FR2894373B1 - Cellule anti-fusible autonome - Google Patents
Cellule anti-fusible autonomeInfo
- Publication number
- FR2894373B1 FR2894373B1 FR0512419A FR0512419A FR2894373B1 FR 2894373 B1 FR2894373 B1 FR 2894373B1 FR 0512419 A FR0512419 A FR 0512419A FR 0512419 A FR0512419 A FR 0512419A FR 2894373 B1 FR2894373 B1 FR 2894373B1
- Authority
- FR
- France
- Prior art keywords
- fuse cell
- autonomous anti
- autonomous
- fuse
- cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/18—Auxiliary circuits, e.g. for writing into memory
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0512419A FR2894373B1 (fr) | 2005-12-07 | 2005-12-07 | Cellule anti-fusible autonome |
US11/375,839 US7304878B2 (en) | 2005-12-07 | 2006-03-14 | Autonomous antifuse cell |
US11/923,434 US7606058B2 (en) | 2005-12-07 | 2007-10-24 | Autonomous antifuse cell |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0512419A FR2894373B1 (fr) | 2005-12-07 | 2005-12-07 | Cellule anti-fusible autonome |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2894373A1 FR2894373A1 (fr) | 2007-06-08 |
FR2894373B1 true FR2894373B1 (fr) | 2008-01-04 |
Family
ID=36581619
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0512419A Expired - Fee Related FR2894373B1 (fr) | 2005-12-07 | 2005-12-07 | Cellule anti-fusible autonome |
Country Status (2)
Country | Link |
---|---|
US (2) | US7304878B2 (fr) |
FR (1) | FR2894373B1 (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2894373B1 (fr) * | 2005-12-07 | 2008-01-04 | Atmel Corp | Cellule anti-fusible autonome |
JP2008187525A (ja) * | 2007-01-30 | 2008-08-14 | Sanyo Electric Co Ltd | インバータ回路 |
US20090237209A1 (en) * | 2008-03-20 | 2009-09-24 | Brian William Seal | Communicating keychain |
JP2010182365A (ja) * | 2009-02-04 | 2010-08-19 | Elpida Memory Inc | アンチヒューズ回路及び半導体記憶装置 |
JP5431992B2 (ja) * | 2010-02-09 | 2014-03-05 | セイコーインスツル株式会社 | トランスミッションゲート及び半導体装置 |
US8787096B1 (en) * | 2013-01-16 | 2014-07-22 | Qualcomm Incorporated | N-well switching circuit |
CN112863583A (zh) * | 2019-11-28 | 2021-05-28 | 长鑫存储技术有限公司 | 可编程存储单元、可编程存储阵列及其读写方法 |
US11935605B2 (en) | 2021-11-02 | 2024-03-19 | Nanya Technology Corporation | Method for preparing semiconductor device including an electronic fuse control circuit |
TWI817328B (zh) * | 2021-11-02 | 2023-10-01 | 南亞科技股份有限公司 | 具有電子熔線控制電路的半導體元件及其製備方法 |
US11769562B2 (en) * | 2021-11-03 | 2023-09-26 | Nanya Technology Corporation | Semiconductor device including an electronic fuse control circuit |
CN115102539B (zh) * | 2022-08-25 | 2022-11-22 | 中国电子科技集团公司第五十八研究所 | 一种适用于反熔丝fpga中的电平位移电路 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5418487A (en) | 1992-09-04 | 1995-05-23 | Benchmarg Microelectronics, Inc. | Fuse state sense circuit |
US5452355A (en) | 1994-02-02 | 1995-09-19 | Vlsi Technology, Inc. | Tamper protection cell |
US5731733A (en) | 1995-09-29 | 1998-03-24 | Intel Corporation | Static, low current sensing circuit for sensing the state of a fuse device |
US5789970A (en) | 1995-09-29 | 1998-08-04 | Intel Corporation | Static, low current, low voltage sensing circuit for sensing the state of a fuse device |
GB2307320B (en) * | 1995-11-18 | 2000-10-18 | Motorola Inc | Non-volatile memory cell and method of storing data therein |
US5734617A (en) * | 1996-08-01 | 1998-03-31 | Micron Technology Corporation | Shared pull-up and selection circuitry for programmable cells such as antifuse cells |
US5831923A (en) * | 1996-08-01 | 1998-11-03 | Micron Technology, Inc. | Antifuse detect circuit |
KR100321169B1 (ko) * | 1998-06-30 | 2002-05-13 | 박종섭 | 앤티퓨즈의프로그래밍회로 |
KR100359857B1 (ko) * | 1998-06-30 | 2003-01-08 | 주식회사 하이닉스반도체 | 크로스커플드피드백루프를갖는앤티퓨즈의프로그래밍회로 |
US6426668B1 (en) | 2001-03-22 | 2002-07-30 | International Business Machines Corporation | Imbalanced sense amplifier fuse detection circuit |
US6628561B2 (en) * | 2001-08-30 | 2003-09-30 | Micron Technology, Inc. | Small anti-fuse circuit to facilitate parallel fuse blowing |
US6618311B1 (en) | 2002-02-12 | 2003-09-09 | Artisan Components, Inc. | Zero power fuse sensing circuit for redundancy applications in memories |
US20030234665A1 (en) | 2002-06-20 | 2003-12-25 | Sterling Smith | Anti-fuse sense amplifier |
US7236043B2 (en) * | 2005-10-17 | 2007-06-26 | Atmel Corporation | Antifuse programming, protection, and sensing device |
FR2894373B1 (fr) * | 2005-12-07 | 2008-01-04 | Atmel Corp | Cellule anti-fusible autonome |
-
2005
- 2005-12-07 FR FR0512419A patent/FR2894373B1/fr not_active Expired - Fee Related
-
2006
- 2006-03-14 US US11/375,839 patent/US7304878B2/en not_active Expired - Fee Related
-
2007
- 2007-10-24 US US11/923,434 patent/US7606058B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US7304878B2 (en) | 2007-12-04 |
FR2894373A1 (fr) | 2007-06-08 |
US20070127283A1 (en) | 2007-06-07 |
US20080043511A1 (en) | 2008-02-21 |
US7606058B2 (en) | 2009-10-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20120831 |