FR2720162B1 - Procédé de caractérisation d'événements dans des données numériques acquises. - Google Patents

Procédé de caractérisation d'événements dans des données numériques acquises.

Info

Publication number
FR2720162B1
FR2720162B1 FR9406171A FR9406171A FR2720162B1 FR 2720162 B1 FR2720162 B1 FR 2720162B1 FR 9406171 A FR9406171 A FR 9406171A FR 9406171 A FR9406171 A FR 9406171A FR 2720162 B1 FR2720162 B1 FR 2720162B1
Authority
FR
France
Prior art keywords
digital data
acquired digital
characterizing events
characterizing
events
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9406171A
Other languages
English (en)
Other versions
FR2720162A1 (fr
Inventor
Duwayne R Anderson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US08/065,724 priority Critical patent/US5365328A/en
Priority to JP6128172A priority patent/JP2727058B2/ja
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to FR9406171A priority patent/FR2720162B1/fr
Priority to DE4417838A priority patent/DE4417838B4/de
Publication of FR2720162A1 publication Critical patent/FR2720162A1/fr
Application granted granted Critical
Publication of FR2720162B1 publication Critical patent/FR2720162B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
FR9406171A 1993-05-21 1994-05-20 Procédé de caractérisation d'événements dans des données numériques acquises. Expired - Fee Related FR2720162B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US08/065,724 US5365328A (en) 1993-05-21 1993-05-21 Locating the position of an event in acquired digital data at sub-sample spacing
JP6128172A JP2727058B2 (ja) 1993-05-21 1994-05-18 事象特性測定方法
FR9406171A FR2720162B1 (fr) 1993-05-21 1994-05-20 Procédé de caractérisation d'événements dans des données numériques acquises.
DE4417838A DE4417838B4 (de) 1993-05-21 1994-05-20 Verfahren zum Charakterisieren eines nicht-reflektierenden Ereignisses in einem durch optische Zeitbereichs-Reflektometrie erhaltenen Digitaldaten-Signalzug

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/065,724 US5365328A (en) 1993-05-21 1993-05-21 Locating the position of an event in acquired digital data at sub-sample spacing
FR9406171A FR2720162B1 (fr) 1993-05-21 1994-05-20 Procédé de caractérisation d'événements dans des données numériques acquises.

Publications (2)

Publication Number Publication Date
FR2720162A1 FR2720162A1 (fr) 1995-11-24
FR2720162B1 true FR2720162B1 (fr) 1996-08-09

Family

ID=26231189

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9406171A Expired - Fee Related FR2720162B1 (fr) 1993-05-21 1994-05-20 Procédé de caractérisation d'événements dans des données numériques acquises.

Country Status (4)

