FR2482780A1 - Dispositif a profiler un faisceau electronique - Google Patents

Dispositif a profiler un faisceau electronique Download PDF

Info

Publication number
FR2482780A1
FR2482780A1 FR8109840A FR8109840A FR2482780A1 FR 2482780 A1 FR2482780 A1 FR 2482780A1 FR 8109840 A FR8109840 A FR 8109840A FR 8109840 A FR8109840 A FR 8109840A FR 2482780 A1 FR2482780 A1 FR 2482780A1
Authority
FR
France
Prior art keywords
opening
electron beam
deflection
openings
double
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8109840A
Other languages
English (en)
French (fr)
Other versions
FR2482780B1 (cg-RX-API-DMAC7.html
Inventor
Wolfgang Knauer
Walter E Perkins
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of FR2482780A1 publication Critical patent/FR2482780A1/fr
Application granted granted Critical
Publication of FR2482780B1 publication Critical patent/FR2482780B1/fr
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002Details
    • H01J37/3007Electron or ion-optical systems

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
FR8109840A 1980-05-19 1981-05-18 Dispositif a profiler un faisceau electronique Granted FR2482780A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US15103080A 1980-05-19 1980-05-19

Publications (2)

Publication Number Publication Date
FR2482780A1 true FR2482780A1 (fr) 1981-11-20
FR2482780B1 FR2482780B1 (cg-RX-API-DMAC7.html) 1985-01-04

Family

ID=22537042

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8109840A Granted FR2482780A1 (fr) 1980-05-19 1981-05-18 Dispositif a profiler un faisceau electronique

Country Status (2)

Country Link
FR (1) FR2482780A1 (cg-RX-API-DMAC7.html)
GB (1) GB2076589B (cg-RX-API-DMAC7.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE58907191D1 (de) * 1989-02-09 1994-04-14 Balzers Hochvakuum Verfahren zum Zentrieren eines Elektronenstrahles.

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1281982A (fr) * 1960-11-23 1962-01-19 Csf Modulateur à déflexion pour tubes à rayons cathodiques
FR2007186A1 (cg-RX-API-DMAC7.html) * 1968-04-29 1970-01-02 Stromberg Datagraphix In
FR2015886A1 (cg-RX-API-DMAC7.html) * 1968-08-19 1970-04-30 Stromberg Datagraphix Inc
FR1596430A (cg-RX-API-DMAC7.html) * 1967-12-29 1970-06-15
FR2329069A1 (fr) * 1975-10-23 1977-05-20 Rikagaku Kenkyusho Procede de projection d'un faisceau de particules chargees

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1281982A (fr) * 1960-11-23 1962-01-19 Csf Modulateur à déflexion pour tubes à rayons cathodiques
FR1596430A (cg-RX-API-DMAC7.html) * 1967-12-29 1970-06-15
FR2007186A1 (cg-RX-API-DMAC7.html) * 1968-04-29 1970-01-02 Stromberg Datagraphix In
FR2015886A1 (cg-RX-API-DMAC7.html) * 1968-08-19 1970-04-30 Stromberg Datagraphix Inc
FR2329069A1 (fr) * 1975-10-23 1977-05-20 Rikagaku Kenkyusho Procede de projection d'un faisceau de particules chargees

Also Published As

Publication number Publication date
GB2076589A (en) 1981-12-02
GB2076589B (en) 1985-03-06
FR2482780B1 (cg-RX-API-DMAC7.html) 1985-01-04

Similar Documents

Publication Publication Date Title
US7390618B2 (en) Manufacturing method of microstructure, manufacturing method and manufacturing device of electronic device
JPH0675188A (ja) 一列或いは多数列に配置された多数の光源を結像させる方法及び装置
EP0599375B1 (de) Lichtmodulator
FR2524198A1 (fr) Appareil d'exposition par faisceau de particules chargees utilisant un balayage par une ligne variable
JPH0513368B2 (cg-RX-API-DMAC7.html)
JPH0972U (ja) 位相板調節式レーザビームによる集積回路接続パスの切断装置
US20020041444A1 (en) Device for converting the intensity distribution of a laser beam and a device and method for generating a laser beam with an intensity which falls constantly along an axis from one side of the beam to the other
FR2620858A1 (fr) Instrument de spectrometrie de masse d'ions secondaires avec formation directe de l'image
US6656373B1 (en) Apodized micro-lenses for Hartmann wavefront sensing and method for fabricating desired profiles
FR2516669A1 (cg-RX-API-DMAC7.html)
US6852985B2 (en) Method and apparatus for nanometer-scale focusing and patterning of ultra-low emittance, multi-MeV proton and ion beams from a laser ion diode
US6421180B1 (en) Apparatus for generating a laser pattern on a photomask and associated methods
FR2482780A1 (fr) Dispositif a profiler un faisceau electronique
JP4769794B2 (ja) 粒子ビーム射出装置用の補正レンズ系
EP0228735B1 (fr) Dispositif d'insolation pour la génération de masques
EP0244289A2 (fr) Dispositif à faisceau électronique pour projeter l'image d'un objet sur un échantillon
EP0925599B1 (fr) Filtre d'energie, microscope electronique a transmission et procede de filtrage d'energie associe
DE10056561A1 (de) Einrichtung zum Fokussieren von Licht auf ein einen photoempfindlichen, vorzugsweise schichtförmigen Bereich aufweisendes Objekt
Welsch et al. A beam halo monitor based on adaptive optics
DE4442976A1 (de) Vorrichtung zur berührungslosen optischen Abtastung von Informationen bei der Aufzeichnung auf und/oder Wiedergabe von einem Aufzeichnungsträger mit Aufzeichnungsspuren
FR2538613A1 (fr) Ensemble de lentilles electrostatiques d'acceleration et d'expansion de balayage
EP1614121A1 (en) A refractive x-ray element
FR2461281A2 (fr) Dispositif de microlithographie par bombardement electronique
DE4447765C2 (de) Schwimmender optischer Abtastkopf, der integral mit einer Lichtquelle und einem Photodetektor ausgebildet ist, und optisches Plattengerät mit einem solchen
WO1997038341A1 (en) Confocal optical apparatus

Legal Events

Date Code Title Description
ST Notification of lapse