FR2922658B1 - Systeme d'illuminations structuree d'un echantillon - Google Patents

Systeme d'illuminations structuree d'un echantillon

Info

Publication number
FR2922658B1
FR2922658B1 FR0707299A FR0707299A FR2922658B1 FR 2922658 B1 FR2922658 B1 FR 2922658B1 FR 0707299 A FR0707299 A FR 0707299A FR 0707299 A FR0707299 A FR 0707299A FR 2922658 B1 FR2922658 B1 FR 2922658B1
Authority
FR
France
Prior art keywords
sample
illumination system
structured illumination
structured
illumination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0707299A
Other languages
English (en)
Other versions
FR2922658A1 (fr
Inventor
Vincent Loriette
Benoit Dubertret
Rodriguez Pedro Felipe Gardeazabal
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR0707299A priority Critical patent/FR2922658B1/fr
Priority to JP2010529427A priority patent/JP2011501214A/ja
Priority to EP08870802A priority patent/EP2201420A2/fr
Priority to US12/738,573 priority patent/US8289622B2/en
Priority to PCT/FR2008/001469 priority patent/WO2009090341A2/fr
Publication of FR2922658A1 publication Critical patent/FR2922658A1/fr
Application granted granted Critical
Publication of FR2922658B1 publication Critical patent/FR2922658B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
FR0707299A 2007-10-18 2007-10-18 Systeme d'illuminations structuree d'un echantillon Expired - Fee Related FR2922658B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR0707299A FR2922658B1 (fr) 2007-10-18 2007-10-18 Systeme d'illuminations structuree d'un echantillon
JP2010529427A JP2011501214A (ja) 2007-10-18 2008-10-17 サンプルの構造化照明システム
EP08870802A EP2201420A2 (fr) 2007-10-18 2008-10-17 Système d'illumination structurée d'un échantillon
US12/738,573 US8289622B2 (en) 2007-10-18 2008-10-17 System for the structured illumination of a sample
PCT/FR2008/001469 WO2009090341A2 (fr) 2007-10-18 2008-10-17 Systeme d ' illuminations structuree d ' un echantillon en microscopie tridimensionelle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0707299A FR2922658B1 (fr) 2007-10-18 2007-10-18 Systeme d'illuminations structuree d'un echantillon

Publications (2)

Publication Number Publication Date
FR2922658A1 FR2922658A1 (fr) 2009-04-24
FR2922658B1 true FR2922658B1 (fr) 2011-02-04

Family

ID=39432831

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0707299A Expired - Fee Related FR2922658B1 (fr) 2007-10-18 2007-10-18 Systeme d'illuminations structuree d'un echantillon

Country Status (5)

Country Link
US (1) US8289622B2 (fr)
EP (1) EP2201420A2 (fr)
JP (1) JP2011501214A (fr)
FR (1) FR2922658B1 (fr)
WO (1) WO2009090341A2 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2922658B1 (fr) * 2007-10-18 2011-02-04 Centre Nat Rech Scient Systeme d'illuminations structuree d'un echantillon
WO2013108626A1 (fr) * 2012-01-18 2013-07-25 株式会社ニコン Dispositif structuré d'éclairage, dispositif structuré de microscope à éclairage, et procédé structuré d'éclairage
JP2014063151A (ja) * 2012-08-29 2014-04-10 Canon Inc 顕微鏡用照明光学系およびこれを用いた顕微鏡
DE102012017922B4 (de) * 2012-09-11 2024-03-14 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop
CN106680271A (zh) * 2015-11-05 2017-05-17 南京理工大学 基于空间光调制器的裸眼立体显微成像装置及方法
US11287627B2 (en) 2017-06-30 2022-03-29 Chrysanthe Preza Multi-focal light-sheet structured illumination fluorescence microscopy system
US20230384574A1 (en) * 2020-10-28 2023-11-30 Georgia Tech Research Corporation Cell imaging systems and methods

