 1996-12-17 2005-09-14 三菱電機株式会社 ライフタイム評価用ｔｅｇ
US6045026A (en) 1998-02-23 2000-04-04 Micron Technology, Inc. Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems
CN1388937A (zh) * 2000-06-29 2003-01-01 松下电器产业株式会社 物品的重复利用方法
US8912799B2 (en) * 2011-11-10 2014-12-16 Semiconductor Physics Laboratory Co., Ltd. Accurate measurement of excess carrier lifetime using carrier decay method
US20220219254A1 (en) * 2021-01-13 2022-07-14 Carlex Glass America, Llc Method of connection to a conductive material

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL133499C (https=) * 1960-05-18
US3366879A (en) * 1963-10-17 1968-01-30 Fujitsu Ltd Method for measuring the specific resistance of a silicon crystal by measuring the breakdown voltage
US3384283A (en) * 1964-10-16 1968-05-21 Axion Corp Vibratory wire bonding method and apparatus
US3459355A (en) * 1967-10-11 1969-08-05 Gen Motors Corp Ultrasonic welder for thin wires

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110851947A (zh) * 2018-08-21 2020-02-28 通用电气航空系统有限责任公司 用于预测半导体疲劳的方法和系统
CN110702790A (zh) * 2019-11-11 2020-01-17 成都主导科技有限责任公司 一种用于远声程检测的超声波探头

Also Published As

Publication number Publication date
US3697873A (en) 1972-10-10
BE750961A (fr) 1970-11-03
FR2048965A5 (https=) 1971-03-19

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