FR2874263B1 - Procede et dispositif pour la mesure, l'orientation et la fixation d'au moins un monocristal - Google Patents
Procede et dispositif pour la mesure, l'orientation et la fixation d'au moins un monocristalInfo
- Publication number
- FR2874263B1 FR2874263B1 FR0508297A FR0508297A FR2874263B1 FR 2874263 B1 FR2874263 B1 FR 2874263B1 FR 0508297 A FR0508297 A FR 0508297A FR 0508297 A FR0508297 A FR 0508297A FR 2874263 B1 FR2874263 B1 FR 2874263B1
- Authority
- FR
- France
- Prior art keywords
- monocrystal
- orientation
- measuring
- fixing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
- B28D5/0088—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work the supporting or holding device being angularly adjustable
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/901—Levitation, reduced gravity, microgravity, space
- Y10S117/902—Specified orientation, shape, crystallography, or size of seed or substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1004—Apparatus with means for measuring, testing, or sensing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1004—Apparatus with means for measuring, testing, or sensing
- Y10T117/1008—Apparatus with means for measuring, testing, or sensing with responsive control means
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004039244 | 2004-08-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2874263A1 FR2874263A1 (fr) | 2006-02-17 |
FR2874263B1 true FR2874263B1 (fr) | 2008-09-26 |
Family
ID=35768616
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0508297A Expired - Fee Related FR2874263B1 (fr) | 2004-08-10 | 2005-08-03 | Procede et dispositif pour la mesure, l'orientation et la fixation d'au moins un monocristal |
Country Status (5)
Country | Link |
---|---|
US (1) | US7285168B2 (fr) |
JP (1) | JP4500744B2 (fr) |
FR (1) | FR2874263B1 (fr) |
RU (1) | RU2365905C2 (fr) |
TW (1) | TWI330254B (fr) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8499940B2 (en) * | 2007-07-31 | 2013-08-06 | America's Collectibles Network | Rotatable article display device and method |
WO2009078485A1 (fr) * | 2007-12-19 | 2009-06-25 | Asahi Glass Company, Limited | Composition d'éther |
DE102008051673B4 (de) * | 2008-10-15 | 2014-04-03 | Siltronic Ag | Verfahren zum gleichzeitigen Auftrennen eines Verbundstabs aus Silicium in eine Vielzahl von Scheiben |
US8259901B1 (en) | 2010-05-25 | 2012-09-04 | Rubicon Technology, Inc. | Intelligent machines and process for production of monocrystalline products with goniometer continual feedback |
EP2520401A1 (fr) * | 2011-05-05 | 2012-11-07 | Meyer Burger AG | Procédé de fixation d'une pièce monocristalline à traiter sur un dispositif de traitement |
KR101273942B1 (ko) | 2011-10-18 | 2013-06-12 | 비아이신소재 주식회사 | 잉곳 검사 지그 |
US10052848B2 (en) | 2012-03-06 | 2018-08-21 | Apple Inc. | Sapphire laminates |
CN102642254B (zh) * | 2012-05-14 | 2014-04-23 | 云南蓝晶科技股份有限公司 | 晶面定向检测粘接台 |
CN102778463A (zh) * | 2012-07-16 | 2012-11-14 | 铜陵市琨鹏光电科技有限公司 | 水晶x光粘料机 |
JP5922530B2 (ja) * | 2012-08-31 | 2016-05-24 | 株式会社リガク | オリエンテーションフラット位置決定方法およびオリエンテーションフラット位置決定装置 |
CN103267767B (zh) * | 2013-04-01 | 2016-01-27 | 合肥晶桥光电材料有限公司 | 多功能x射线定向仪 |
CN103592322B (zh) * | 2013-12-02 | 2015-08-19 | 长春理工大学 | 单晶晶面偏角及偏向测算方法 |
US9154678B2 (en) | 2013-12-11 | 2015-10-06 | Apple Inc. | Cover glass arrangement for an electronic device |
RU2580127C1 (ru) * | 2013-12-24 | 2016-04-10 | Акционерное общество "Монокристалл" | Способ соединения и фиксации монокристаллов (варианты), устройство для осуществления способа и стек, полученный с их использованием |
US10406634B2 (en) | 2015-07-01 | 2019-09-10 | Apple Inc. | Enhancing strength in laser cutting of ceramic components |
TWI616565B (zh) * | 2016-10-17 | 2018-03-01 | 友達晶材股份有限公司 | 自動對位裝置及其自動對位方法 |
CN107870175B (zh) * | 2017-12-31 | 2023-10-20 | 唐山国芯晶源电子有限公司 | Sc石英晶棒x光定向粘板机及其一次粘结定位方法 |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH574107A5 (fr) | 1972-10-11 | 1976-03-31 | Merigoux Henri | |
JPS57136150A (en) | 1981-02-18 | 1982-08-23 | Rigaku Denki Kk | Method for measuring deviation angle of cut plane of single crystal |
US4412345A (en) | 1981-08-03 | 1983-10-25 | The United States Of America As Represented By The Secretary Of The Army | Apparatus and method for precise determinations of crystallographic orientation in crystalline substances |
JPS6027752U (ja) * | 1983-08-02 | 1985-02-25 | 株式会社タチエス | ヘッドレストの上下調節装置 |
GB8607482D0 (en) | 1986-03-26 | 1986-04-30 | Howe S | Orientation of crystals |
GB8607481D0 (en) | 1986-03-26 | 1986-04-30 | Howe S | Grading orientation errors in crystal specimens |
JPH066758Y2 (ja) * | 1989-03-31 | 1994-02-23 | 池田物産株式会社 | ヘッドレスト装置 |
CH691045A5 (fr) | 1996-04-16 | 2001-04-12 | Hct Shaping Systems Sa | Procédé pour l'orientation de plusieurs pièces cristallines posées côte à côte sur un support de découpage en vue d'une découpe simultanée dans une machine de découpage et dispositif pour la |
JPH09325124A (ja) * | 1996-06-04 | 1997-12-16 | Tokyo Seimitsu Co Ltd | X線を利用したインゴットの結晶軸方位調整方法及び装置 |
CH692331A5 (de) | 1996-06-04 | 2002-05-15 | Tokyo Seimitsu Co Ltd | Drahtsäge und Schneidverfahren unter Einsatz derselben. |
JP3173564B2 (ja) * | 1996-06-04 | 2001-06-04 | 株式会社東京精密 | ワイヤソー |
FR2751926B1 (fr) * | 1996-07-31 | 1998-10-02 | Faure Bertrand Equipements Sa | Siege de vehicule comportant un appui-tete, et appui-tete pour siege de vehicule |
JP3817022B2 (ja) * | 1996-11-08 | 2006-08-30 | 三益半導体工業株式会社 | 単結晶インゴットの取付け方法 |
JPH112614A (ja) * | 1997-06-13 | 1999-01-06 | Rigaku Corp | 単結晶軸方位x線測定方法及び装置 |
GB9816687D0 (en) | 1998-07-30 | 1998-09-30 | Gersan Ets | Examining the orientation of the lattice of a crystal |
JP4046865B2 (ja) * | 1998-09-04 | 2008-02-13 | 東芝Itコントロールシステム株式会社 | 結晶方位測定装置及び結晶方位測定方法 |
US6099077A (en) * | 1998-10-27 | 2000-08-08 | Centura Group, Inc. | Head restraint assembly for motor vehicle |
US6062645A (en) * | 1998-12-14 | 2000-05-16 | Del-Met Corporation | Headrest support assembly |
JP2001272359A (ja) * | 2000-03-27 | 2001-10-05 | Rigaku Corp | 単結晶インゴットの処理装置及び処理方法 |
JP2003149179A (ja) * | 2001-08-31 | 2003-05-21 | Rigaku Corp | 単結晶体の方位測定装置 |
US6761409B2 (en) * | 2002-05-03 | 2004-07-13 | John R. Ford | Head restraint guide sleeve |
US6802565B2 (en) * | 2002-05-29 | 2004-10-12 | Centura Group, Inc. | Head restraint assembly for motor vehicle |
US6655742B1 (en) * | 2002-05-31 | 2003-12-02 | Tachi-S Co., Ltd. | Locking/unlocking mechanism for headrest |
-
2004
- 2004-12-03 US US11/003,578 patent/US7285168B2/en not_active Expired - Fee Related
-
2005
- 2005-07-05 TW TW094122678A patent/TWI330254B/zh not_active IP Right Cessation
- 2005-07-27 JP JP2005217342A patent/JP4500744B2/ja not_active Expired - Fee Related
- 2005-08-03 FR FR0508297A patent/FR2874263B1/fr not_active Expired - Fee Related
- 2005-08-09 RU RU2005125399/28A patent/RU2365905C2/ru not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
FR2874263A1 (fr) | 2006-02-17 |
US20060032430A1 (en) | 2006-02-16 |
RU2005125399A (ru) | 2007-02-20 |
US7285168B2 (en) | 2007-10-23 |
JP2006053141A (ja) | 2006-02-23 |
TWI330254B (en) | 2010-09-11 |
JP4500744B2 (ja) | 2010-07-14 |
TW200608001A (en) | 2006-03-01 |
RU2365905C2 (ru) | 2009-08-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20160429 |