FR2595474B1 - Dispositif de controle et de verification du fonctionnement de blocs internes a un circuit integre - Google Patents

Dispositif de controle et de verification du fonctionnement de blocs internes a un circuit integre

Info

Publication number
FR2595474B1
FR2595474B1 FR8602985A FR8602985A FR2595474B1 FR 2595474 B1 FR2595474 B1 FR 2595474B1 FR 8602985 A FR8602985 A FR 8602985A FR 8602985 A FR8602985 A FR 8602985A FR 2595474 B1 FR2595474 B1 FR 2595474B1
Authority
FR
France
Prior art keywords
verifying
monitoring
integrated circuit
blocks internal
blocks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8602985A
Other languages
English (en)
Other versions
FR2595474A1 (fr
Inventor
Gerard Chauvel
Jean Ciroux
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments France SAS
Original Assignee
Texas Instruments France SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments France SAS filed Critical Texas Instruments France SAS
Priority to FR8602985A priority Critical patent/FR2595474B1/fr
Priority to US07/021,112 priority patent/US4811344A/en
Priority to JP62048640A priority patent/JP2816146B2/ja
Publication of FR2595474A1 publication Critical patent/FR2595474A1/fr
Application granted granted Critical
Publication of FR2595474B1 publication Critical patent/FR2595474B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
FR8602985A 1986-03-04 1986-03-04 Dispositif de controle et de verification du fonctionnement de blocs internes a un circuit integre Expired FR2595474B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR8602985A FR2595474B1 (fr) 1986-03-04 1986-03-04 Dispositif de controle et de verification du fonctionnement de blocs internes a un circuit integre
US07/021,112 US4811344A (en) 1986-03-04 1987-03-03 Device for the testing and checking of the operation of blocks within an integrated circuit
JP62048640A JP2816146B2 (ja) 1986-03-04 1987-03-03 回路動作テスト装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8602985A FR2595474B1 (fr) 1986-03-04 1986-03-04 Dispositif de controle et de verification du fonctionnement de blocs internes a un circuit integre

Publications (2)

Publication Number Publication Date
FR2595474A1 FR2595474A1 (fr) 1987-09-11
FR2595474B1 true FR2595474B1 (fr) 1988-06-24

Family

ID=9332723

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8602985A Expired FR2595474B1 (fr) 1986-03-04 1986-03-04 Dispositif de controle et de verification du fonctionnement de blocs internes a un circuit integre

Country Status (3)

Country Link
US (1) US4811344A (fr)
JP (1) JP2816146B2 (fr)
FR (1) FR2595474B1 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5256472A (en) * 1988-12-05 1993-10-26 Denki Kagaku Kogyo Kabushiki Kaisha Fluorine resin type weather-resistant film
JP2739976B2 (ja) * 1988-12-05 1998-04-15 電気化学工業株式会社 フツ素樹脂系フイルム積層体
JP2776549B2 (ja) * 1989-04-03 1998-07-16 日本電気アイシーマイコンシステム 株式会社 半導体集積回路
GB9008544D0 (en) * 1990-04-17 1990-06-13 Smiths Industries Plc Electrical assemblies
DE59010092D1 (de) * 1990-05-31 1996-03-07 Siemens Ag Integrierter Halbleiterspeicher
US5309447A (en) * 1991-06-03 1994-05-03 At&T Bell Laboratories Space compression technique for pseudo-exhaustive self-testing of digital electronic circuits
JP2884847B2 (ja) * 1991-10-03 1999-04-19 三菱電機株式会社 故障検出機能を備えた半導体集積回路装置の製造方法
US5951703A (en) * 1993-06-28 1999-09-14 Tandem Computers Incorporated System and method for performing improved pseudo-random testing of systems having multi driver buses
US5938779A (en) * 1997-02-27 1999-08-17 Alcatel Alsthom Compagnie Generale D'electricite Asic control and data retrieval method and apparatus having an internal collateral test interface function
US6119194A (en) * 1998-03-19 2000-09-12 Advanced Micro Devices, Inc. Method and apparatus for monitoring universal serial bus activity
US6760880B1 (en) * 1998-09-10 2004-07-06 Ceva D.S.P. Ltd. Scalar product and parity check
CN112329637B (zh) * 2020-11-06 2021-12-10 华北电力大学 一种利用模式特征的负荷开关事件检测方法和系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2256706A5 (fr) * 1973-12-27 1975-07-25 Cii
US4225917A (en) * 1976-02-05 1980-09-30 Motorola, Inc. Error driven interrupt for polled MPU systems
US4317199A (en) * 1980-01-31 1982-02-23 Tektronix, Inc. Diagnostic extender test apparatus
JPS59216256A (ja) * 1983-05-24 1984-12-06 Iwatsu Electric Co Ltd マイクロプロセツサの動作解析装置
DE3332626A1 (de) * 1983-09-09 1985-03-28 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung zum erkennen von statischen und dynamischen fehlern in schaltungsbaugruppen

Also Published As

Publication number Publication date
US4811344A (en) 1989-03-07
JP2816146B2 (ja) 1998-10-27
JPS631984A (ja) 1988-01-06
FR2595474A1 (fr) 1987-09-11

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