FR2455287A1 - Procede permettant le test d'un circuit integre - Google Patents
Procede permettant le test d'un circuit integreInfo
- Publication number
- FR2455287A1 FR2455287A1 FR8009417A FR8009417A FR2455287A1 FR 2455287 A1 FR2455287 A1 FR 2455287A1 FR 8009417 A FR8009417 A FR 8009417A FR 8009417 A FR8009417 A FR 8009417A FR 2455287 A1 FR2455287 A1 FR 2455287A1
- Authority
- FR
- France
- Prior art keywords
- output
- circuit
- exclusive
- door
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
POUR IMPOSER UNE SITUATION DE TEST A UN CIRCUIT INTEGRE 1 QUE L'ON DESIRE CONTROLER, AU MOINS UNE SORTIE INTERNE DU CIRCUIT EST PROLONGEE VERS L'EXTERIEUR A TRAVERS UN ETAGE DE SORTIE 5, TANDIS QU'UNE ENTREE B ET UNE SORTIE A DUDIT ETAGE CONDUISENT, A L'INTERIEUR DU CIRCUIT, A UNE PORTE OU- EXCLUSIF 9. AUSSI LONGTEMPS QUE LA SORTIE 2 EST CHARGEE PAR UNE RESISTANCE FORTE, COMME C'EST LE CAS EN SITUATION DE FONCTIONNEMENT NORMAL DU CIRCUIT, LADITE PORTE OU- EXCLUSIF 9 ENGENDRE LE MEME SIGNAL QUEL QUE SOIT LE SIGNAL EN SORTIE. POUR PROCEDER AU TEST, ON FORCE LA SORTIE AVEC UNE IMPULSION OPPOSEE DE SORTE QUE LA SORTIE DE LA PORTE OU- EXCLUSIF CHANGE D'ETAT ET IMPOSE AU CIRCUIT 7-3 SA SITUATION DE TEST. LA PORTE OU- EXCLUSIF 9 PEUT ETRE SUIVIE D'UNE BASCULE BISTABLE, DE SORTE QUE POUR INSTAURER LA SITUATION DE TEST, IL SUFFIT DE DISPOSER D'UNE SEULE IMPULSION COMPLEMENTAIRE. APPLICATION: CIRCUITS INTEGRES A LOGIQUE SEQUENTIELLE.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2917126A DE2917126C2 (de) | 1979-04-27 | 1979-04-27 | Verfahren zum Prüfen einer integrierten Schaltung und Anordnung zur Durchführung des Verfahrens |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2455287A1 true FR2455287A1 (fr) | 1980-11-21 |
FR2455287B1 FR2455287B1 (fr) | 1983-09-23 |
Family
ID=6069439
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8009417A Granted FR2455287A1 (fr) | 1979-04-27 | 1980-04-25 | Procede permettant le test d'un circuit integre |
Country Status (6)
Country | Link |
---|---|
US (1) | US4385275A (fr) |
JP (1) | JPS55149063A (fr) |
CA (1) | CA1164947A (fr) |
DE (1) | DE2917126C2 (fr) |
FR (1) | FR2455287A1 (fr) |
GB (1) | GB2049206B (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0084260A1 (fr) * | 1981-12-29 | 1983-07-27 | Fujitsu Limited | Circuit intégré à semiconducteur avec circuit de test |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2943552A1 (de) * | 1979-10-27 | 1981-05-21 | Deutsche Itt Industries Gmbh, 7800 Freiburg | Monolithisch integrierte schaltung |
US4556840A (en) * | 1981-10-30 | 1985-12-03 | Honeywell Information Systems Inc. | Method for testing electronic assemblies |
AU8963582A (en) * | 1981-10-30 | 1983-05-05 | Honeywell Information Systems Incorp. | Design and testing electronic components |
US4808915A (en) * | 1981-10-30 | 1989-02-28 | Honeywell Bull, Inc. | Assembly of electronic components testable by a reciprocal quiescent testing technique |
US4502127A (en) * | 1982-05-17 | 1985-02-26 | Fairchild Camera And Instrument Corporation | Test system memory architecture for passing parameters and testing dynamic components |
GB8432305D0 (en) * | 1984-12-20 | 1985-01-30 | Int Computers Ltd | Crystal oscillator overdrive |
US4975641A (en) * | 1988-07-14 | 1990-12-04 | Sharp Kabushiki Kaisha | Integrated circuit and method for testing the integrated circuit |
KR950011803B1 (ko) * | 1988-08-30 | 1995-10-10 | 금성일렉트론주식회사 | 테스트 모우드 기능 수행, 입력 회로 |
JPH0455779A (ja) * | 1990-06-26 | 1992-02-24 | Matsushita Electric Ind Co Ltd | 電子回路装置 |
JPH0484782A (ja) * | 1990-07-27 | 1992-03-18 | Nec Corp | テスト回路 |
US5982815A (en) * | 1996-07-01 | 1999-11-09 | Advanced Micro Devices Inc. | Circuit for setting a device into a test mode by changing a first port to a fixed clock and a second port to a non-fixed clock |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2534502A1 (de) * | 1975-08-01 | 1977-02-10 | Siemens Ag | Individuell pruefbarer, integrierter baustein |
