FR3069328B1 - Procede de criblage pour condensateurs electrolytiques - Google Patents

Procede de criblage pour condensateurs electrolytiques Download PDF

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Publication number
FR3069328B1
FR3069328B1 FR1856818A FR1856818A FR3069328B1 FR 3069328 B1 FR3069328 B1 FR 3069328B1 FR 1856818 A FR1856818 A FR 1856818A FR 1856818 A FR1856818 A FR 1856818A FR 3069328 B1 FR3069328 B1 FR 3069328B1
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France
Prior art keywords
capacitors
electrolytic capacitors
leakage current
screening process
forming
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Active
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FR1856818A
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English (en)
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FR3069328A1 (fr
Inventor
William A Millman
Marc V Beaulieu
Michael I Miller
Mark Leinonen
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Kyocera Avx Components Corp Us
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AVX Corp
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Publication of FR3069328B1 publication Critical patent/FR3069328B1/fr
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G01R31/013—Testing passive components
    • G01R31/016—Testing of capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G13/00—Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004—Details
    • H01G9/008—Terminals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004—Details
    • H01G9/04—Electrodes or formation of dielectric layers thereon
    • H01G9/042—Electrodes or formation of dielectric layers thereon characterised by the material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/15—Solid electrolytic capacitors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

Un procédé de criblage itératif (100) d'un échantillon de condensateurs électrolytiques ayant une tension nominale prédéterminée est proposé. Le procédé peut inclure la mesure (108) d'un premier courant de fuite d'un premier jeu de condensateurs, le calcul d'une première moyenne à partir de celui-ci, et le retrait de condensateurs du premier jeu ayant un premier courant de fuite égal ou supérieur à une première valeur prédéterminée, formant ainsi un deuxième jeu de condensateurs. Le deuxième jeu peut être soumis à un traitement thermique de déverminage (114) où une tension d'essai peut être appliquée, puis un deuxième courant de fuite du deuxième jeu de condensateurs peut être mesuré et une deuxième moyenne peut être calculée. Des condensateurs ayant un deuxième courant de fuite égal ou supérieur à une seconde valeur prédéterminée peuvent être retirés du deuxième jeu, formant un troisième jeu de condensateurs.
FR1856818A 2012-08-31 2018-07-23 Procede de criblage pour condensateurs electrolytiques Active FR3069328B1 (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201261695657P 2012-08-31 2012-08-31
US61695657 2012-08-31
US201361768623P 2013-02-25 2013-02-25
FR1302021A FR2995084B1 (fr) 2012-08-31 2013-08-30 Procede de criblage pour condensateurs electrolytiques

Publications (2)

Publication Number Publication Date
FR3069328A1 FR3069328A1 (fr) 2019-01-25
FR3069328B1 true FR3069328B1 (fr) 2021-05-21

Family

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Family Applications (2)

Application Number Title Priority Date Filing Date
FR1302021A Active FR2995084B1 (fr) 2012-08-31 2013-08-30 Procede de criblage pour condensateurs electrolytiques
FR1856818A Active FR3069328B1 (fr) 2012-08-31 2018-07-23 Procede de criblage pour condensateurs electrolytiques

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FR1302021A Active FR2995084B1 (fr) 2012-08-31 2013-08-30 Procede de criblage pour condensateurs electrolytiques

Country Status (7)