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JP4348574B2 (ja) * 1998-04-30 2009-10-21 株式会社ニコン 暗視野照明装置および暗視野照明方法
DE19827139C2 (de) * 1998-06-18 2002-01-31 Zeiss Carl Jena Gmbh Mikroskop mit einem über eine Lichtleitfaser eingekoppelten Kurzpulslaser
US7274446B2 (en) * 2001-04-07 2007-09-25 Carl Zeiss Jena Gmbh Method and arrangement for the deep resolved optical recording of a sample
JP4844862B2 (ja) * 2001-09-14 2011-12-28 株式会社ニコン 格子照明顕微鏡
ATE399990T1 (de) * 2001-10-09 2008-07-15 Univ Ruprecht Karls Heidelberg Fernfeld lichtmikroskopische methode und vorrichtung zur bestimmung von mindestens einem objekt kleiner als die benutzte wellenlänge
US6888148B2 (en) * 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample
US7312432B2 (en) * 2002-07-08 2007-12-25 Dmetrix, Inc. Single axis illumination for multi-axis imaging system
DE10254139A1 (de) * 2002-11-15 2004-05-27 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
DE10332073A1 (de) * 2003-07-11 2005-02-10 Carl Zeiss Jena Gmbh Anordnung zur optischen Erfassung von in einer Probe angeregter und / oder rückgestreuter Lichtstrahlung mit Doppelobjektivanordnung
JP4512180B2 (ja) * 2004-01-09 2010-07-28 独立行政法人理化学研究所 干渉装置
US7046342B2 (en) * 2004-01-29 2006-05-16 International Business Machines Corporation Apparatus for characterization of photoresist resolution, and method of use
DE102004034962A1 (de) * 2004-07-16 2006-02-16 Carl Zeiss Jena Gmbh Mikroskop mit erhöhter Auflösung
EP1865355B1 (fr) * 2005-03-30 2013-03-06 Nikon Corporation Procede de formation d image et dispositif de microscope
US7485875B2 (en) * 2005-07-22 2009-02-03 Carl Zeiss Microimaging Gmbh Resolution-enhanced luminescence microscopy
US20080158668A1 (en) * 2005-10-07 2008-07-03 Nikon Corporation Microscope and Image Generation Method
US8081378B2 (en) * 2005-10-13 2011-12-20 Nikon Corporation Microscope
JP2007147388A (ja) * 2005-11-25 2007-06-14 Toshiba Corp 表面測定装置
JP2007199572A (ja) * 2006-01-30 2007-08-09 Nikon Corp 顕微鏡装置
EP1816493A1 (fr) * 2006-02-07 2007-08-08 ETH Zürich Réseau de diffraction accordable
US7619732B2 (en) * 2006-03-01 2009-11-17 Leica Microsystems Cms Gmbh Method and microscope for high spatial resolution examination of samples
WO2008030681A2 (fr) * 2006-09-08 2008-03-13 Gsi Group Corporation Encodeur de position optique interférométrique employant le filtrage spatial d'ordres de diffraction pour une précision améliorée
EP2093601B1 (fr) * 2006-12-12 2013-03-13 Nikon Corporation Dispositif de microscope et procédé de traitement d'image
US8405059B2 (en) * 2007-02-02 2013-03-26 King's College London Method and apparatus for improving the resolution and/or sectioning ability of an imaging system
WO2008124832A1 (fr) * 2007-04-10 2008-10-16 University Of Rochester Eclairage structuré pour former l'image d'objets stationnaires et non stationnaires, fluorescents et non fluorescents
JP2009098215A (ja) * 2007-10-12 2009-05-07 Nikon Corp 顕微鏡装置、及び顕微鏡装置における位相変化量の算出方法。
US8072611B2 (en) * 2007-10-12 2011-12-06 Zygo Corporation Interferometric analysis of under-resolved features
FR2922658B1 (fr) * 2007-10-18 2011-02-04 Centre Nat Rech Scient Systeme d'illuminations structuree d'un echantillon
DE102007063274B8 (de) * 2007-12-20 2022-12-15 Albert-Ludwigs-Universität Freiburg Mikroskop
US8115992B2 (en) * 2007-12-31 2012-02-14 Stc.Unm Structural illumination and evanescent coupling for the extension of imaging interferometric microscopy
US20090219607A1 (en) * 2008-01-17 2009-09-03 Baylor College Of Medicine Method and apparatus for enhanced resolution microscopy of living biological nanostructures
US8019136B2 (en) * 2008-12-03 2011-09-13 Academia Sinica Optical sectioning microscopy
US8107084B2 (en) * 2009-01-30 2012-01-31 Zygo Corporation Interference microscope with scan motion detection using fringe motion in monitor patterns
GB0907965D0 (en) * 2009-05-08 2009-06-24 King S College London Imaging system
US8174761B2 (en) * 2009-06-10 2012-05-08 Universitat Heidelberg Total internal reflection interferometer with laterally structured illumination
JP2013513823A (ja) * 2009-12-09 2013-04-22 アプライド プレシジョン インコーポレイテッド 高速の３次元構造化照明による顕微鏡撮像の方法およびシステム
EP3726274B1 (fr) * 2010-04-26 2023-08-23 Nikon Corporation Appareil microscope à éclairage structuré et appareil de formation d'images

Also Published As

Publication number Publication date
WO2009090341A3 (fr) 2009-09-11
EP2201420A2 (fr) 2010-06-30
US20110116163A1 (en) 2011-05-19
FR2922658A1 (fr) 2009-04-24
WO2009090341A2 (fr) 2009-07-23
US8289622B2 (en) 2012-10-16
JP2011501214A (ja) 2011-01-06

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Legal Events

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ST Notification of lapse

Effective date: 20150630