GB1139434A - Improvements relating to x-ray diffraction equipment - Google Patents

Improvements relating to x-ray diffraction equipment

Info

Publication number
GB1139434A
GB1139434A GB29010/66A GB2901066A GB1139434A GB 1139434 A GB1139434 A GB 1139434A GB 29010/66 A GB29010/66 A GB 29010/66A GB 2901066 A GB2901066 A GB 2901066A GB 1139434 A GB1139434 A GB 1139434A
Authority
GB
United Kingdom
Prior art keywords
axis
sample
ray
transverse
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB29010/66A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Nuclear Medicine Inc
Original Assignee
Picker Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Picker Corp filed Critical Picker Corp
Publication of GB1139434A publication Critical patent/GB1139434A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB29010/66A 1965-06-28 1966-06-28 Improvements relating to x-ray diffraction equipment Expired GB1139434A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US467214A US3394255A (en) 1965-06-28 1965-06-28 Diffraction mechanism in which a monochromator diffracts the X-ray beam in planes transverse to an axis of specimen rotation

Publications (1)

Publication Number Publication Date
GB1139434A true GB1139434A (en) 1969-01-08

Family

ID=23854839

Family Applications (1)

Application Number Title Priority Date Filing Date
GB29010/66A Expired GB1139434A (en) 1965-06-28 1966-06-28 Improvements relating to x-ray diffraction equipment

Country Status (4)

Country Link
US (1) US3394255A (de)
DE (1) DE1598924B2 (de)
GB (1) GB1139434A (de)
NL (1) NL6604700A (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1772741A1 (de) * 1968-06-27 1971-06-03 Walter Prof Dr Hoppe Einrichtung fuer die Durchfuehrbarkeit von Roentgenfeinstrukturmessungen mit Diffraktometern mit offener Eulerwiege
US3714426A (en) * 1970-08-18 1973-01-30 Stoe & Cie Gmbh Method of x-ray analysis of crystal structure an x-ray goniometer for carrying out said method
DE2748501C3 (de) * 1977-10-28 1985-05-30 Born, Eberhard, Dr. Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen
NL1009012C2 (nl) * 1998-04-28 1999-10-29 Stichting Tech Wetenschapp Werkwijze voor het bepalen van celparameters van een kristalstructuur onder toepassing van diffractie.
JP3519292B2 (ja) * 1998-11-13 2004-04-12 理学電機株式会社 微小部ｘ線回折測定方法及び微小部ｘ線回折装置
JP6685078B2 (ja) * 2013-03-15 2020-04-22 プロト マニュファクチャリング リミテッド Ｘ線回折装置およびｘ線回折装置駆動方法
CN111508633B (zh) * 2020-06-02 2022-04-22 中国计量科学研究院 单能x射线辐射装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3105901A (en) * 1959-03-30 1963-10-01 Philips Corp X-ray diffraction device with 360 rotatable specimen holder
US3213278A (en) * 1962-04-13 1965-10-19 Philips Corp X-ray spectrograph having plural detectors
US3322948A (en) * 1964-12-21 1967-05-30 Owens Illinois Inc X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable

Also Published As

Publication number Publication date
US3394255A (en) 1968-07-23
NL6604700A (de) 1966-12-29
DE1598924A1 (de) 1970-09-03
DE1598924B2 (de) 1971-11-25

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