FR3113976B1 - Mémoire type mémoire morte électriquement programmable et effaçable - Google Patents

Mémoire type mémoire morte électriquement programmable et effaçable Download PDF

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Publication number
FR3113976B1
FR3113976B1 FR2009060A FR2009060A FR3113976B1 FR 3113976 B1 FR3113976 B1 FR 3113976B1 FR 2009060 A FR2009060 A FR 2009060A FR 2009060 A FR2009060 A FR 2009060A FR 3113976 B1 FR3113976 B1 FR 3113976B1
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France
Prior art keywords
memory
electrically programmable
erasable rom
type memory
source region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR2009060A
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English (en)
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FR3113976A1 (fr
Inventor
Laurent Murillo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Rousset SAS
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STMicroelectronics Rousset SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Rousset SAS filed Critical STMicroelectronics Rousset SAS
Priority to FR2009060A priority Critical patent/FR3113976B1/fr
Priority to US17/459,172 priority patent/US12125532B2/en
Priority to CN202111038221.4A priority patent/CN114155890A/zh
Publication of FR3113976A1 publication Critical patent/FR3113976A1/fr
Application granted granted Critical
Publication of FR3113976B1 publication Critical patent/FR3113976B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0433—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and one or more separate select transistors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/102—External programming circuits, e.g. EPROM programmers; In-circuit programming or reprogramming; EPROM emulators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/24—Bit-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/30—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region
    • H10B41/35—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region with a cell select transistor, e.g. NAND

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Non-Volatile Memory (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)

Abstract

Mémoire de type mémoire morte électriquement programmable et effaçable, et procédé d’écriture. La mémoire est formée dans et sur un substrat semi-conducteur (SUB) et comprend une pluralité de cellules-mémoires (CELL1 à CELL8) organisées dans un plan-mémoire(PM) arrangé matriciellement en rangées (RW0, RW1) et en colonnes (COL0, COL1, COL2, COL3) de cellules-mémoires (CELL1 à CELL8), chaque cellule-mémoire (CELL) comprenant un transistor d’état (TE) comprenant une région de source (TEs), une région de drain (TEd), une fenêtre d’injection (INJT) située du côté du drain (TEd), une grille de commande (CG) et une grille flottante (FG), et un transistor d’isolation (TI) ayant une région de source (TIs), une région de drain (TId) et une grille (CGI), la région de drain (TId) du transistor d'isolation (TI) et la région de source (TEs) du transistor d'état (TE) étant communes. Figure pour l’abrégé : Fig. 2
FR2009060A 2020-09-07 2020-09-07 Mémoire type mémoire morte électriquement programmable et effaçable Active FR3113976B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR2009060A FR3113976B1 (fr) 2020-09-07 2020-09-07 Mémoire type mémoire morte électriquement programmable et effaçable
US17/459,172 US12125532B2 (en) 2020-09-07 2021-08-27 Memory architecture for serial EEPROMs
CN202111038221.4A CN114155890A (zh) 2020-09-07 2021-09-06 用于串行eeprom的新的存储器架构

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2009060A FR3113976B1 (fr) 2020-09-07 2020-09-07 Mémoire type mémoire morte électriquement programmable et effaçable
FR2009060 2020-09-07

Publications (2)

Publication Number Publication Date
FR3113976A1 FR3113976A1 (fr) 2022-03-11
FR3113976B1 true FR3113976B1 (fr) 2023-07-28

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
FR2009060A Active FR3113976B1 (fr) 2020-09-07 2020-09-07 Mémoire type mémoire morte électriquement programmable et effaçable

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FR (1) FR3113976B1 (fr)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998010471A1 (fr) * 1996-09-05 1998-03-12 Macronix International Co., Ltd. Memoire a grille flottante a puits triple, son mode de fonctionnement, et ses procedes de programmation, preprogrammation et effacement de canaux isoles
FR2816751A1 (fr) * 2000-11-15 2002-05-17 St Microelectronics Sa Memoire flash effacable par page
US6850438B2 (en) * 2002-07-05 2005-02-01 Aplus Flash Technology, Inc. Combination nonvolatile memory using unified technology with byte, page and block write and simultaneous read and write operations
FR3029343B1 (fr) * 2014-11-27 2018-03-30 Stmicroelectronics (Rousset) Sas Dispositif compact de memoire de type electriquement effacable et programmable
US9361995B1 (en) * 2015-01-21 2016-06-07 Silicon Storage Technology, Inc. Flash memory system using complementary voltage supplies
FR3048115B1 (fr) * 2016-02-18 2018-07-13 Stmicroelectronics (Rousset) Sas Dispositif et procede de gestion du claquage de transistors d'acces de memoire eeprom.
FR3070537A1 (fr) * 2017-08-28 2019-03-01 Stmicroelectronics (Rousset) Sas Memoire non-volatile a encombrement restreint
FR3071355B1 (fr) 2017-09-20 2019-08-30 Stmicroelectronics (Rousset) Sas Cellule-memoire eeprom compacte
US10332599B2 (en) * 2017-11-14 2019-06-25 Longitude Flash Memory Solutions Ltd. Bias scheme for word programming in non-volatile memory and inhibit disturb reduction

Also Published As

Publication number Publication date
FR3113976A1 (fr) 2022-03-11
US20220076749A1 (en) 2022-03-10

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