GB8411625D0 - Pattern examining method - Google Patents

Pattern examining method

Info

Publication number
GB8411625D0
GB8411625D0 GB848411625A GB8411625A GB8411625D0 GB 8411625 D0 GB8411625 D0 GB 8411625D0 GB 848411625 A GB848411625 A GB 848411625A GB 8411625 A GB8411625 A GB 8411625A GB 8411625 D0 GB8411625 D0 GB 8411625D0
Authority
GB
United Kingdom
Prior art keywords
examining method
pattern
pattern examining
examining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB848411625A
Other versions
GB2139754B (en
GB2139754A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Publication of GB8411625D0 publication Critical patent/GB8411625D0/en
Publication of GB2139754A publication Critical patent/GB2139754A/en
Application granted granted Critical
Publication of GB2139754B publication Critical patent/GB2139754B/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0269Marks, test patterns or identification means for visual or optical inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16Inspection; Monitoring; Aligning
    • H05K2203/161Using chemical substances, e.g. colored or fluorescent, for facilitating optical or visual inspection
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16Inspection; Monitoring; Aligning
    • H05K2203/163Monitoring a manufacturing process
GB08411625A 1983-05-11 1984-04-08 A pattern examining method Expired GB2139754B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8095483A JPS59206705A (en) 1983-05-11 1983-05-11 Inspection of pattern

Publications (3)

Publication Number Publication Date
GB8411625D0 true GB8411625D0 (en) 1984-06-13
GB2139754A GB2139754A (en) 1984-11-14
GB2139754B GB2139754B (en) 1986-10-15

Family

ID=13732896

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08411625A Expired GB2139754B (en) 1983-05-11 1984-04-08 A pattern examining method

Country Status (4)

Country Link
JP (1) JPS59206705A (en)
DE (1) DE3416919A1 (en)
FR (1) FR2551210A1 (en)
GB (1) GB2139754B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61228302A (en) * 1985-04-01 1986-10-11 Yanmar Diesel Engine Co Ltd Detection device
JPS62180250A (en) * 1986-02-05 1987-08-07 Omron Tateisi Electronics Co Inspecting method for component package substrate
JPS63191041A (en) * 1987-02-03 1988-08-08 Komori Printing Mach Co Ltd Density measurement positioning method
FR2676392A1 (en) * 1991-05-04 1992-11-20 Heidelberger Druckmasch Ag Device and method for checking the print quality of printed products from a printing machine
US6529621B1 (en) * 1998-12-17 2003-03-04 Kla-Tencor Mechanisms for making and inspecting reticles
GB2485337A (en) * 2010-11-01 2012-05-16 Plastic Logic Ltd Method for providing device-specific markings on devices

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3645626A (en) * 1970-06-15 1972-02-29 Ibm Apparatus for detecting defects by optical scanning
US3969577A (en) * 1974-10-15 1976-07-13 Westinghouse Electric Corporation System for evaluating similar objects
JPS5413750A (en) * 1977-07-02 1979-02-01 Hokuriku Elect Ind Function voltage divider using resistors

Also Published As

Publication number Publication date
JPS59206705A (en) 1984-11-22
DE3416919C2 (en) 1987-07-02
DE3416919A1 (en) 1984-11-29
GB2139754B (en) 1986-10-15
JPH033884B2 (en) 1991-01-21
FR2551210A1 (en) 1985-03-01
GB2139754A (en) 1984-11-14

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19950408