FR2561480B1 - Procede et circuit de multiplexage a relais pour un appareil de test de circuits - Google Patents

Procede et circuit de multiplexage a relais pour un appareil de test de circuits

Info

Publication number
FR2561480B1
FR2561480B1 FR8503754A FR8503754A FR2561480B1 FR 2561480 B1 FR2561480 B1 FR 2561480B1 FR 8503754 A FR8503754 A FR 8503754A FR 8503754 A FR8503754 A FR 8503754A FR 2561480 B1 FR2561480 B1 FR 2561480B1
Authority
FR
France
Prior art keywords
circuit
test apparatus
multiplexing method
relay multiplexing
relay
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR8503754A
Other languages
English (en)
French (fr)
Other versions
FR2561480A1 (fr
Inventor
Francis Wrinn Et Mark Solomon Hoffman Joseph
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of FR2561480A1 publication Critical patent/FR2561480A1/fr
Application granted granted Critical
Publication of FR2561480B1 publication Critical patent/FR2561480B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Tests Of Electronic Circuits (AREA)
FR8503754A 1984-03-14 1985-03-14 Procede et circuit de multiplexage a relais pour un appareil de test de circuits Expired - Fee Related FR2561480B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US58957784A 1984-03-14 1984-03-14
US58937384A 1984-03-14 1984-03-14

Publications (2)

Publication Number Publication Date
FR2561480A1 FR2561480A1 (fr) 1985-09-20
FR2561480B1 true FR2561480B1 (fr) 1994-05-20

Family

ID=27080536

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8503754A Expired - Fee Related FR2561480B1 (fr) 1984-03-14 1985-03-14 Procede et circuit de multiplexage a relais pour un appareil de test de circuits

Country Status (3)

Country Link
DE (1) DE3509247A1 (enrdf_load_stackoverflow)
FR (1) FR2561480B1 (enrdf_load_stackoverflow)
GB (1) GB2157922B (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022021837A1 (zh) * 2020-07-29 2022-02-03 中广核核电运营有限公司 一种记忆板件智能测试系统及方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2200465B (en) * 1987-01-16 1991-10-02 Teradyne Inc Automatic test equipment
DE4100634A1 (de) * 1991-01-11 1992-07-16 Adaptronic Ag Pruefvorrichtung
DE19508902A1 (de) * 1995-03-11 1996-09-12 Nadejda Dipl Phys Poskatcheeva Vorrichtung zur Prüfung von Platinen sowie deren Verwendung
CN115856588B (zh) * 2023-02-22 2023-08-04 长鑫存储技术有限公司 芯片测试板及测试方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT983459B (it) * 1973-02-19 1974-10-31 Siemens Spa Italiana Sistema per effettuare prove di collaudo di componenti elettri ci ed elettronici di tipo ana logico
US4348759A (en) * 1979-12-17 1982-09-07 International Business Machines Corporation Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test
EP0103353A3 (en) * 1982-09-13 1986-03-05 Genrad, Inc. Method of and apparatus for multiplexed automatic testing of electronic circuits and the like

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022021837A1 (zh) * 2020-07-29 2022-02-03 中广核核电运营有限公司 一种记忆板件智能测试系统及方法

Also Published As

Publication number Publication date
GB8506560D0 (en) 1985-04-17
GB2157922A (en) 1985-10-30
GB2157922B (en) 1988-01-13
FR2561480A1 (fr) 1985-09-20
DE3509247A1 (de) 1985-11-21
DE3509247C2 (enrdf_load_stackoverflow) 1990-04-26

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Legal Events

Date Code Title Description
ST Notification of lapse