FR2585476B1 - Dispositif et procede de localisation de defauts pour l'essai de plaquettes de circuit - Google Patents

Dispositif et procede de localisation de defauts pour l'essai de plaquettes de circuit

Info

Publication number
FR2585476B1
FR2585476B1 FR868609679A FR8609679A FR2585476B1 FR 2585476 B1 FR2585476 B1 FR 2585476B1 FR 868609679 A FR868609679 A FR 868609679A FR 8609679 A FR8609679 A FR 8609679A FR 2585476 B1 FR2585476 B1 FR 2585476B1
Authority
FR
France
Prior art keywords
circuit boards
testing circuit
locating faults
faults
locating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR868609679A
Other languages
English (en)
Other versions
FR2585476A1 (fr
Inventor
Marshall H Scott
John D Polstra
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
John Fluke Manufacturing Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by John Fluke Manufacturing Co Inc filed Critical John Fluke Manufacturing Co Inc
Publication of FR2585476A1 publication Critical patent/FR2585476A1/fr
Application granted granted Critical
Publication of FR2585476B1 publication Critical patent/FR2585476B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S706/00—Data processing: artificial intelligence
    • Y10S706/902—Application using ai with detail of the ai system
    • Y10S706/911—Nonmedical diagnostics
    • Y10S706/916—Electronic or computer, internal or network, circuit
FR868609679A 1985-07-29 1986-07-03 Dispositif et procede de localisation de defauts pour l'essai de plaquettes de circuit Expired - Fee Related FR2585476B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/761,027 US4709366A (en) 1985-07-29 1985-07-29 Computer assisted fault isolation in circuit board testing

Publications (2)

Publication Number Publication Date
FR2585476A1 FR2585476A1 (fr) 1987-01-30
FR2585476B1 true FR2585476B1 (fr) 1990-08-10

Family

ID=25060890

Family Applications (1)

Application Number Title Priority Date Filing Date
FR868609679A Expired - Fee Related FR2585476B1 (fr) 1985-07-29 1986-07-03 Dispositif et procede de localisation de defauts pour l'essai de plaquettes de circuit

Country Status (6)

Country Link
US (1) US4709366A (fr)
JP (1) JPS6228844A (fr)
CN (2) CN1016102B (fr)
DE (1) DE3625462A1 (fr)
FR (1) FR2585476B1 (fr)
GB (2) GB2178543B (fr)

