GB1215902A - Improvement in specimen-carrying devices for electron bombardment - Google Patents
Improvement in specimen-carrying devices for electron bombardmentInfo
- Publication number
- GB1215902A GB1215902A GB2588069A GB2588069A GB1215902A GB 1215902 A GB1215902 A GB 1215902A GB 2588069 A GB2588069 A GB 2588069A GB 2588069 A GB2588069 A GB 2588069A GB 1215902 A GB1215902 A GB 1215902A
- Authority
- GB
- United Kingdom
- Prior art keywords
- specimen
- electron bombardment
- improvement
- carrying devices
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2202—Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1,215,902. Electron beam apparatus. CENTRE NATIONAL DE RECHERCHES METALLURGIQUES. 21 May, 1969 [27 May, 1968], No. 25880/69. Heading H1D. A specimen holder for a specimen which is to be bombarded by electrons to yield X-rays for anlysis, is in the form of an apertured metal plate disposed between the specimen and the beam source and earthed to maintain a constant potential at the specimen; the plate also conducts away the heat generated in the specimen by electron bombardment. In one example the metal plate is 21 microns thick and has holes 250 microns in diameter occupying 60% of the area of the plate struck by the beam.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
LU56149 | 1968-05-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1215902A true GB1215902A (en) | 1970-12-16 |
Family
ID=19725611
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB2588069A Expired GB1215902A (en) | 1968-05-27 | 1969-05-21 | Improvement in specimen-carrying devices for electron bombardment |
Country Status (5)
Country | Link |
---|---|
BE (2) | BE732703A (en) |
FR (1) | FR2009364A1 (en) |
GB (1) | GB1215902A (en) |
LU (1) | LU56149A1 (en) |
NL (1) | NL6907989A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4992661A (en) * | 1987-08-20 | 1991-02-12 | Hitachi, Ltd. | Method and apparatus for neutralizing an accumulated charge on a specimen by means of a conductive lattice deposited on the specimen |
US5892237A (en) * | 1996-03-15 | 1999-04-06 | Fujitsu Limited | Charged particle beam exposure method and apparatus |
-
1968
- 1968-05-27 LU LU56149D patent/LU56149A1/xx unknown
-
1969
- 1969-05-07 BE BE732703D patent/BE732703A/xx unknown
- 1969-05-14 BE BE733121D patent/BE733121A/xx unknown
- 1969-05-21 GB GB2588069A patent/GB1215902A/en not_active Expired
- 1969-05-23 NL NL6907989A patent/NL6907989A/xx unknown
- 1969-05-27 FR FR6916021A patent/FR2009364A1/fr active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4992661A (en) * | 1987-08-20 | 1991-02-12 | Hitachi, Ltd. | Method and apparatus for neutralizing an accumulated charge on a specimen by means of a conductive lattice deposited on the specimen |
US5892237A (en) * | 1996-03-15 | 1999-04-06 | Fujitsu Limited | Charged particle beam exposure method and apparatus |
Also Published As
Publication number | Publication date |
---|---|
FR2009364A1 (en) | 1970-02-06 |
BE733121A (en) | 1969-11-14 |
NL6907989A (en) | 1969-12-01 |
LU56149A1 (en) | 1970-01-14 |
BE732703A (en) | 1969-11-07 |
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