US4176258A (en) * | 1978-05-01 | 1979-11-27 | Intel Corporation | Method and circuit for checking integrated circuit chips |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2330014A1 (fr) * | 1973-05-11 | 1977-05-27 | Ibm France | Procede de test de bloc de circuits logiques integres et blocs en faisant application |
-
1979
- 1979-04-27 DE DE2917126A patent/DE2917126C2/de not_active Expired
-
1980
- 1980-04-17 CA CA000350070A patent/CA1164947A/fr not_active Expired
- 1980-04-21 US US06/142,293 patent/US4385275A/en not_active Expired - Lifetime
- 1980-04-24 GB GB8013609A patent/GB2049206B/en not_active Expired
- 1980-04-25 FR FR8009417A patent/FR2455287A1/fr active Granted
- 1980-04-26 JP JP5491380A patent/JPS55149063A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2534502A1 (de) * | 1975-08-01 | 1977-02-10 | Siemens Ag | Individuell pruefbarer, integrierter baustein |
US4176258A (en) * | 1978-05-01 | 1979-11-27 | Intel Corporation | Method and circuit for checking integrated circuit chips |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0084260A1 (fr) * | 1981-12-29 | 1983-07-27 | Fujitsu Limited | Circuit intégré à semiconducteur avec circuit de test |
US4550289A (en) * | 1981-12-29 | 1985-10-29 | Fujitsu Limited | Semiconductor integrated circuit device |
Also Published As
Publication number | Publication date |
---|---|
US4385275A (en) | 1983-05-24 |
GB2049206A (en) | 1980-12-17 |
CA1164947A (fr) | 1984-04-03 |
GB2049206B (en) | 1983-02-16 |
DE2917126A1 (de) | 1980-10-30 |
JPS634151B2 (fr) | 1988-01-27 |
DE2917126C2 (de) | 1983-01-27 |
FR2455287B1 (fr) | 1983-09-23 |
JPS55149063A (en) | 1980-11-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
FR2455287A1 (fr) | Procede permettant le test d'un circuit integre | |
Miller et al. | Nondestructive testing handbook. vol. 5: Acoustic emission testing | |
KR910012749A (ko) | 클럭 버스트를 이용하는 집적회로 시험방법 및 장치 | |
EP0702240B1 (fr) | Cellule de verrouillage de balayage pour tests de structure et performance | |
KR940004332A (ko) | 회로 테스트 방법 및 지연 결함 검출장치 | |
JUDY | Standard method of test for plane-strain stress-corrosion-cracking resistance of metallic materials[Final Report] | |
JPS57203843A (en) | Air-fuel ratio feedback control device | |
US3531727A (en) | Sampling rate selector | |
GUDERLEY | The integral equation method for transonic flow interpreted as method of weighted residuals[Interim Report, Jan. 1980- Aug. 1981] | |
SU1046719A1 (ru) | Логический пробник | |
JPS5513588A (en) | Sampling circuit | |
JPS5554478A (en) | Comparing test method | |
SU1027635A1 (ru) | Устройство формировани строб-импульсов в моменты замирани допплеровского сигнала | |
SU767751A1 (ru) | Преобразователь параллельного кода в последовательный | |
Raes | Reply to “Comments on ‘Static and Dynamic Transmission Losses of Partitions’”[TJ Schultz and BG Watters, J. Acoust. Soc. Am. 35, 2023 (L)(1963)]. | |
SU741196A1 (ru) | Способ дискретного измерени длительности импульсов | |
Yasakov | Method for detection of jump-like change points in optical data using approximations with distribution functions | |
SU363885A1 (ru) | Лоток для испытания моделей гидротехнических сооружений | |
JPS55164948A (en) | Test system for logic circuit package | |
JPS57113377A (en) | Semiconductor testing device | |
JPS554503A (en) | Flow rate inspecting method at specified pressure loss time of gas cock with overflow preventing valve | |
JPS54102987A (en) | Test device | |
SU1304047A1 (ru) | Устройство сигнализации состо ни исполнительного механизма | |
SU1584102A1 (ru) | Входное устройство нереверсивного счетчика | |
SU1213437A1 (ru) | Цифровой фазометр |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |