FR2551210A1 - Procede de controle d'un reseau - Google Patents

Procede de controle d'un reseau Download PDF

Info

Publication number
FR2551210A1
FR2551210A1 FR8407389A FR8407389A FR2551210A1 FR 2551210 A1 FR2551210 A1 FR 2551210A1 FR 8407389 A FR8407389 A FR 8407389A FR 8407389 A FR8407389 A FR 8407389A FR 2551210 A1 FR2551210 A1 FR 2551210A1
Authority
FR
France
Prior art keywords
network
reflection
coefficient
scanning
zone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
FR8407389A
Other languages
English (en)
French (fr)
Inventor
Matsunosuke Masuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Publication of FR2551210A1 publication Critical patent/FR2551210A1/fr
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0269Marks, test patterns or identification means for visual or optical inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16Inspection; Monitoring; Aligning
    • H05K2203/161Using chemical substances, e.g. colored or fluorescent, for facilitating optical or visual inspection
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16Inspection; Monitoring; Aligning
    • H05K2203/163Monitoring a manufacturing process

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FR8407389A 1983-05-11 1984-05-10 Procede de controle d'un reseau Pending FR2551210A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8095483A JPS59206705A (ja) 1983-05-11 1983-05-11 パタ−ン検査方法

Publications (1)

Publication Number Publication Date
FR2551210A1 true FR2551210A1 (fr) 1985-03-01

Family

ID=13732896

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8407389A Pending FR2551210A1 (fr) 1983-05-11 1984-05-10 Procede de controle d'un reseau

Country Status (4)

Country Link
JP (1) JPS59206705A (de)
DE (1) DE3416919A1 (de)
FR (1) FR2551210A1 (de)
GB (1) GB2139754B (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61228302A (ja) * 1985-04-01 1986-10-11 Yanmar Diesel Engine Co Ltd 探知装置
JPS62180250A (ja) * 1986-02-05 1987-08-07 Omron Tateisi Electronics Co 部品実装基板の検査方法
JPS63191041A (ja) * 1987-02-03 1988-08-08 Komori Printing Mach Co Ltd 濃度測定位置合わせ方法
FR2676392A1 (fr) * 1991-05-04 1992-11-20 Heidelberger Druckmasch Ag Dispositif et procede pour controler la qualite d'impression de produits imprimes d'une machine d'impression.
US6529621B1 (en) * 1998-12-17 2003-03-04 Kla-Tencor Mechanisms for making and inspecting reticles
GB2485337A (en) * 2010-11-01 2012-05-16 Plastic Logic Ltd Method for providing device-specific markings on devices

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3645626A (en) * 1970-06-15 1972-02-29 Ibm Apparatus for detecting defects by optical scanning

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3969577A (en) * 1974-10-15 1976-07-13 Westinghouse Electric Corporation System for evaluating similar objects
JPS5413750A (en) * 1977-07-02 1979-02-01 Hokuriku Elect Ind Function voltage divider using resistors

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3645626A (en) * 1970-06-15 1972-02-29 Ibm Apparatus for detecting defects by optical scanning

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
IBM TECHNICAL DISCLOSURE BULLETIN, vol. 25, no. 12, mai 1983, page 6350, New York, US; C.D. ABBOTT et al.: "Templates for substrate inspections" *

Also Published As

Publication number Publication date
JPS59206705A (ja) 1984-11-22
JPH033884B2 (de) 1991-01-21
DE3416919C2 (de) 1987-07-02
DE3416919A1 (de) 1984-11-29
GB2139754B (en) 1986-10-15
GB2139754A (en) 1984-11-14
GB8411625D0 (en) 1984-06-13

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