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US5157668A (en) * 1989-07-05 1992-10-20 Applied Diagnostics, Inc. Method and apparatus for locating faults in electronic units
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US5043987A (en) * 1989-11-07 1991-08-27 Array Analysis, Inc. Method for calculating adaptive inference test figure of merit
CA2038295A1 (fr) * 1990-03-16 1991-09-17 Brian Jerrold Arkin Processeur rapide d'information sur les defaillances
US5280486A (en) * 1990-03-16 1994-01-18 Teradyne, Inc. High speed fail processor
US5252914A (en) * 1990-08-06 1993-10-12 Ericsson Ge Mobile Communications Inc. Method of constructing and testing a circuit board designed for early diagnostics
EP0474439B1 (fr) * 1990-09-07 1997-08-06 Schlumberger Technologies Limited Procédé de test de circuit
US5122753A (en) * 1990-12-20 1992-06-16 Microelectronics And Computer Technology Corporation Method of testing electrical components for defects
DE4142393A1 (de) * 1990-12-28 1992-07-02 Gen Electric Verfahren und anordnung zum isolieren von fehlerhaften komponenten in einem system
US5127012A (en) * 1991-02-19 1992-06-30 Eastman Kodak Company Diagnostic and administrative device for document production apparatus
US5168216A (en) * 1991-05-24 1992-12-01 International Business Machines Corporation System for testing high-speed digital circuits
US5305437A (en) * 1991-09-03 1994-04-19 International Business Machines Corporation Graphical system descriptor method and system
DE69229389T2 (de) * 1992-02-25 1999-10-07 Hewlett Packard Co Testsystem für Schaltkreise
US5455517A (en) * 1992-06-09 1995-10-03 International Business Machines Corporation Data output impedance control
CA2099737C (fr) * 1992-09-08 1997-08-19 Terrence Kent Barrington Systeme de verification d'elements de reseau de communication
US5504432A (en) * 1993-08-31 1996-04-02 Hewlett-Packard Company System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment
US5390194A (en) * 1993-11-17 1995-02-14 Grumman Aerospace Corporation ATG test station
DE4429556C2 (de) * 1994-08-19 1999-10-14 Siemens Ag Verfahren zur Ermittlung fehlerbehafteter Schaltungsknoten einer elektronischen Schaltung
WO1997016743A1 (fr) * 1995-11-02 1997-05-09 Genrad, Inc. Elaboration conditionnelle d'instructions de test en fonction de la configuration des composants
WO1997016742A1 (fr) * 1995-11-02 1997-05-09 Genrad, Inc. Elaboration conditionnelle d'instructions d'essai en fonction des statistiques de defectuosites de composants
US5777873A (en) * 1996-04-29 1998-07-07 Mitsubishi Semiconductor America, Inc. Automated test fixture control system
US6057679A (en) * 1998-06-12 2000-05-02 Credence Systems Corporation Integrated circuit tester having amorphous logic for real-time data analysis
US6356853B1 (en) * 1999-07-23 2002-03-12 Daniel B. Sullivan Enhancing voltmeter functionality
US20020188904A1 (en) * 2001-06-11 2002-12-12 International Business Machines Corporation Efficiency of fault simulation by logic backtracking
US6998849B2 (en) * 2003-09-27 2006-02-14 Agilent Technologies, Inc. Capacitive sensor measurement method for discrete time sampled system for in-circuit test
US8226475B2 (en) * 2004-10-01 2012-07-24 Wms Gaming Inc. Gaming device with facsimile graphical user interface
US8287368B2 (en) * 2005-03-21 2012-10-16 Wms Gaming Inc. Wagering game with diagnostic graphical user interface
US7370257B2 (en) * 2005-04-08 2008-05-06 Lsi Logic Corporation Test vehicle data analysis
US7546514B2 (en) * 2005-04-11 2009-06-09 Hewlett-Packard Development Company, L.P. Chip correct and fault isolation in computer memory systems
EP1724599B1 (fr) * 2005-05-20 2007-08-22 Agilent Technologies, Inc. Dispositif d'essai avec l'adaptation des paramètres de l'essai
US20080088325A1 (en) * 2006-09-01 2008-04-17 Murray David W Method and system for performing embedded diagnostic application at subassembly and component level
US7805696B2 (en) * 2007-10-02 2010-09-28 International Business Machines Corporation Method for fast identification of available reference designators in a design automation system
US20100076716A1 (en) * 2008-09-19 2010-03-25 Honeywell International Inc. Portable electromechanical actuator test system
CN101487851B (zh) * 2008-12-30 2011-04-13 南京协力电子科技集团有限公司 一种测试探针装置
CN103137209B (zh) * 2012-12-31 2015-11-25 熊猫电子集团有限公司 一种非焊接在路检测贴片ram的系统和方法
DE102014102918A1 (de) * 2013-03-05 2014-09-11 Flextronics Ap, Llc Selbstöffnungs- und Auswerfsystem mit systemintegrierter Testhalterung Erfinder
CN103542866A (zh) * 2013-10-21 2014-01-29 李国栋 一种惯性定位定向系统电路检测设备
CN106815425B (zh) * 2017-01-12 2018-04-27 侯海亭 多层pcb板故障检测方法及系统
TWI705258B (zh) * 2019-01-25 2020-09-21 新範科技有限公司 電路檢修系統
CN113778062A (zh) * 2021-09-16 2021-12-10 四川中鼎智能技术有限公司 基于激励信号的设备控制异常检测方法及装置

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GB1554363A (en) * 1976-02-24 1979-10-17 Genrad Inc Automatic fault-probing method and apparatus for checking electrical circuits and the like
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US4114093A (en) * 1976-12-17 1978-09-12 Everett/Charles, Inc. Network testing method and apparatus
DD133599A1 (de) * 1977-10-28 1979-01-10 Ekkehard Feige Anordnung zur pruefung elektronischer baugruppen
US4194113A (en) * 1978-04-13 1980-03-18 Ncr Corporation Method and apparatus for isolating faults in a logic circuit
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
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US4228537A (en) * 1978-08-29 1980-10-14 Genrad, Inc. Method of and apparatus for automatic fault diagnosis of electrical circuits employing on-line simulation of faults in such circuits during diagnosis
DE2929123C2 (de) * 1979-07-18 1984-08-30 Siemens AG, 1000 Berlin und 8000 München Fehlerermittlung von elektrischen Flachbaugruppen
US4459695A (en) * 1979-11-07 1984-07-10 Davy Mcgee (Sheffield) Limited Fault finding in an industrial installation by means of a computer
GB2086061B (en) * 1980-10-13 1985-05-22 Marconi Instruments Ltd Automatic test systems
US4565966A (en) * 1983-03-07 1986-01-21 Kollmorgen Technologies Corporation Method and apparatus for testing of electrical interconnection networks
JPS59173852A (ja) * 1983-03-23 1984-10-02 Yokogawa Hokushin Electric Corp 試験装置
US4642561B1 (en) * 1983-06-13 1993-09-07 Hewlett-Packard Company Circuit tester having on-the-fly comparison of actual and expected signals on test pins and improved homing capability

Also Published As

Publication number Publication date
FR2585476A1 (fr) 1987-01-30
US4709366A (en) 1987-11-24
GB2178543A (en) 1987-02-11
GB8826406D0 (en) 1988-12-14
CN86101612A (zh) 1987-01-28
CN1016102B (zh) 1992-04-01
CN1060535A (zh) 1992-04-22
GB2209225B (en) 1990-01-24
GB2178543B (en) 1990-01-24
GB8615906D0 (en) 1986-08-06
GB2209225A (en) 1989-05-04
JPS6228844A (ja) 1987-02-06
DE3625462A1 (de) 1987-01-29

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Legal Events

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ST Notification of lapse
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