GB2139754B - A pattern examining method - Google Patents

A pattern examining method

Info

Publication number
GB2139754B
GB2139754B GB08411625A GB8411625A GB2139754B GB 2139754 B GB2139754 B GB 2139754B GB 08411625 A GB08411625 A GB 08411625A GB 8411625 A GB8411625 A GB 8411625A GB 2139754 B GB2139754 B GB 2139754B
Authority
GB
United Kingdom
Prior art keywords
examining method
pattern
pattern examining
examining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08411625A
Other versions
GB8411625D0 (en
GB2139754A (en
Inventor
Tatsunosuke Masuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Publication of GB8411625D0 publication Critical patent/GB8411625D0/en
Publication of GB2139754A publication Critical patent/GB2139754A/en
Application granted granted Critical
Publication of GB2139754B publication Critical patent/GB2139754B/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/161—Using chemical substances, e.g. colored or fluorescent, for facilitating optical or visual inspection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/163—Monitoring a manufacturing process
GB08411625A 1983-05-11 1984-04-08 A pattern examining method Expired GB2139754B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8095483A JPS59206705A (en) 1983-05-11 1983-05-11 Inspection of pattern

Publications (3)

Publication Number Publication Date
GB8411625D0 GB8411625D0 (en) 1984-06-13
GB2139754A GB2139754A (en) 1984-11-14
GB2139754B true GB2139754B (en) 1986-10-15

Family

ID=13732896

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08411625A Expired GB2139754B (en) 1983-05-11 1984-04-08 A pattern examining method

Country Status (4)

Country Link
JP (1) JPS59206705A (en)
DE (1) DE3416919A1 (en)
FR (1) FR2551210A1 (en)
GB (1) GB2139754B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61228302A (en) * 1985-04-01 1986-10-11 Yanmar Diesel Engine Co Ltd Detection device
JPS62180250A (en) * 1986-02-05 1987-08-07 Omron Tateisi Electronics Co Inspecting method for component package substrate
JPS63191041A (en) * 1987-02-03 1988-08-08 Komori Printing Mach Co Ltd Density measurement positioning method
FR2676392A1 (en) * 1991-05-04 1992-11-20 Heidelberger Druckmasch Ag Device and method for checking the print quality of printed products from a printing machine
US6529621B1 (en) * 1998-12-17 2003-03-04 Kla-Tencor Mechanisms for making and inspecting reticles
GB2485337A (en) * 2010-11-01 2012-05-16 Plastic Logic Ltd Method for providing device-specific markings on devices

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3645626A (en) * 1970-06-15 1972-02-29 Ibm Apparatus for detecting defects by optical scanning
US3969577A (en) * 1974-10-15 1976-07-13 Westinghouse Electric Corporation System for evaluating similar objects
JPS5413750A (en) * 1977-07-02 1979-02-01 Hokuriku Elect Ind Function voltage divider using resistors

Also Published As

Publication number Publication date
JPH033884B2 (en) 1991-01-21
DE3416919C2 (en) 1987-07-02
JPS59206705A (en) 1984-11-22
GB8411625D0 (en) 1984-06-13
GB2139754A (en) 1984-11-14
FR2551210A1 (en) 1985-03-01
DE3416919A1 (en) 1984-11-29

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19950408