FR3029343B1 - Dispositif compact de memoire de type electriquement effacable et programmable - Google Patents
Dispositif compact de memoire de type electriquement effacable et programmable Download PDFInfo
- Publication number
- FR3029343B1 FR3029343B1 FR1461549A FR1461549A FR3029343B1 FR 3029343 B1 FR3029343 B1 FR 3029343B1 FR 1461549 A FR1461549 A FR 1461549A FR 1461549 A FR1461549 A FR 1461549A FR 3029343 B1 FR3029343 B1 FR 3029343B1
- Authority
- FR
- France
- Prior art keywords
- memory device
- electrically erasable
- compact memory
- programmable type
- programmable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0433—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and one or more separate select transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/12—Programming voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
- H01L29/7881—Programmable transistors with only two possible levels of programmation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/10—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the top-view layout
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/40—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the peripheral circuit region
- H10B41/42—Simultaneous manufacture of periphery and memory cells
- H10B41/43—Simultaneous manufacture of periphery and memory cells comprising only one type of peripheral transistor
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1461549A FR3029343B1 (fr) | 2014-11-27 | 2014-11-27 | Dispositif compact de memoire de type electriquement effacable et programmable |
US14/864,354 US9583193B2 (en) | 2014-11-27 | 2015-09-24 | Compact memory device of the EEPROM type with a vertical select transistor |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1461549A FR3029343B1 (fr) | 2014-11-27 | 2014-11-27 | Dispositif compact de memoire de type electriquement effacable et programmable |
FR1461549 | 2014-11-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3029343A1 FR3029343A1 (fr) | 2016-06-03 |
FR3029343B1 true FR3029343B1 (fr) | 2018-03-30 |
Family
ID=52345453
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1461549A Expired - Fee Related FR3029343B1 (fr) | 2014-11-27 | 2014-11-27 | Dispositif compact de memoire de type electriquement effacable et programmable |
Country Status (2)
Country | Link |
---|---|
US (1) | US9583193B2 (fr) |
FR (1) | FR3029343B1 (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR3048115B1 (fr) * | 2016-02-18 | 2018-07-13 | Stmicroelectronics (Rousset) Sas | Dispositif et procede de gestion du claquage de transistors d'acces de memoire eeprom. |
FR3054723A1 (fr) | 2016-07-27 | 2018-02-02 | Stmicroelectronics (Rousset) Sas | Cellule-memoire eeprom compacte avec zone d'injection tunnel reduite |
CN108806751B (zh) * | 2017-04-26 | 2021-04-09 | 中芯国际集成电路制造(上海)有限公司 | 多次可程式闪存单元阵列及其操作方法、存储器件 |
FR3069954B1 (fr) * | 2017-08-01 | 2020-02-07 | Stmicroelectronics (Rousset) Sas | Procede de detection d'un amincissement du substrat d'un circuit integre par sa face arriere, et circuit integre associe |
FR3070537A1 (fr) * | 2017-08-28 | 2019-03-01 | Stmicroelectronics (Rousset) Sas | Memoire non-volatile a encombrement restreint |
FR3071355B1 (fr) | 2017-09-20 | 2019-08-30 | Stmicroelectronics (Rousset) Sas | Cellule-memoire eeprom compacte |
FR3074605B1 (fr) | 2017-12-05 | 2020-01-17 | Stmicroelectronics (Rousset) Sas | Procede de detection d'un amincissement eventuel d'un substrat d'un circuit integre par sa face arriere, et dispositif associe |
US10679699B2 (en) | 2018-07-30 | 2020-06-09 | Stmicroelectronics (Rousset) Sas | Non-volatile memory with double capa implant |
FR3095526B1 (fr) | 2019-04-25 | 2022-04-22 | St Microelectronics Rousset | Procédé d’écriture dans une mémoire EEPROM et circuit intégré correspondant |
FR3113976B1 (fr) * | 2020-09-07 | 2023-07-28 | St Microelectronics Rousset | Mémoire type mémoire morte électriquement programmable et effaçable |
CN114037364B (zh) * | 2022-01-07 | 2022-07-12 | 深圳江行联加智能科技有限公司 | 基于人工智能的虚拟电厂运行风险检测方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5471422A (en) * | 1994-04-11 | 1995-11-28 | Motorola, Inc. | EEPROM cell with isolation transistor and methods for making and operating the same |
US6307781B1 (en) * | 1999-09-30 | 2001-10-23 | Infineon Technologies Aktiengesellschaft | Two transistor flash memory cell |
DE10207300B4 (de) * | 2002-02-21 | 2004-01-29 | Infineon Technologies Ag | Integrierter Festwertspeicher, Verfahren zum Betreiben eines solchen Festwertspeichers sowie Herstellungsverfahren |
JP4619190B2 (ja) * | 2005-04-28 | 2011-01-26 | ルネサスエレクトロニクス株式会社 | プログラム可能な不揮発性メモリ |
US7471570B2 (en) * | 2005-09-19 | 2008-12-30 | Texas Instruments Incorporated | Embedded EEPROM array techniques for higher density |
US8923049B2 (en) * | 2011-09-09 | 2014-12-30 | Aplus Flash Technology, Inc | 1T1b and 2T2b flash-based, data-oriented EEPROM design |
FR2987696B1 (fr) * | 2012-03-05 | 2014-11-21 | St Microelectronics Rousset | Procede de lecture ecriture de cellules memoire non volatiles |
FR3029000B1 (fr) | 2014-11-24 | 2017-12-22 | Stmicroelectronics Rousset | Dispositif de memoire non volatile compact |
-
2014
- 2014-11-27 FR FR1461549A patent/FR3029343B1/fr not_active Expired - Fee Related
-
2015
- 2015-09-24 US US14/864,354 patent/US9583193B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US9583193B2 (en) | 2017-02-28 |
FR3029343A1 (fr) | 2016-06-03 |
US20160155506A1 (en) | 2016-06-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PLFP | Fee payment |
Year of fee payment: 2 |
|
PLSC | Publication of the preliminary search report |
Effective date: 20160603 |
|
PLFP | Fee payment |
Year of fee payment: 3 |
|
PLFP | Fee payment |
Year of fee payment: 4 |
|
PLFP | Fee payment |
Year of fee payment: 5 |
|
PLFP | Fee payment |
Year of fee payment: 6 |
|
ST | Notification of lapse |
Effective date: 20210705 |