Country Link
US (2) US9541607B2 (fr)
JP (2) JP6608123B2 (fr)
KR (1) KR102141502B1 (fr)
CN (1) CN103675515B (fr)
DE (1) DE102013216963A1 (fr)
FR (2) FR2995084B1 (fr)
GB (1) GB2505566A (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2505566A (en) * 2012-08-31 2014-03-05 Avx Corp Iterative screening method for electrolytic capacitors
CN104459399B (zh) * 2014-12-08 2017-09-26 南通新江海动力电子有限公司 电容产品在线老练检测方法
US10275408B1 (en) * 2015-03-27 2019-04-30 EMC IP Holding Company LLC Analysis and visualization tool utilizing mixture of multiple reliability measures for product and part combinations
CN105301413B (zh) * 2015-11-20 2018-05-04 南京埃斯顿自动控制技术有限公司 电机驱动器母线电解电容寿命评估方法
US10381166B2 (en) * 2016-05-25 2019-08-13 Vishay Sprague, Inc. High performance and reliability solid electrolytic tantalum capacitors and screening method
US10388464B2 (en) * 2016-09-19 2019-08-20 Biotronik Se & Co. Kg Method for manufacturing a leadless solid electrolyte capacitor and corresponding capacitor
US10737101B2 (en) * 2016-11-14 2020-08-11 Avx Corporation Medical device containing a solid electrolytic capacitor
US10983011B2 (en) * 2017-05-08 2021-04-20 Avx Corporation Lifetime determining technique for a solid electrolytic capacitor and system for the same
CN107153164A (zh) * 2017-07-03 2017-09-12 湖州中超科技有限公司 一种新型蓄电池性能自动检测系统以及诊断方法
WO2020097833A1 (fr) * 2018-11-14 2020-05-22 Oppo广东移动通信有限公司 Procédé et système de vérification de défaillance d'un équipement électronique
CN111474437B (zh) * 2019-11-27 2022-01-28 南京埃斯顿自动化股份有限公司 一种电解电容寿命实时在线预测的方法
CN111054663A (zh) * 2019-12-25 2020-04-24 株洲宏达电子股份有限公司 一种高可靠性钽电容器的筛选方法
US11656257B2 (en) * 2020-01-28 2023-05-23 Kioxia Corporation Systems and methods for PLP capacitor health check
US11448680B2 (en) 2020-03-31 2022-09-20 KYOCERA AVX Components Corporation Screening method for electrolytic capacitors that maintains individual capacitor unit identity
CN114236421A (zh) * 2021-12-01 2022-03-25 中国空间技术研究院 一种片式钽电容器混合漏电流检测方法
CN115097277B (zh) * 2022-06-20 2024-04-12 南方电网科学研究院有限责任公司 柔性直流换流阀功率单元的大气中子加速辐照试验方法
CN115178501A (zh) * 2022-07-12 2022-10-14 中国振华(集团)新云电子元器件有限责任公司(国营第四三二六厂) 一种高可靠固体电解质钽电容器的筛选方法
CN117269837B (zh) * 2023-11-21 2024-02-13 中科院广州电子技术有限公司 一种新型电容多站漏电流综合判定方法

