FR737716A - Dispositif pour obtenir des images d'objets - Google Patents

Dispositif pour obtenir des images d'objets

Info

Publication number
FR737716A
FR737716A FR737716DA FR737716A FR 737716 A FR737716 A FR 737716A FR 737716D A FR737716D A FR 737716DA FR 737716 A FR737716 A FR 737716A
Authority
FR
France
Prior art keywords
objects
obtaining images
images
obtaining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Schuckertwerke AG
Siemens AG
Original Assignee
Siemens Schuckertwerke AG
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=31983836&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=FR737716(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Siemens Schuckertwerke AG, Siemens AG filed Critical Siemens Schuckertwerke AG
Application granted granted Critical
Publication of FR737716A publication Critical patent/FR737716A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2004—Scintilloscopes
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F02—COMBUSTION ENGINES; HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
    • F02M—SUPPLYING COMBUSTION ENGINES IN GENERAL WITH COMBUSTIBLE MIXTURES OR CONSTITUENTS THEREOF
    • F02M27/00—Apparatus for treating combustion-air, fuel, or fuel-air mixture, by catalysts, electric means, magnetism, rays, sound waves, or the like
    • F02M27/08—Apparatus for treating combustion-air, fuel, or fuel-air mixture, by catalysts, electric means, magnetism, rays, sound waves, or the like by sonic or ultrasonic waves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/58—Arrangements for focusing or reflecting ray or beam
    • H01J29/62—Electrostatic lenses
    • H01J29/622—Electrostatic lenses producing fields exhibiting symmetry of revolution
    • H01J29/624—Electrostatic lenses producing fields exhibiting symmetry of revolution co-operating with or closely associated to an electron gun
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J33/00—Discharge tubes with provision for emergence of electrons or ions from the vessel; Lenard tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/22—Optical or photographic arrangements associated with the tube
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Beam Exposure (AREA)
FR737716D 1931-05-31 1932-05-27 Dispositif pour obtenir des images d'objets Expired FR737716A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES3885D DE906737C (de) 1931-05-31 1931-05-31 Anordnung zum vergroesserten Abbilden von Gegenstaenden mittels Elektronenstrahlen

Publications (1)

Publication Number Publication Date
FR737716A true FR737716A (fr) 1932-12-15

Family

ID=31983836

Family Applications (1)

Application Number Title Priority Date Filing Date
FR737716D Expired FR737716A (fr) 1931-05-31 1932-05-27 Dispositif pour obtenir des images d'objets

Country Status (4)

Country Link
US (1) US2058914A (fr)
DE (2) DE906737C (fr)
FR (1) FR737716A (fr)
NL (3) NL43263C (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE758245C (de) * 1937-12-08 1953-01-26 Siemens Reiniger Werke Ag Einrichtung zur Untersuchung der Kristallstruktur mit Kathodenstrahlen zur Aufnahme der Beugungsringe
DE884507C (de) * 1934-05-12 1953-07-27 Emi Ltd Speichernder Kathodenstrahlbildabtaster mit einer vom ein- oder zweiseitigen Mosaikschirm getrennt angeordneten zusammen-haengenden Photokathodenschicht

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE965522C (de) * 1931-07-04 1957-06-13 Leo Szilard Dr Mikroskop
DE958437C (de) * 1938-01-28 1957-02-21 Siemens Ag Verfahren zur vergroesserten Abbildung von Objekten auf elektronenoptischem und lichtoptischem Wege
US2420560A (en) * 1942-05-30 1947-05-13 Gen Electric Electron microscope
US2444710A (en) * 1942-09-26 1948-07-06 Rca Corp Correction for spherical and chromatic aberrations in electron lens
BE576003A (fr) * 1942-12-01
GB578273A (en) * 1943-03-03 1946-06-21 British Thomson Houston Co Ltd Improvements in electron optical systems
US2447260A (en) * 1945-06-21 1948-08-17 Research Corp Electron microspectroscope
US2547775A (en) * 1946-01-23 1951-04-03 Rca Corp Fluorescent color screen for electron optical systems
US2545595A (en) * 1947-05-26 1951-03-20 Luis W Alvarez Linear accelerator
US2760098A (en) * 1951-05-08 1956-08-21 Rca Corp Electrostatic focused gun for cathode ray tube
US2792515A (en) * 1951-06-22 1957-05-14 Thomas Electrics Inc Cathode ray tube
US2719243A (en) * 1951-07-03 1955-09-27 Du Mont Allen B Lab Inc Electrostatic electron lens
US2603550A (en) * 1951-07-12 1952-07-15 Philco Corp Method of aligning cathode-ray tube assemblies
US2658160A (en) * 1951-11-23 1953-11-03 Rauland Corp Image-reproducing device
US2744207A (en) * 1953-06-04 1956-05-01 Sessions Rollie Hazel Two-piece television picture tube
NL225735A (fr) * 1957-03-13
US3035199A (en) * 1957-11-29 1962-05-15 Gen Dynamics Corp Lens deflection in the electro optical system of a cathode ray tube
NL259047A (fr) * 1960-02-27
US3069592A (en) * 1960-03-10 1962-12-18 Ladislaus L Marton Electrostatic filter lens or mirror
US3659097A (en) * 1971-02-16 1972-04-25 Nat Res Dev Magnetic lenses
US5013915A (en) * 1988-05-20 1991-05-07 Hitachi, Ltd. Transmission type electron microscope
EP1200175A1 (fr) * 1999-07-02 2002-05-02 Ebara Corporation Procede et appareil d'irradiation a faisceaux d'electrons

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE884507C (de) * 1934-05-12 1953-07-27 Emi Ltd Speichernder Kathodenstrahlbildabtaster mit einer vom ein- oder zweiseitigen Mosaikschirm getrennt angeordneten zusammen-haengenden Photokathodenschicht
DE758245C (de) * 1937-12-08 1953-01-26 Siemens Reiniger Werke Ag Einrichtung zur Untersuchung der Kristallstruktur mit Kathodenstrahlen zur Aufnahme der Beugungsringe

Also Published As

Publication number Publication date
DE895635C (fr) 1953-11-05
NL43263C (fr) 1938-06-15
US2058914A (en) 1936-10-27
NL57032C (fr) 1946-03-15
DE906737C (de) 1954-03-18
NL49378C (fr) 1940-10-15

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