GB1237028A - Ion source - Google Patents
Ion sourceInfo
- Publication number
- GB1237028A GB1237028A GB21453/69A GB2145369A GB1237028A GB 1237028 A GB1237028 A GB 1237028A GB 21453/69 A GB21453/69 A GB 21453/69A GB 2145369 A GB2145369 A GB 2145369A GB 1237028 A GB1237028 A GB 1237028A
- Authority
- GB
- United Kingdom
- Prior art keywords
- ion
- chamber
- source
- wall
- aperture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
Abstract
1,237,028. Ion sources; ionization manometers. MULLARD Ltd. 9 April, 1970 [28 April, 1969], No. 21453/69. Heading H1D. An ion source comprising a chamber 1 having a wall portion 4 substantially impervious to ions except via an ion exit aperture 5 and other wall portions 2, 3 formed at least in part so that electrons can pass freely therethrough, a source of electrons 8, an ion extractor comprising a mesh 10, arranged close to said aperture 5, to which a negative potential is applied, and an ion accelerator electrode 12, is so arranged that the potential in an equipotential boundary region formed in the chamber 2, 3, 4 differs from the chamber wall potential by less than the ion extraction p.d. so that ions formed in the chamber are drawn into a central region at least until a positive ion space charge builds up, to enable a relatively large ion current to be drawn through said aperture 5 by the application of a relatively small ion extraction p.d. As shown, the wall 2 of the chamber is a helical wire mesh wound on supporting wires 15, and wall 3 is a woven wire mesh. A cylindrical metal reflector 6 surrounding the grid 2 has a wire mesh screen 7 at one end. A further screen 9 is located beyond the filament 8. The electrodes 1, 6, 8, 9, 11 and 12 which are supported by three glass rods 14 (two only being shown), may be made of any refractory conducting material, e.g. W, Mo, Ni, or stainless steel. Evacuation is by way of an outlet 21 and gas is introduced via an inlet 22 and an aperture 23 in reflector 6. A further mesh (30, Fig. 2, not shown) may be provided between meshes 10 and 13. In a further alternative embodiment (Fig. 6, not shown) two filaments are arranged on either side of the chamber 1. Both filaments are energized to out gas metal parts of the apparatus, but only one is used in operation of the ion source. This source is mounted on a flange ready for attachment to other apparatus, and is thus not enclosed. The source may be used in a mass spectrometer, for ion bombardment, or as an ionization gauge.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB21453/69A GB1237028A (en) | 1969-04-28 | 1969-04-28 | Ion source |
DE19702018507 DE2018507C3 (en) | 1969-04-28 | 1970-04-17 | Ion source |
US31147A US3619684A (en) | 1969-04-28 | 1970-04-23 | Ion source |
CH620170A CH505461A (en) | 1969-04-28 | 1970-04-24 | Ion source |
FR7015444A FR2040328A1 (en) | 1969-04-28 | 1970-04-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB21453/69A GB1237028A (en) | 1969-04-28 | 1969-04-28 | Ion source |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1237028A true GB1237028A (en) | 1971-06-30 |
Family
ID=10163206
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB21453/69A Expired GB1237028A (en) | 1969-04-28 | 1969-04-28 | Ion source |
Country Status (4)
Country | Link |
---|---|
US (1) | US3619684A (en) |
CH (1) | CH505461A (en) |
FR (1) | FR2040328A1 (en) |
GB (1) | GB1237028A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2289570A (en) * | 1994-05-17 | 1995-11-22 | Fisons Plc | Mass spectrometer and electron impact ion source therefor |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1437174A (en) * | 1972-05-26 | 1976-05-26 | Mullard Ltd | Ion gauges |
US3760225A (en) * | 1972-06-06 | 1973-09-18 | Atomic Energy Commission | High current plasma source |
US3930163A (en) * | 1974-03-22 | 1975-12-30 | Varian Associates | Ion beam apparatus with separately replaceable elements |
US4689574A (en) * | 1983-03-04 | 1987-08-25 | Uti Instrument Co. | Electron impact ion source for trace analysis |
US4579144A (en) * | 1983-03-04 | 1986-04-01 | Uti Instrument Company | Electron impact ion source for trace analysis |
JPS60202649A (en) * | 1984-03-26 | 1985-10-14 | Seiko Instr & Electronics Ltd | Ion source of double grid anode electron impact type |
US4755722A (en) * | 1984-04-02 | 1988-07-05 | Rpc Industries | Ion plasma electron gun |
US4742232A (en) * | 1987-03-03 | 1988-05-03 | United States Of America As Represented By The Adminstrator, National Aeronautics And Space Administration | Ion generator and ion application system |
GB8820359D0 (en) * | 1988-08-26 | 1988-09-28 | Atomic Energy Authority Uk | Charged particle grid |
US5302827A (en) * | 1993-05-11 | 1994-04-12 | Mks Instruments, Inc. | Quadrupole mass spectrometer |
US6300637B1 (en) * | 1998-10-16 | 2001-10-09 | Siemens Energy & Automation, Inc. | Increased ionization efficiency in a mass spectrometer using electron beam trajectory modification |
DE19949978A1 (en) * | 1999-10-08 | 2001-05-10 | Univ Dresden Tech | Electron impact ion source |
US8674321B2 (en) * | 2012-02-28 | 2014-03-18 | Tiza Lab, L.L.C. | Microplasma ion source for focused ion beam applications |
US8822912B2 (en) | 2012-12-19 | 2014-09-02 | Schlumberger Technology Corporation | Ion source having increased electron path length |
US8779351B2 (en) * | 2012-12-19 | 2014-07-15 | Schlumberger Technology Corporation | Ion source employing secondary electron generation |
US9799504B2 (en) * | 2015-12-11 | 2017-10-24 | Horiba Stec, Co., Ltd. | Ion source, quadrupole mass spectrometer and residual gas analyzing method |
CN109406689B (en) * | 2018-10-22 | 2023-05-12 | 南京国科精准医学科技有限公司 | Ion permeation gas molecular separation method and device |
CN112516797B (en) * | 2020-12-01 | 2022-09-16 | 中国科学院近代物理研究所 | Electrostatic focusing and accelerating system and method for isotope separation system |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB976664A (en) * | 1962-02-20 | 1964-12-02 | Atomic Energy Authority Uk | Improvements in or relating to ion sources |
-
1969
- 1969-04-28 GB GB21453/69A patent/GB1237028A/en not_active Expired
-
1970
- 1970-04-23 US US31147A patent/US3619684A/en not_active Expired - Lifetime
- 1970-04-24 CH CH620170A patent/CH505461A/en not_active IP Right Cessation
- 1970-04-28 FR FR7015444A patent/FR2040328A1/fr not_active Withdrawn
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2289570A (en) * | 1994-05-17 | 1995-11-22 | Fisons Plc | Mass spectrometer and electron impact ion source therefor |
US5561292A (en) * | 1994-05-17 | 1996-10-01 | Fisons Plc | Mass spectrometer and electron impact ion source thereof |
GB2289570B (en) * | 1994-05-17 | 1998-06-24 | Fisons Plc | Mass spectrometer and electron impact ion source therefor |
Also Published As
Publication number | Publication date |
---|---|
US3619684A (en) | 1971-11-09 |
CH505461A (en) | 1971-03-31 |
DE2018507A1 (en) | 1970-12-10 |
DE2018507B2 (en) | 1976-11-04 |
FR2040328A1 (en) | 1971-01-22 |
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