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3553805A (en) * 1969-04-22 1971-01-12 Union Carbide Corp Production of graded reliability capacitors
DE2404885A1 (de) * 1974-02-01 1975-08-14 Standard Elektrik Lorenz Ag Reststrommessung
US3930993A (en) * 1974-11-25 1976-01-06 Corning Glass Works Capacitor testing and sorting apparatus
FR2386045A1 (fr) * 1977-03-30 1978-10-27 Materiel Telephonique Appareil de controle du courant de fuite de condensateurs electriques
JPS58102173A (ja) * 1981-12-14 1983-06-17 Fujitsu Ltd コンデンサの漏洩電流測定回路
US4633175A (en) 1984-11-23 1986-12-30 Avx Corporation Testing method and apparatus for electronic components
FR2661509B1 (fr) * 1990-04-27 1992-06-19 Europ Composants Electron Procede de controle des mesures realisees dans un appareil de test et de tri d'articles miniatures.
US5357399A (en) 1992-09-25 1994-10-18 Avx Corporation Mass production method for the manufacture of surface mount solid state capacitor and resulting capacitor
JP2760263B2 (ja) * 1993-08-20 1998-05-28 株式会社村田製作所 セラミックコンデンサの初期故障品のスクリーニング方法
US5882719A (en) 1995-12-13 1999-03-16 H. C. Starck, Inc. Solid tantalum capacitor test
JPH09325171A (ja) * 1996-06-05 1997-12-16 Sony Corp 不良検出方法とその装置
GB9824442D0 (en) 1998-11-06 1999-01-06 Avx Ltd Manufacture of solid state capacitors
JP3620636B2 (ja) 1998-11-25 2005-02-16 株式会社村田製作所 積層セラミックコンデンサの選別方法
JP3603640B2 (ja) * 1999-02-04 2004-12-22 松下電器産業株式会社 積層セラミックコンデンサのスクリーニング方法
GB9916048D0 (en) 1999-07-08 1999-09-08 Avx Ltd Solid state capacitors and methods of manufacturing them
DE60014648T2 (de) 1999-07-08 2005-11-10 Avx Ltd., Paignton Festelektrolytkondensatoren und herstellungsverfahren
JP3730447B2 (ja) 1999-07-14 2006-01-05 富士通株式会社 バーンイン装置及びバーンイン制御方法
GB9918852D0 (en) 1999-08-10 1999-10-13 Avx Ltd Manufacture of solid state capacitors
GB9922091D0 (en) 1999-09-17 1999-11-17 Avx Ltd Manufacture of solid state capacitors
GB9926975D0 (en) 1999-11-15 2000-01-12 Avx Ltd Solid state capacitors and methods of manufacturing them
JP4053248B2 (ja) * 2001-02-28 2008-02-27 シーケーディ株式会社 電解コンデンサのリーク電流検査装置
JP2002267708A (ja) * 2001-03-13 2002-09-18 Toshiba Corp 電解コンデンサの劣化診断方法および装置
WO2006004229A1 (fr) * 2004-07-07 2006-01-12 Showa Denko K.K. Element condensateur et pate de carbone
CN1737072B (zh) 2004-08-18 2011-06-08 播磨化成株式会社 导电粘合剂及使用该导电粘合剂制造物件的方法
JP2006108192A (ja) * 2004-09-30 2006-04-20 Nippon Chemicon Corp 固体電解コンデンサの製造方法
US7292058B2 (en) 2004-11-03 2007-11-06 Texas Instruments Incorporated Method for estimating the early failure rate of semiconductor devices
KR20070012047A (ko) 2005-07-22 2007-01-25 삼성전자주식회사 디지털 영상처리장치 및 그 제어방법
CN101313380A (zh) * 2005-11-22 2008-11-26 麦斯韦尔技术股份有限公司 电容器的筛选
JP2007318872A (ja) * 2006-05-24 2007-12-06 Daikin Ind Ltd 制御装置
US7554793B2 (en) 2006-11-16 2009-06-30 Kemet Electronics Corporation Low temperature curable conductive adhesive and capacitors formed thereby
US8288654B2 (en) * 2006-11-30 2012-10-16 Medtronic, Inc. Feedthrough assembly including a ferrule, an insulating structure and a glass
US7671603B2 (en) 2006-12-18 2010-03-02 Kemet Electronics Corporation Screening of electrolytic capacitors
US8441265B2 (en) 2006-12-18 2013-05-14 Kemet Electronics Corporation Apparatus and method for screening electrolytic capacitors
US8157158B2 (en) * 2007-01-30 2012-04-17 International Business Machines Corporation Modification of solder alloy compositions to suppress interfacial void formation in solder joints
US7609072B2 (en) * 2007-04-05 2009-10-27 General Electric Company Processing tantalum capacitors on assembled PWAs to yield low failure rate
CN101504887B (zh) * 2009-01-13 2012-06-13 珠海华冠电容器有限公司 一种固体铝电解电容器的制造方法
JP5287985B2 (ja) * 2009-05-29 2013-09-11 株式会社村田製作所 製品選別装置、製品選別方法及びコンピュータプログラム
CN102033182A (zh) * 2010-12-10 2011-04-27 北京航空航天大学 一种固体钽电解电容器寿命预测方法
GB2505566A (en) * 2012-08-31 2014-03-05 Avx Corp Iterative screening method for electrolytic capacitors

Also Published As

Publication number Publication date
FR2995084B1 (fr) 2019-04-12
CN103675515B (zh) 2017-06-13
US9541607B2 (en) 2017-01-10
JP6608123B2 (ja) 2019-11-20
DE102013216963A1 (de) 2014-03-06
US20140067303A1 (en) 2014-03-06
KR102141502B1 (ko) 2020-08-06
GB201314468D0 (en) 2013-09-25
GB2505566A (en) 2014-03-05
FR2995084A1 (fr) 2014-03-07
JP2014049767A (ja) 2014-03-17
JP2018117145A (ja) 2018-07-26
FR3069328A1 (fr) 2019-01-25
US10591527B2 (en) 2020-03-17
KR20140029290A (ko) 2014-03-10
US20170082671A1 (en) 2017-03-23
CN103675515A (zh) 2014-03-26

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