FR2939964B1 - Dispositif de test de circuit integre et procede de mise en oeuvre - Google Patents

Dispositif de test de circuit integre et procede de mise en oeuvre

Info

Publication number
FR2939964B1
FR2939964B1 FR0858737A FR0858737A FR2939964B1 FR 2939964 B1 FR2939964 B1 FR 2939964B1 FR 0858737 A FR0858737 A FR 0858737A FR 0858737 A FR0858737 A FR 0858737A FR 2939964 B1 FR2939964 B1 FR 2939964B1
Authority
FR
France
Prior art keywords
implementing
same
integrated circuit
test device
circuit test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0858737A
Other languages
English (en)
French (fr)
Other versions
FR2939964A1 (fr
Inventor
Florent Miller
Cecile Weulersse
Antonin Bourgerol
Thierry Carriere
Patrick Heins
Samuel Hazo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Group SAS
Original Assignee
European Aeronautic Defence and Space Company EADS France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR0858737A priority Critical patent/FR2939964B1/fr
Application filed by European Aeronautic Defence and Space Company EADS France filed Critical European Aeronautic Defence and Space Company EADS France
Priority to US13/140,409 priority patent/US8338803B2/en
Priority to CN200980150974.5A priority patent/CN102257398B/zh
Priority to ES09801478T priority patent/ES2395644T3/es
Priority to EP09801478A priority patent/EP2359155B1/fr
Priority to JP2011541545A priority patent/JP5469677B2/ja
Priority to PCT/FR2009/052377 priority patent/WO2010076448A1/fr
Publication of FR2939964A1 publication Critical patent/FR2939964A1/fr
Application granted granted Critical
Publication of FR2939964B1 publication Critical patent/FR2939964B1/fr
Priority to IL213536A priority patent/IL213536A/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
FR0858737A 2008-12-17 2008-12-17 Dispositif de test de circuit integre et procede de mise en oeuvre Expired - Fee Related FR2939964B1 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FR0858737A FR2939964B1 (fr) 2008-12-17 2008-12-17 Dispositif de test de circuit integre et procede de mise en oeuvre
CN200980150974.5A CN102257398B (zh) 2008-12-17 2009-12-02 集成电路测试装置及应用方法
ES09801478T ES2395644T3 (es) 2008-12-17 2009-12-02 Dispositivo de prueba de circuito integrado y procedimiento de puesta en práctica
EP09801478A EP2359155B1 (fr) 2008-12-17 2009-12-02 Dispositif de test de circuit integre et procede de mise en oeuvre
US13/140,409 US8338803B2 (en) 2008-12-17 2009-12-02 Device for testing an integrated circuit and method for implementing same
JP2011541545A JP5469677B2 (ja) 2008-12-17 2009-12-02 集積回路の試験装置および試験方法
PCT/FR2009/052377 WO2010076448A1 (fr) 2008-12-17 2009-12-02 Dispositif de test de circuit integre et procede de mise en oeuvre
IL213536A IL213536A (en) 2008-12-17 2011-06-14 An integrated circuit test device and a method for its application

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0858737A FR2939964B1 (fr) 2008-12-17 2008-12-17 Dispositif de test de circuit integre et procede de mise en oeuvre

Publications (2)

Publication Number Publication Date
FR2939964A1 FR2939964A1 (fr) 2010-06-18
FR2939964B1 true FR2939964B1 (fr) 2010-12-10

Family

ID=41077983

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0858737A Expired - Fee Related FR2939964B1 (fr) 2008-12-17 2008-12-17 Dispositif de test de circuit integre et procede de mise en oeuvre

Country Status (8)

Country Link
US (1) US8338803B2 (ja)
EP (1) EP2359155B1 (ja)
JP (1) JP5469677B2 (ja)
CN (1) CN102257398B (ja)
ES (1) ES2395644T3 (ja)
FR (1) FR2939964B1 (ja)
IL (1) IL213536A (ja)
WO (1) WO2010076448A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130325459A1 (en) * 2012-05-31 2013-12-05 Royce A. Levien Speech recognition adaptation systems based on adaptation data
FR3046246B1 (fr) * 2015-12-24 2019-03-29 Airbus Group Sas Dispositif et procede de test d'un systeme electronique
RU2758528C1 (ru) * 2020-10-20 2021-10-29 федеральное государственное бюджетное образовательное учреждение высшего образования "Белгородский государственный технологический университет им. В.Г. Шухова" Способ проведения космического эксперимента по оценке радиационно-защитных свойств материалов в условиях длительного орбитального полёта
CN114460440B (zh) * 2022-01-26 2023-09-12 中国科学院近代物理研究所 一种集成电路单粒子效应定位系统

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0129508B1 (fr) * 1983-05-25 1987-01-21 Battelle Memorial Institute Procédé d'examen et de test d'un dispositif électrique du type des circuits intégrés ou imprimés
JPS62280700A (ja) * 1986-05-30 1987-12-05 株式会社日立製作所 放射線耐量測定装置
US5850145A (en) * 1996-09-09 1998-12-15 Hewlett-Packard Co. Apparatus and method for soft error comparison testing
US20040082138A1 (en) * 2002-10-23 2004-04-29 Lin Wen-Chin Method and preparing a mask for high energy particle bombardment
US7492018B2 (en) * 2004-09-17 2009-02-17 Taiwan Semiconductor Manufacturing Company, Ltd. Isolating substrate noise by forming semi-insulating regions
US7397904B2 (en) * 2005-05-11 2008-07-08 Varian Medical Systems Technologies, Inc. Asymmetric flattening filter for x-ray device
FR2900242B1 (fr) * 2006-04-19 2008-08-22 Aeds Ccr Procede et dispositif de caracterisation de la sensibilite aux interactions energetiques dans un composant electronique
JP4774495B2 (ja) * 2007-01-18 2011-09-14 独立行政法人国立がん研究センター 荷電粒子線照射装置
FR2939968B1 (fr) * 2008-12-17 2013-06-07 Eads Europ Aeronautic Defence Generateur electrique excite par rayonnements cosmiques.
US20100163756A1 (en) * 2008-12-31 2010-07-01 Custom Test Systems, Llc. Single event upset (SEU) testing system and method

Also Published As

Publication number Publication date
EP2359155B1 (fr) 2012-09-19
EP2359155A1 (fr) 2011-08-24
IL213536A (en) 2015-11-30
US8338803B2 (en) 2012-12-25
JP5469677B2 (ja) 2014-04-16
CN102257398B (zh) 2014-04-23
IL213536A0 (en) 2011-07-31
US20120001088A1 (en) 2012-01-05
JP2012512409A (ja) 2012-05-31
FR2939964A1 (fr) 2010-06-18
ES2395644T3 (es) 2013-02-14
WO2010076448A1 (fr) 2010-07-08
CN102257398A (zh) 2011-11-23

Similar Documents

Publication Publication Date Title
FR2937208B1 (fr) Procede et dispositif de tele-visionnage
HK1136919A1 (en) Automatic testing method, device and system thereof
DK2300137T3 (da) Fremgangsmåde og indretning til aflæsning af en emulsion
BRPI0818708A2 (pt) Aparelho de interface eletrônica e método e sistema para produção do mesmo
DK3128315T3 (da) Detekteringsanordning, system til optagelse af stråling, strålingsinspektionssystem og fremgangsmåde til strålingsdetektering
EP2088442A4 (en) PARALLEL CHECK AND METHOD AND SEMICONDUCTOR ARRANGEMENT
EP2102869A4 (en) CIRCUIT AND METHOD FOR TESTING MULTI-DEVICE SYSTEMS
EP2352010A4 (en) DEVICE FOR INSTALLING / REMOVING A MEASURING CHIP, SPR MEASURING SYSTEM AND METHOD FOR INSTALLING / REMOVING A MEASURING CHIP
PL2232455T3 (pl) Urządzenie monitorujące dla systemu sygnalizacyjnego, system sygnalizacyjny oraz sposób monitorowania systemu sygnalizacyjnego
SG10201400838PA (en) System for testing an integrated circuit of a device and its method of use
FR2887327B1 (fr) Procede de protection antimissiles de vehicules et dispositif de mise en oeuvre
TWI339733B (en) Electronic device testing system and method
IL218799A0 (en) Method, inspection apparatus and substrate for determining an approximate structure of an object on the substrate
SG10201604826RA (en) System for testing an integrated circuit of a device and its method of use
FR2928077B1 (fr) Dispositif et procede de micro-elastographie.
BRPI0823290A2 (pt) Método e aparelho para configuração de dispositivos.
DK2252890T3 (da) Fremgangsmåde og anordning til påvisning af kulhydrater
EP2116963A4 (en) QUALITY ASSAY PROCEDURE, QUALITY INSPECTION DEVICE AND QUALITY ASSESSMENT SYSTEM
PT2483700T (pt) Dispositivo para condicionamento de chips semicondutores e processo de teste com emprego do dispositivo
NL2003179A1 (nl) Lithographic apparatus and device manufacturing method and scatterometry method and measurement system used therein.
EP2351547A4 (en) APPARATUS FOR INSPECTION OF TAMPONS AND METHOD FOR INSPECTION OF TAMPONS
DK2283456T3 (da) Fremgangsmåde og indretning til identifikation af objekter
EP2105246A4 (en) DEVICE AND METHOD FOR DETECTING A COMPONENT MOUNTING
FR2939925B1 (fr) Dispositif de test d'un circuit et procede de mise en oeuvre
EP2293482A4 (en) SIGNAL DETECTION METHOD AND DEVICE FOR A MULTICODE, MULTISENDER AND MULTI-RECEIVER SYSTEM

Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20140829