CH574107A5 - - Google Patents

Info

Publication number
CH574107A5
CH574107A5 CH1480972A CH1480972A CH574107A5 CH 574107 A5 CH574107 A5 CH 574107A5 CH 1480972 A CH1480972 A CH 1480972A CH 1480972 A CH1480972 A CH 1480972A CH 574107 A5 CH574107 A5 CH 574107A5
Authority
CH
Switzerland
Application number
CH1480972A
Original Assignee
Merigoux Henri
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Merigoux Henri filed Critical Merigoux Henri
Priority to CH1480972A priority Critical patent/CH574107A5/xx
Priority to FR7335940A priority patent/FR2203515A5/fr
Priority to DE19732350516 priority patent/DE2350516C3/de
Priority to US404247A priority patent/US3870880A/en
Publication of CH574107A5 publication Critical patent/CH574107A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH1480972A 1972-10-11 1972-10-11 CH574107A5 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CH1480972A CH574107A5 (fr) 1972-10-11 1972-10-11
FR7335940A FR2203515A5 (fr) 1972-10-11 1973-10-09
DE19732350516 DE2350516C3 (de) 1972-10-11 1973-10-09 Verfahren und Vorrichtung zum Bestimmen der kristallographischen Orientierung eines Einkristalls
US404247A US3870880A (en) 1972-10-11 1973-10-09 Process and device for studying the structure of single crystals

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1480972A CH574107A5 (fr) 1972-10-11 1972-10-11

Publications (1)

Publication Number Publication Date
CH574107A5 true CH574107A5 (fr) 1976-03-31

Family

ID=4404000

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1480972A CH574107A5 (fr) 1972-10-11 1972-10-11

Country Status (3)

Country Link
US (1) US3870880A (fr)
CH (1) CH574107A5 (fr)
FR (1) FR2203515A5 (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4053748A (en) * 1975-12-01 1977-10-11 Horst William Kueppers Techniques for determining the peak angle of response of piezoelectric crystals and other radiation-sensitive resonant devices
GB8325544D0 (en) * 1983-09-23 1983-10-26 Howe S H Orienting crystals
GB8607481D0 (en) * 1986-03-26 1986-04-30 Howe S Grading orientation errors in crystal specimens
GB8607482D0 (en) * 1986-03-26 1986-04-30 Howe S Orientation of crystals
JPH01187441A (ja) * 1988-01-22 1989-07-26 Rigaku Denki Kk Ｘ線回折装置の三軸回転ゴニオメータ
US5126676A (en) * 1989-11-27 1992-06-30 The United States Of America As Represented By The United States Department Of Energy Gas amplified ionization detector for gas chromatography
US7285168B2 (en) * 2004-08-10 2007-10-23 Efg Elektrotechnische Fabrikations-Und Grosshandelsgesellschaft Mnb Method and apparatus for the measurement, orientation and fixation of at least one single crystal
US8212868B2 (en) * 2006-03-30 2012-07-03 Gemvision Corporation, L.L.C. Full image jewelry positioner
US7942276B2 (en) * 2007-07-31 2011-05-17 Eric Johnson Rotatable article display device and method for use
US8499940B2 (en) * 2007-07-31 2013-08-06 America's Collectibles Network Rotatable article display device and method
EP2481322B1 (fr) * 2011-01-28 2014-03-12 Tissot S.A. Présentoir pour montre

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2619600A (en) * 1950-07-13 1952-11-25 Philips Lab Inc X-ray spectrometry
US2798957A (en) * 1953-09-08 1957-07-09 Gen Electric Reflection X-ray diffraction apparatus and method
US2819405A (en) * 1954-03-26 1958-01-07 Bell Telephone Labor Inc Automatic recording diffractometer and plotter
US3448265A (en) * 1966-06-01 1969-06-03 Wallace H Samuelson Piezo-electric crystal manufacturing apparatus and method for location of atomic planes relative to the crystal surface

Also Published As

Publication number Publication date
DE2350516A1 (de) 1974-05-02
FR2203515A5 (fr) 1974-05-10
DE2350516B2 (de) 1977-05-26
US3870880A (en) 1975-03-11

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Legal Events

Date Code Title Description
PL Patent ceased