FR2654526B1 - - Google Patents

Info

Publication number
FR2654526B1
FR2654526B1 FR9013958A FR9013958A FR2654526B1 FR 2654526 B1 FR2654526 B1 FR 2654526B1 FR 9013958 A FR9013958 A FR 9013958A FR 9013958 A FR9013958 A FR 9013958A FR 2654526 B1 FR2654526 B1 FR 2654526B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9013958A
Other languages
French (fr)
Other versions
FR2654526A1 (fr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP13131889U external-priority patent/JP2516837Y2/ja
Priority claimed from JP13476589U external-priority patent/JPH087378Y2/ja
Application filed filed Critical
Publication of FR2654526A1 publication Critical patent/FR2654526A1/fr
Application granted granted Critical
Publication of FR2654526B1 publication Critical patent/FR2654526B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/04—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification
    • G02B7/10—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification by relative axial movement of several lenses, e.g. of varifocal objective lens
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B7/00—Control of exposure by setting shutters, diaphragms or filters, separately or conjointly
    • G03B7/20—Control of exposure by setting shutters, diaphragms or filters, separately or conjointly in accordance with change of lens

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Lens Barrels (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Structure And Mechanism Of Cameras (AREA)
FR9013958A 1989-11-10 1990-11-09 Dispositif de montage d'une plaque de codage. Granted FR2654526A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP13131889U JP2516837Y2 (ja) 1989-11-10 1989-11-10 コード板取付け構造
JP13476589U JPH087378Y2 (ja) 1989-11-20 1989-11-20 コード板取付け構造

Publications (2)

Publication Number Publication Date
FR2654526A1 FR2654526A1 (fr) 1991-05-17
FR2654526B1 true FR2654526B1 (enExample) 1993-02-26

Family

ID=26466181

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9013958A Granted FR2654526A1 (fr) 1989-11-10 1990-11-09 Dispositif de montage d'une plaque de codage.

Country Status (4)

Country Link
US (1) US5267088A (enExample)
DE (1) DE4035549A1 (enExample)
FR (1) FR2654526A1 (enExample)
GB (1) GB2240132B (enExample)

Families Citing this family (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
JP2584208Y2 (ja) * 1992-07-13 1998-10-30 旭光学工業株式会社 ズームレンズ鏡筒のピント調整装置
JP3313768B2 (ja) * 1992-07-23 2002-08-12 キヤノン株式会社 レンズ鏡筒
US5715099A (en) * 1994-04-28 1998-02-03 Ricoh Company, Ltd. Mounting method and structure for a solid-state image pickup element in an image reading-out apparatus
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
KR0177977B1 (ko) * 1995-04-14 1999-05-15 이대원 바코드를 이용한 교환 렌즈의 최대/최소 조리개치 검출장치
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5809361A (en) * 1996-01-26 1998-09-15 Asahi Kogaku Kogyo Kabushiki Kaisha Flexible printed circuit board
US5907725A (en) * 1996-01-26 1999-05-25 Asahi Kogaku Kogyo Kabushiki Kaisha Electronically controlled camera
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
US6970634B2 (en) 2001-05-04 2005-11-29 Cascade Microtech, Inc. Fiber optic wafer probe
AU2002327490A1 (en) 2001-08-21 2003-06-30 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
EP1509776A4 (en) 2002-05-23 2010-08-18 Cascade Microtech Inc PROBE TO TEST ANY TESTING EQUIPMENT
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
DE112004002554T5 (de) 2003-12-24 2006-11-23 Cascade Microtech, Inc., Beaverton Active wafer probe
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
WO2006031646A2 (en) 2004-09-13 2006-03-23 Cascade Microtech, Inc. Double sided probing structures
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
WO2007146285A2 (en) 2006-06-09 2007-12-21 Cascade Microtech, Inc. Differential signal probe with integral balun
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
JP6614883B2 (ja) * 2014-12-01 2019-12-04 キヤノン株式会社 操作部材及び電子機器

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1845686U (de) * 1961-08-31 1962-01-25 Braun Camera Werk Objektiv fuer kameras, projektoren od. dgl.
JPS5311241U (enExample) * 1976-07-12 1978-01-30
GB2090906A (en) * 1980-11-14 1982-07-21 Webco Ind Rubber Ltd Connecting device
JPS5941014A (ja) * 1982-08-31 1984-03-07 Canon Inc コ−ド板
JPS6055307A (ja) * 1983-09-07 1985-03-30 Asahi Optical Co Ltd レンズ枠保持装置
JPS6059311A (ja) * 1983-09-13 1985-04-05 Matsushita Electric Ind Co Ltd カメラ鏡胴装置
US4750821A (en) * 1984-08-24 1988-06-14 Canon Kabushiki Kaisha Zoom lens assembly
JPS61113042A (ja) * 1984-11-08 1986-05-30 Konishiroku Photo Ind Co Ltd 沈胴カメラの電気的接続装置
ATE141693T1 (de) * 1986-05-12 1996-09-15 Asahi Optical Co Ltd Zwischenlinsenverschlusscamera mit zoomobjektiv
US5012273B1 (en) * 1986-05-12 1996-10-01 Asahi Optical Co Ltd Lens shutter type of camera including zoom lens
JP2510961B2 (ja) * 1987-08-12 1996-06-26 マルコン電子株式会社 電圧非直線抵抗体
US4785320A (en) * 1987-08-31 1988-11-15 Liberty Ii Kenneth L Camera lens focusing aid
JPH01150109A (ja) * 1987-12-08 1989-06-13 Canon Inc ズームレンズ鏡筒
JPH0753052Y2 (ja) * 1989-05-22 1995-12-06 旭光学工業株式会社 レンズのフレキシブル基板取付構造

Also Published As

Publication number Publication date
GB9024234D0 (en) 1990-12-19
GB2240132B (en) 1994-05-04
US5267088A (en) 1993-11-30
GB2240132A (en) 1991-07-24
DE4035549A1 (de) 1991-05-16
FR2654526A1 (fr) 1991-05-17
DE4035549C2 (enExample) 1993-07-22

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20060731