FR2771510B1 - Cellule de test pour circuit integre et circuit integre l'incorporant - Google Patents

Cellule de test pour circuit integre et circuit integre l'incorporant

Info

Publication number
FR2771510B1
FR2771510B1 FR9714647A FR9714647A FR2771510B1 FR 2771510 B1 FR2771510 B1 FR 2771510B1 FR 9714647 A FR9714647 A FR 9714647A FR 9714647 A FR9714647 A FR 9714647A FR 2771510 B1 FR2771510 B1 FR 2771510B1
Authority
FR
France
Prior art keywords
integrated circuit
same
test cell
incorporating
circuit incorporating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9714647A
Other languages
English (en)
Other versions
FR2771510A1 (fr
Inventor
Irene Serre
Charles Odinot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Priority to FR9714647A priority Critical patent/FR2771510B1/fr
Publication of FR2771510A1 publication Critical patent/FR2771510A1/fr
Application granted granted Critical
Publication of FR2771510B1 publication Critical patent/FR2771510B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
FR9714647A 1997-11-21 1997-11-21 Cellule de test pour circuit integre et circuit integre l'incorporant Expired - Fee Related FR2771510B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9714647A FR2771510B1 (fr) 1997-11-21 1997-11-21 Cellule de test pour circuit integre et circuit integre l'incorporant

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9714647A FR2771510B1 (fr) 1997-11-21 1997-11-21 Cellule de test pour circuit integre et circuit integre l'incorporant

Publications (2)

Publication Number Publication Date
FR2771510A1 FR2771510A1 (fr) 1999-05-28
FR2771510B1 true FR2771510B1 (fr) 2000-05-12

Family

ID=9513651

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9714647A Expired - Fee Related FR2771510B1 (fr) 1997-11-21 1997-11-21 Cellule de test pour circuit integre et circuit integre l'incorporant

Country Status (1)

Country Link
FR (1) FR2771510B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105593694B (zh) 2014-08-15 2019-02-12 华为技术有限公司 测试装置和可测试性异步电路

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63182585A (ja) * 1987-01-26 1988-07-27 Toshiba Corp テスト容易化機能を備えた論理回路
US5005173A (en) * 1988-12-07 1991-04-02 Texas Instruments Incorporated Parallel module testing
DE3923764C1 (fr) * 1989-07-18 1990-08-02 Siemens Ag, 1000 Berlin Und 8000 Muenchen, De
US5533032A (en) * 1991-10-28 1996-07-02 Sequoia Semiconductor, Inc. Built-in self-test global clock drive architecture
US5592493A (en) * 1994-09-13 1997-01-07 Motorola Inc. Serial scan chain architecture for a data processing system and method of operation
JP3652765B2 (ja) * 1994-12-16 2005-05-25 テキサス インスツルメンツ インコーポレイテツド 低オーバーヘッドの入力および出力境界走査セル

Also Published As

Publication number Publication date
FR2771510A1 (fr) 1999-05-28

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20070731