Country Link
US (1) US5365328A (fr)
JP (1) JP2727058B2 (fr)
DE (1) DE4417838B4 (fr)
FR (1) FR2720162B1 (fr)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5479251A (en) * 1993-12-30 1995-12-26 Corning Incorporated Methods for determining optical properties of optical waveguide fibers using an optical time domain reflectometer
US5528356A (en) * 1995-03-20 1996-06-18 Tektronix, Inc. Apparatus and method for displaying multiple sample spacing waveform segments
JP2914225B2 (ja) * 1995-06-30 1999-06-28 安藤電気株式会社 光ファイバの試験方法
AU2422797A (en) * 1996-03-28 1997-10-17 Bio-Analytics, Inc. Doing Business As Biomedware Method for measuring a degree of association for dimensionally referenced data
US5708500A (en) * 1997-02-04 1998-01-13 Tektronix, Inc. Multimode optical time domain reflectometer having improved resolution
JPH10274592A (ja) * 1997-03-31 1998-10-13 Ando Electric Co Ltd 光ファイバの試験方法
US6104197A (en) * 1997-06-02 2000-08-15 Tektronix, Inc. Apparatus for acquiring waveform data from a metallic transmission cable
US6195614B1 (en) 1997-06-02 2001-02-27 Tektronix, Inc. Method of characterizing events in acquired waveform data from a metallic transmission cable
FI981990A (fi) 1998-09-15 2000-03-16 Nokia Networks Oy Mittausmenetelmä ja mittauslaite
IL136177A (en) * 2000-05-16 2005-09-25 Eci Telecom Ltd Optical transponder and automatic optical signal type identification method for use therewith
US6674518B1 (en) * 2002-07-01 2004-01-06 At&T Corp. Method and apparatus for optical time domain reflectometry (OTDR) analysis
US7683827B2 (en) 2004-12-15 2010-03-23 Valeo Radar Systems, Inc. System and method for reducing the effect of a radar interference signal
US7403153B2 (en) * 2004-12-15 2008-07-22 Valeo Raytheon Systems, Inc. System and method for reducing a radar interference signal
TW200839558A (en) * 2007-03-23 2008-10-01 Promos Technologies Inc Method of recognizing waveforms and method of dynamic falut detection using the same
HUE043333T2 (hu) 2010-05-27 2019-08-28 Exfo Inc Többszörös akvizíciós OTDR eljárás és eszköz
KR20150113730A (ko) * 2014-03-31 2015-10-08 한국전자통신연구원 비반사 장애를 구분하는 광링크 장애 분석 장치 및 방법
CN104052542B (zh) * 2014-06-23 2016-06-08 武汉光迅科技股份有限公司 在线模式下检测otdr曲线末端事件定位光纤断点的方法
MX368131B (es) * 2014-11-04 2019-09-19 Afl Telecommunications Llc Técnica de fusión para pistas de otdr capturadas al usar diferentes ajustes.
US9641243B2 (en) 2015-02-23 2017-05-02 Exfo Inc. Safe-mode OTDR method
CN105910796A (zh) * 2016-04-07 2016-08-31 天津纤测道客科技发展有限公司 光缆链路事件对比方法及计算单元
EP3249375A1 (fr) * 2016-05-27 2017-11-29 Xieon Networks S.à r.l. Otdr à précision accrue et zone morte réduite utilisant la superposition d'impulsions avec variation de retard de signal d'horloge
US10101240B1 (en) 2017-04-27 2018-10-16 Viavi Solutions France SAS Optical time-domain reflectometer device including combined trace display
CN109768826B (zh) * 2017-11-09 2022-01-28 中兴通讯股份有限公司 数据处理方法、装置及设备、计算机可读存储介质
WO2020044659A1 (fr) * 2018-08-30 2020-03-05 日本電気株式会社 Réflectomètre temporel optique, méthode d'essai de trajet de transmission optique, et système d'essai de trajet de transmission optique
EP3758256B1 (fr) * 2019-06-07 2021-12-08 EXFO Inc. Détection de mesure otdr dupliquée
WO2021038648A1 (fr) * 2019-08-23 2021-03-04 日本電信電話株式会社 Procédé de test de fibre optique, dispositif de test de fibre optique et programme
US11650128B2 (en) 2020-06-30 2023-05-16 Exfo Inc. Optical fiber recognition using backscattering pattern
US11879802B2 (en) 2020-10-22 2024-01-23 Exfo Inc. Testing optical fiber link continuity using OTDR backscattering patterns

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2241585C3 (de) * 1972-08-25 1975-03-27 Siemens Ag, 1000 Berlin Und 8000 Muenchen Korrelationsempfänger für Pseudo-Noise-Folgen
US4038540A (en) * 1976-04-19 1977-07-26 Honeywell Inc. Quadrature correlation pulse detector
JPS5961739A (ja) * 1982-09-30 1984-04-09 Anritsu Corp 光ケ−ブルの接続損失測定装置
JPS60253836A (ja) * 1984-05-30 1985-12-14 Tohoku Electric Power Co Inc 光フアイバアナライザ
JPH01141331A (ja) * 1987-11-27 1989-06-02 Anritsu Corp 光パルス試験器
JPH0298647A (ja) * 1988-10-04 1990-04-11 Ando Electric Co Ltd 光反射率測定器
US4983037A (en) * 1989-05-05 1991-01-08 Tektronix, Inc. Estimation of fiber loss and return signal power
US5115439A (en) * 1989-11-29 1992-05-19 Spectra-Physics Lasers, Inc. Pole piece to shape axial magnetic field in gas laser
US5155439A (en) * 1989-12-12 1992-10-13 Tektronix, Inc. Method of detecting and characterizing anomalies in a propagative medium
US5069544A (en) * 1990-04-12 1991-12-03 Minnesota Mining And Manufacturing Company Adaptive pulse width optical fault finder
JP2951701B2 (ja) * 1990-07-25 1999-09-20 株式会社アドバンテスト 光パルス試験器

Also Published As

Publication number Publication date
DE4417838A1 (de) 1994-12-01
DE4417838B4 (de) 2006-02-16
JP2727058B2 (ja) 1998-03-11
US5365328A (en) 1994-11-15
JPH0719996A (ja) 1995-01-20
FR2720162A1 (fr) 1995-11-24

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20070131