GB2157922B - Relay multiplexing for circuit testers - Google Patents

Relay multiplexing for circuit testers

Info

Publication number
GB2157922B
GB2157922B GB08506560A GB8506560A GB2157922B GB 2157922 B GB2157922 B GB 2157922B GB 08506560 A GB08506560 A GB 08506560A GB 8506560 A GB8506560 A GB 8506560A GB 2157922 B GB2157922 B GB 2157922B
Authority
GB
United Kingdom
Prior art keywords
circuit testers
relay multiplexing
multiplexing
relay
testers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08506560A
Other languages
English (en)
Other versions
GB8506560D0 (en
GB2157922A (en
Inventor
Joseph Francis Wrinn
Mark Soloman Hoffmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of GB8506560D0 publication Critical patent/GB8506560D0/en
Publication of GB2157922A publication Critical patent/GB2157922A/en
Application granted granted Critical
Publication of GB2157922B publication Critical patent/GB2157922B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Tests Of Electronic Circuits (AREA)
GB08506560A 1984-03-14 1985-03-13 Relay multiplexing for circuit testers Expired GB2157922B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US58957784A 1984-03-14 1984-03-14
US58937384A 1984-03-14 1984-03-14

Publications (3)

Publication Number Publication Date
GB8506560D0 GB8506560D0 (en) 1985-04-17
GB2157922A GB2157922A (en) 1985-10-30
GB2157922B true GB2157922B (en) 1988-01-13

Family

ID=27080536

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08506560A Expired GB2157922B (en) 1984-03-14 1985-03-13 Relay multiplexing for circuit testers

Country Status (3)

Country Link
DE (1) DE3509247A1 (enrdf_load_stackoverflow)
FR (1) FR2561480B1 (enrdf_load_stackoverflow)
GB (1) GB2157922B (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2200465B (en) * 1987-01-16 1991-10-02 Teradyne Inc Automatic test equipment
DE4100634A1 (de) * 1991-01-11 1992-07-16 Adaptronic Ag Pruefvorrichtung
DE19508902A1 (de) * 1995-03-11 1996-09-12 Nadejda Dipl Phys Poskatcheeva Vorrichtung zur Prüfung von Platinen sowie deren Verwendung
CN112083309B (zh) * 2020-07-29 2023-11-17 中广核核电运营有限公司 一种记忆板件智能测试系统及方法
CN115856588B (zh) * 2023-02-22 2023-08-04 长鑫存储技术有限公司 芯片测试板及测试方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT983459B (it) * 1973-02-19 1974-10-31 Siemens Spa Italiana Sistema per effettuare prove di collaudo di componenti elettri ci ed elettronici di tipo ana logico
US4348759A (en) * 1979-12-17 1982-09-07 International Business Machines Corporation Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test
EP0103353A3 (en) * 1982-09-13 1986-03-05 Genrad, Inc. Method of and apparatus for multiplexed automatic testing of electronic circuits and the like

Also Published As

Publication number Publication date
GB8506560D0 (en) 1985-04-17
GB2157922A (en) 1985-10-30
FR2561480A1 (fr) 1985-09-20
DE3509247A1 (de) 1985-11-21
FR2561480B1 (fr) 1994-05-20
DE3509247C2 (enrdf_load_stackoverflow) 1990-04-26

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19990313