FR3046246B1 - Dispositif et procede de test d'un systeme electronique - Google Patents

Dispositif et procede de test d'un systeme electronique Download PDF

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Publication number
FR3046246B1
FR3046246B1 FR1563295A FR1563295A FR3046246B1 FR 3046246 B1 FR3046246 B1 FR 3046246B1 FR 1563295 A FR1563295 A FR 1563295A FR 1563295 A FR1563295 A FR 1563295A FR 3046246 B1 FR3046246 B1 FR 3046246B1
Authority
FR
France
Prior art keywords
testing
electronic equipment
signal
radiation
electronic system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1563295A
Other languages
English (en)
Other versions
FR3046246A1 (fr
Inventor
Florent Miller
Sebastien Morand
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Group SAS
Original Assignee
Airbus Group SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Airbus Group SAS filed Critical Airbus Group SAS
Priority to FR1563295A priority Critical patent/FR3046246B1/fr
Priority to PCT/FR2016/053667 priority patent/WO2017109439A1/fr
Publication of FR3046246A1 publication Critical patent/FR3046246A1/fr
Application granted granted Critical
Publication of FR3046246B1 publication Critical patent/FR3046246B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

Dispositif (10) de test d'un équipement électronique (100) comportant : - une platine (105) comportant une alimentation (110) de puissance et un moyen (115) apte à réaliser une mesure de fonctionnement pendant le test, la platine (105) comportant également au moins un encodeur (120, 121, 122) délivrant un signal (125, 126, 127) représentatif d'une distance parcourue par la platine (105), - un moyen (135) d'irradiation en regard de l'équipement électronique (100) et configuré pour le soumette à des radiations (140), dans lequel, le signal (125, 126, 127) est transmis au moyen (135) d'irradiation et en ce que l'émission d'une radiation (140) est déclenchée par la réception d'un signal (125, 126, 127) prédéterminé. L'invention concerne également le procédé (20) de test d'un équipement électronique (100) mis en œuvre au moyen du dispositif (10).
FR1563295A 2015-12-24 2015-12-24 Dispositif et procede de test d'un systeme electronique Expired - Fee Related FR3046246B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1563295A FR3046246B1 (fr) 2015-12-24 2015-12-24 Dispositif et procede de test d'un systeme electronique
PCT/FR2016/053667 WO2017109439A1 (fr) 2015-12-24 2016-12-23 Dispositif et procédé de test d'un système électronique

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1563295A FR3046246B1 (fr) 2015-12-24 2015-12-24 Dispositif et procede de test d'un systeme electronique
FR1563295 2015-12-24

Publications (2)

Publication Number Publication Date
FR3046246A1 FR3046246A1 (fr) 2017-06-30
FR3046246B1 true FR3046246B1 (fr) 2019-03-29

Family

ID=55346118

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1563295A Expired - Fee Related FR3046246B1 (fr) 2015-12-24 2015-12-24 Dispositif et procede de test d'un systeme electronique

Country Status (2)

Country Link
FR (1) FR3046246B1 (fr)
WO (1) WO2017109439A1 (fr)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4786865A (en) * 1986-03-03 1988-11-22 The Boeing Company Method and apparatus for testing integrated circuit susceptibility to cosmic rays
US6445813B1 (en) * 1994-08-24 2002-09-03 Matsushita Electric Industrial Co., Ltd. System for inspecting an apparatus of a printed circuit board
FR2939964B1 (fr) * 2008-12-17 2010-12-10 Eads Europ Aeronautic Defence Dispositif de test de circuit integre et procede de mise en oeuvre

Also Published As

Publication number Publication date
WO2017109439A1 (fr) 2017-06-29
FR3046246A1 (fr) 2017-06-30

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